Jérôme Mitard

5.5k citations
234 papers · 3.1k · 1 hit paper · h-index 28

Impact in

    • Semiconductor materials and devices
    • Advancements in Semiconductor Devices and Circuit Design
    • Integrated Circuits and Semiconductor Failure Analysis
    • Ferroelectric and Negative Capacitance Devices
    • Radiation Effects in Electronics
    • Thin-Film Transistor Technologies
    • Semiconductor materials and interfaces

Papers in

    • Semiconductor materials and devices 216
    • Advancements in Semiconductor Devices and Circuit Design 210
    • Integrated Circuits and Semiconductor Failure Analysis 72
    • Ferroelectric and Negative Capacitance Devices 29
    • Thin-Film Transistor Technologies 22
    • Radiation Effects in Electronics 10
    • Semiconductor materials and interfaces 24

Jérôme Mitard

218 papers receiving 3.0k citations

Jérôme Mitard's Hit Papers

Review on high-k dielectrics reliability issues 2005 · 416 citations
4160+7+14Years since publication100200300400

Peers

Jérôme Mitard
Comparison fields: 5 of 48
  • Electrical and Electronic Engineering 3.1k
  • Atomic and Molecular Physics, and Optics 370
  • Biomedical Engineering 461
  • Materials Chemistry 350
  • Structural Biology 9
Replace S. Deleonibus with:
S. Deleonibus France
K. Rim United States
S. Biesemans Belgium
Geert Eneman Belgium
M. Cassé France
L. Clavelier France
Meishoku Masahara Japan
Digh Hisamoto Japan
Tejas Krishnamohan United States
C. Le Royer France
Jérôme Mitard relative to S. Deleonibus France S. Deleonibus's profile →
Citations per field
00.5×7.3×
S. Deleonibus · 1×
Citations per year

Countries citing papers authored by Jérôme Mitard

Since Specialization
Citations

This map shows the geographic impact of Jérôme Mitard's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Jérôme Mitard with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Jérôme Mitard more than expected).

Fields of papers citing papers by Jérôme Mitard

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Jérôme Mitard. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Jérôme Mitard. The network helps show where Jérôme Mitard may publish in the future.

Co-authors

The 25 scholars most cited alongside Jérôme Mitard, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with Jérôme Mitard Line = papers co-authored together Jérôme Mitard links everyone, so they are left out of the graph.

All Works

20 of 20 papers shown

Showing the 20 most-cited of 234 papers — load more, or switch the sort, to bring in the rest.

#Work
1
Review on high-k dielectrics reliability issues
Hit paper breakdown →
2005416
2 2006104
3 200586
4 201081
5 201879
6 201275
7 201271
8 201366
9 201264
10 201460
11 200949
12 202147
13 200946
14 200843
15 200842
16 200939
17 201339
18
Impact of EOT scaling down to 0.85nm on 70nm Ge-pFETs technology with STI
200635
19 201332
20 201132

About Jérôme Mitard

Jérôme Mitard is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics, Biomedical Engineering, Materials Chemistry and Hardware and Architecture, having authored 234 papers that have together received 3.1k indexed citations. Recurring topics across this work include Semiconductor materials and devices (216 papers), Advancements in Semiconductor Devices and Circuit Design (210 papers), Integrated Circuits and Semiconductor Failure Analysis (72 papers), Nanowire Synthesis and Applications (30 papers), Ferroelectric and Negative Capacitance Devices (29 papers), Semiconductor materials and interfaces (24 papers), Thin-Film Transistor Technologies (22 papers) and Radiation Effects in Electronics (10 papers). The work is most often cited by research in Electrical and Electronic Engineering (3.1k citations), Atomic and Molecular Physics, and Optics (370 citations), Biomedical Engineering (461 citations), Materials Chemistry (350 citations) and Structural Biology (9 citations). Jérôme Mitard has collaborated with scholars based in Belgium, United States and France. Frequent co-authors include Geert Eneman, Liesbeth Witters, G. Ghibaudo, B. Kaczer, J. Franco, G. Groeseneken, G. Ribes, Emmanuel Vincent, F. Monsieur and S. Bruyère. Their work appears in journals such as IEEE Transactions on Electron Devices, IEEE Transactions on Nuclear Science, IEEE Transactions on Device and Materials Reliability, Solid-State Electronics and IEEE Electron Device Letters.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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