G. Ribes

1.7k citations
50 papers · 989 · 1 hit paper · h-index 14

Impact in

    • Semiconductor materials and devices
    • Advancements in Semiconductor Devices and Circuit Design
    • Integrated Circuits and Semiconductor Failure Analysis
    • Ferroelectric and Negative Capacitance Devices
    • Advanced Memory and Neural Computing
    • Silicon Carbide Semiconductor Technologies

Papers in

G. Ribes

47 papers receiving 925 citations

G. Ribes's Hit Papers

Review on high-k dielectrics reliability issues 2005 · 430 citations
4300+7+14Years since publication100200300400

Peers

G. Ribes
Comparison fields: 5 of 33
  • Electrical and Electronic Engineering 968
  • Hardware and Architecture 28
  • Electronic, Optical and Magnetic Materials 56
  • Materials Chemistry 126
  • Atomic and Molecular Physics, and Optics 59
Replace M. Denais with:
M. Denais France
Jeff J. Peterson United States
H.F. Luan United States
R. Khamankar United States
K.F. Schuegraf United States
C. D’Emic United States
Toshihiro Sekigawa Japan
E. Dentoni Litta Belgium
D.L. Kencke United States
G. Pollack United States
G. Ribes relative to M. Denais France M. Denais's profile →
Citations per field
00.5×1.5×
M. Denais · 1×
Citations per year

Countries citing papers authored by G. Ribes

Since Specialization
Citations

This map shows the geographic impact of G. Ribes's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by G. Ribes with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites G. Ribes more than expected).

Fields of papers citing papers by G. Ribes

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by G. Ribes. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by G. Ribes. The network helps show where G. Ribes may publish in the future.

Co-authors

The 25 scholars most cited alongside G. Ribes, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with G. Ribes Line = papers co-authored together G. Ribes links everyone, so they are left out of the graph.

All Works

20 of 20 papers shown

Showing the 20 most-cited of 50 papers — load more, or switch the sort, to bring in the rest.

#Work
1
Review on high-k dielectrics reliability issues
Hit paper breakdown →
2005430
2 2004101
3 200363
4 200634
5 200627
6 200624
7 200519
8 201518
9 200318
10 200717
11 200517
12 200716
13 200615
14 200614
15 200913
16 200413
17 201011
18 200410
19 200710
20 20059

About G. Ribes

G. Ribes is a scholar working on Electrical and Electronic Engineering, Electronic, Optical and Magnetic Materials, Materials Chemistry, Atomic and Molecular Physics, and Optics and Mechanics of Materials, having authored 50 papers that have together received 989 indexed citations. Recurring topics across this work include Semiconductor materials and devices (49 papers), Advancements in Semiconductor Devices and Circuit Design (38 papers), Integrated Circuits and Semiconductor Failure Analysis (26 papers), Copper Interconnects and Reliability (7 papers), Electronic and Structural Properties of Oxides (6 papers), Ferroelectric and Negative Capacitance Devices (4 papers), Semiconductor materials and interfaces (3 papers) and Advanced Memory and Neural Computing (3 papers). The work is most often cited by research in Electrical and Electronic Engineering (968 citations), Hardware and Architecture (28 citations), Electronic, Optical and Magnetic Materials (56 citations), Materials Chemistry (126 citations) and Atomic and Molecular Physics, and Optics (59 citations). G. Ribes has collaborated with scholars based in France, India and Switzerland. Frequent co-authors include M. Denais, S. Bruyère, C. Parthasarathy, F. Monsieur, G. Ghibaudo, Emmanuel Vincent, V. Huard, Jérôme Mitard, A. Bravaix and F. Perrier. Their work appears in journals such as IEEE Transactions on Device and Materials Reliability, Microelectronics Reliability, Microelectronic Engineering and Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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