Jérôme Mitard

5.6k citations
241 papers · 3.4k · 1 hit paper · h-index 29

Impact in

    • Semiconductor materials and devices
    • Advancements in Semiconductor Devices and Circuit Design
    • Integrated Circuits and Semiconductor Failure Analysis
    • Ferroelectric and Negative Capacitance Devices
    • Thin-Film Transistor Technologies
    • Radiation Effects in Electronics
    • Semiconductor materials and interfaces

Papers in

    • Semiconductor materials and devices 221
    • Advancements in Semiconductor Devices and Circuit Design 215
    • Integrated Circuits and Semiconductor Failure Analysis 73
    • Ferroelectric and Negative Capacitance Devices 29
    • Thin-Film Transistor Technologies 22
    • Silicon and Solar Cell Technologies 11
    • Semiconductor materials and interfaces 25

Jérôme Mitard

223 papers receiving 3.3k citations

Jérôme Mitard's Hit Papers

Review on high-k dielectrics reliability issues 2005 · 430 citations
4300+7+14Years since publication100200300400

Peers

Jérôme Mitard
Comparison fields: 5 of 50
  • Electrical and Electronic Engineering 3.3k
  • Atomic and Molecular Physics, and Optics 412
  • Biomedical Engineering 480
  • Materials Chemistry 363
  • Structural Biology 9
Replace Digh Hisamoto with:
Digh Hisamoto Japan
K. Rim United States
S. Biesemans Belgium
Geert Eneman Belgium
L. Clavelier France
A. Veloso Belgium
C. Auth United States
Liesbeth Witters Belgium
Tomohisa Mizuno Japan
Geert Hellings Belgium
Jérôme Mitard relative to Digh Hisamoto Japan Digh Hisamoto's profile →
Citations per field
00.5×2.7×
Digh Hisamoto · 1×
Citations per year

Countries citing papers authored by Jérôme Mitard

Since Specialization
Citations

This map shows the geographic impact of Jérôme Mitard's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Jérôme Mitard with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Jérôme Mitard more than expected).

Fields of papers citing papers by Jérôme Mitard

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Jérôme Mitard. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Jérôme Mitard. The network helps show where Jérôme Mitard may publish in the future.

Co-authors

The 25 scholars most cited alongside Jérôme Mitard, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with Jérôme Mitard Line = papers co-authored together Jérôme Mitard links everyone, so they are left out of the graph.

All Works

20 of 20 papers shown

Showing the 20 most-cited of 241 papers — load more, or switch the sort, to bring in the rest.

#Work
1
Review on high-k dielectrics reliability issues
Hit paper breakdown →
2005430
2 2006106
3 200592
4 201286
5 201085
6 201283
7 201881
8 201269
9 201369
10 201463
11 202152
12 200949
13 200947
14 200845
15 200845
16 200941
17 201341
18
Impact of EOT scaling down to 0.85nm on 70nm Ge-pFETs technology with STI
200638
19 201537
20 201135

About Jérôme Mitard

Jérôme Mitard is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics, Biomedical Engineering, Materials Chemistry and Hardware and Architecture, having authored 241 papers that have together received 3.4k indexed citations. Recurring topics across this work include Semiconductor materials and devices (221 papers), Advancements in Semiconductor Devices and Circuit Design (215 papers), Integrated Circuits and Semiconductor Failure Analysis (73 papers), Nanowire Synthesis and Applications (33 papers), Ferroelectric and Negative Capacitance Devices (29 papers), Semiconductor materials and interfaces (25 papers), Thin-Film Transistor Technologies (22 papers) and Silicon and Solar Cell Technologies (11 papers). The work is most often cited by research in Electrical and Electronic Engineering (3.3k citations), Atomic and Molecular Physics, and Optics (412 citations), Biomedical Engineering (480 citations), Materials Chemistry (363 citations) and Structural Biology (9 citations). Jérôme Mitard has collaborated with scholars based in Belgium, United States and France. Frequent co-authors include Liesbeth Witters, Geert Eneman, G. Ghibaudo, B. Kaczer, J. Franco, G. Groeseneken, C. Parthasarathy, S. Bruyère, F. Monsieur and M. Denais. Their work appears in journals such as IEEE Transactions on Electron Devices, IEEE Transactions on Nuclear Science, IEEE Transactions on Device and Materials Reliability, Microelectronic Engineering and IEEE Electron Device Letters.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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