Thierry Conard
Impact in
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- Semiconductor materials and devices
- Advancements in Semiconductor Devices and Circuit Design
- Ferroelectric and Negative Capacitance Devices
- Integrated Circuits and Semiconductor Failure Analysis
- Surfaces, Coatings and Films top 1%
Papers in
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- Semiconductor materials and devices 232
- Advancements in Semiconductor Devices and Circuit Design 63
- Integrated Circuits and Semiconductor Failure Analysis 61
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- Electronic and Structural Properties of Oxides 52
- Co-authors
- Marc Heyns (80 shared papers)Stefan De Gendt (103 shared papers)Matty Caymax (71 shared papers)Annelies Delabie (63 shared papers)Sven Van Elshocht (79 shared papers)Wilfried Vandervorst (68 shared papers)Marc Meuris (27 shared papers)Alexis Franquet (66 shared papers)
- Journals
- Journal of The Electrochemical Society (28 papers)Applied Surface Science (23 papers)Applied Physics Letters (15 papers)Microelectronic Engineering (12 papers)ECS Journal of Solid State Science and Technology (12 papers)
- Partner nations
- BelgiumGermanyNetherlands
In The Last Decade
Thierry Conard
354 papers receiving 5.5k citations
Peers
Comparison fields: 5 of 92
- Electrical and Electronic Engineering 4.6k
- Surfaces, Coatings and Films 446
- Materials Chemistry 2.7k
- Electronic, Optical and Magnetic Materials 773
- Atomic and Molecular Physics, and Optics 941
Countries citing papers authored by Thierry Conard
This map shows the geographic impact of Thierry Conard's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Thierry Conard with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Thierry Conard more than expected).
Fields of papers citing papers by Thierry Conard
This network shows the impact of papers produced by Thierry Conard. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Thierry Conard. The network helps show where Thierry Conard may publish in the future.
Co-authors
The 25 scholars most cited alongside Thierry Conard, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 368 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 2007 | 241 | |
| 2 | 2002 | 205 | |
| 3 | 2018 | 184 | |
| 4 | 2004 | 128 | |
| 5 | 2007 | 108 | |
| 6 | 2004 | 86 | |
| 7 | 2005 | 83 | |
| 8 | 2007 | 83 | |
| 9 | 2002 | 77 | |
| 10 | 2007 | 76 | |
| 11 | 2017 | 74 | |
| 12 | 2015 | 73 | |
| 13 | 2005 | 67 | |
| 14 | 2006 | 65 | |
| 15 | 2018 | 64 | |
| 16 | 2012 | 63 | |
| 17 | 2006 | 63 | |
| 18 | 2016 | 60 | |
| 19 | 2003 | 55 | |
| 20 | 2019 | 55 |
About Thierry Conard
Thierry Conard is a scholar working on Electrical and Electronic Engineering, Materials Chemistry, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials and Mechanics of Materials, having authored 368 papers that have together received 5.7k indexed citations. Recurring topics across this work include Semiconductor materials and devices (232 papers), Electron and X-Ray Spectroscopy Techniques (70 papers), Advancements in Semiconductor Devices and Circuit Design (63 papers), Integrated Circuits and Semiconductor Failure Analysis (61 papers), Copper Interconnects and Reliability (60 papers), Electronic and Structural Properties of Oxides (52 papers), Ion-surface interactions and analysis (38 papers) and Metal and Thin Film Mechanics (37 papers). The work is most often cited by research in Electrical and Electronic Engineering (4.6k citations), Surfaces, Coatings and Films (446 citations), Materials Chemistry (2.7k citations), Electronic, Optical and Magnetic Materials (773 citations) and Atomic and Molecular Physics, and Optics (941 citations). Thierry Conard has collaborated with scholars based in Belgium, Germany and Netherlands. Frequent co-authors include Marc Heyns, Stefan De Gendt, Matty Caymax, Annelies Delabie, Sven Van Elshocht, Wilfried Vandervorst, Marc Meuris, Alexis Franquet, H. Bender and Michel Houssa. Their work appears in journals such as Journal of The Electrochemical Society, Applied Surface Science, Applied Physics Letters, Microelectronic Engineering and ECS Journal of Solid State Science and Technology.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.