Philippe Roussel
Impact in
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- Semiconductor materials and devices
- Advancements in Semiconductor Devices and Circuit Design
- Integrated Circuits and Semiconductor Failure Analysis
- Ferroelectric and Negative Capacitance Devices
- Advanced Memory and Neural Computing
- Hardware and Architecture top 5%
Papers in
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- Semiconductor materials and devices 98
- Advancements in Semiconductor Devices and Circuit Design 66
- Integrated Circuits and Semiconductor Failure Analysis 44
- Ferroelectric and Negative Capacitance Devices 20
- Electrostatic Discharge in Electronics 9
- 3D IC and TSV technologies 8
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- Copper Interconnects and Reliability 21
- Co-authors
- G. Groeseneken (63 shared papers)B. Kaczer (50 shared papers)R. Degraeve (39 shared papers)J. Franco (35 shared papers)G Lamblin (6 shared papers)Mahmoud Rasras (1 shared paper)T. Kauerauf (15 shared papers)Moonju Cho (11 shared papers)
In The Last Decade
Philippe Roussel
151 papers receiving 2.4k citations
Peers
Comparison fields: 5 of 137
- Electrical and Electronic Engineering 1.7k
- Hardware and Architecture 89
- Electronic, Optical and Magnetic Materials 207
- Small Animals 68
- Nutrition and Dietetics 100
Countries citing papers authored by Philippe Roussel
This map shows the geographic impact of Philippe Roussel's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Philippe Roussel with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Philippe Roussel more than expected).
Fields of papers citing papers by Philippe Roussel
This network shows the impact of papers produced by Philippe Roussel. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Philippe Roussel. The network helps show where Philippe Roussel may publish in the future.
Co-authors
The 25 scholars most cited alongside Philippe Roussel, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 155 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 2002 | 218 | |
| 2 | 1994 | 118 | |
| 3 | 1991 | 98 | |
| 4 | 2016 | 98 | |
| 5 | 2012 | 72 | |
| 6 | 1987 | 71 | |
| 7 | 2013 | 71 | |
| 8 | 2012 | 64 | |
| 9 | 2011 | 60 | |
| 10 | 2017 | 51 | |
| 11 | Charge Trapping and Dielectric Reliability of SiO2/Al2O3 Gate Stacks with TiN Electrodes | 2003 | 46 |
| 12 | 2019 | 44 | |
| 13 | 2014 | 41 | |
| 14 | 2010 | 40 | |
| 15 | 1987 | 39 | |
| 16 | 2014 | 39 | |
| 17 | 2003 | 34 | |
| 18 | 2006 | 33 | |
| 19 | 1998 | 31 | |
| 20 | 1984 | 28 |
About Philippe Roussel
Philippe Roussel is a scholar working on Electrical and Electronic Engineering, Electronic, Optical and Magnetic Materials, Atomic and Molecular Physics, and Optics, Materials Chemistry and Molecular Biology, having authored 155 papers that have together received 2.5k indexed citations. Recurring topics across this work include Semiconductor materials and devices (98 papers), Advancements in Semiconductor Devices and Circuit Design (66 papers), Integrated Circuits and Semiconductor Failure Analysis (44 papers), Copper Interconnects and Reliability (21 papers), Ferroelectric and Negative Capacitance Devices (20 papers), Semiconductor materials and interfaces (9 papers), Electrostatic Discharge in Electronics (9 papers) and 3D IC and TSV technologies (8 papers). The work is most often cited by research in Electrical and Electronic Engineering (1.7k citations), Hardware and Architecture (89 citations), Electronic, Optical and Magnetic Materials (207 citations), Small Animals (68 citations) and Nutrition and Dietetics (100 citations). Philippe Roussel has collaborated with scholars based in Belgium, France and Austria. Frequent co-authors include G. Groeseneken, B. Kaczer, R. Degraeve, J. Franco, G Lamblin, Mahmoud Rasras, T. Kauerauf, Moonju Cho, Tibor Grasser and Jérôme Lemoine. Their work appears in journals such as IEEE Transactions on Electron Devices, IEEE Transactions on Device and Materials Reliability, IEEE Electron Device Letters, Microelectronic Engineering and Microelectronics Reliability.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.