M. Denais
Impact in
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- Semiconductor materials and devices
- Advancements in Semiconductor Devices and Circuit Design
- Integrated Circuits and Semiconductor Failure Analysis
- Ferroelectric and Negative Capacitance Devices
- Advanced Memory and Neural Computing
- Silicon Carbide Semiconductor Technologies
- Hardware and Architecture top 10%
Papers in
-
- Semiconductor materials and devices 36
- Advancements in Semiconductor Devices and Circuit Design 28
- Integrated Circuits and Semiconductor Failure Analysis 22
- Ferroelectric and Negative Capacitance Devices 3
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- Electronic and Structural Properties of Oxides 6
- Catalytic Processes in Materials Science 2
- Co-authors
- V. Huard (29 shared papers)C. Parthasarathy (16 shared papers)G. Ribes (23 shared papers)Emmanuel Vincent (10 shared papers)S. Bruyère (11 shared papers)G. Ghibaudo (9 shared papers)F. Monsieur (5 shared papers)A. Bravaix (17 shared papers)
- Journals
- Microelectronics Reliability (5 papers)IEEE Transactions on Device and Materials Reliability (4 papers)Microelectronic Engineering (1 paper)Journal of Medical Internet Research (1 paper)
- Partner nations
- FranceIndiaSwitzerland
In The Last Decade
M. Denais
36 papers receiving 1.3k citations
M. Denais's Hit Papers
Peers
Comparison fields: 5 of 39
- Electrical and Electronic Engineering 1.4k
- Hardware and Architecture 40
- Materials Chemistry 148
- Atomic and Molecular Physics, and Optics 70
- Electronic, Optical and Magnetic Materials 38
Countries citing papers authored by M. Denais
This map shows the geographic impact of M. Denais's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by M. Denais with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites M. Denais more than expected).
Fields of papers citing papers by M. Denais
This network shows the impact of papers produced by M. Denais. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by M. Denais. The network helps show where M. Denais may publish in the future.
Co-authors
The 25 scholars most cited alongside M. Denais, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 37 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | Review on high-k dielectrics reliability issues Hit paper breakdown → | 2005 | 416 |
| 2 | NBTI degradation: From physical mechanisms to modelling Hit paper breakdown → | 2005 | 393 |
| 3 | 2004 | 101 | |
| 4 | 2004 | 93 | |
| 5 | 2004 | 92 | |
| 6 | 2006 | 30 | |
| 7 | 2006 | 22 | |
| 8 | 2006 | 21 | |
| 9 | 2005 | 18 | |
| 10 | 2005 | 15 | |
| 11 | 2006 | 15 | |
| 12 | 2006 | 14 | |
| 13 | 2006 | 13 | |
| 14 | 2004 | 13 | |
| 15 | 2005 | 11 | |
| 16 | 2006 | 11 | |
| 17 | 2004 | 10 | |
| 18 | 2007 | 10 | |
| 19 | 2004 | 9 | |
| 20 | 2005 | 9 |
About M. Denais
M. Denais is a scholar working on Electrical and Electronic Engineering, Materials Chemistry, Electronic, Optical and Magnetic Materials, Atomic and Molecular Physics, and Optics and Social Psychology, having authored 37 papers that have together received 1.4k indexed citations. Recurring topics across this work include Semiconductor materials and devices (36 papers), Advancements in Semiconductor Devices and Circuit Design (28 papers), Integrated Circuits and Semiconductor Failure Analysis (22 papers), Electronic and Structural Properties of Oxides (6 papers), Copper Interconnects and Reliability (3 papers), Ferroelectric and Negative Capacitance Devices (3 papers), Catalytic Processes in Materials Science (2 papers) and Quantum and electron transport phenomena (1 paper). The work is most often cited by research in Electrical and Electronic Engineering (1.4k citations), Hardware and Architecture (40 citations), Materials Chemistry (148 citations), Atomic and Molecular Physics, and Optics (70 citations) and Electronic, Optical and Magnetic Materials (38 citations). M. Denais has collaborated with scholars based in France, India and Switzerland. Frequent co-authors include V. Huard, C. Parthasarathy, G. Ribes, Emmanuel Vincent, S. Bruyère, G. Ghibaudo, F. Monsieur, A. Bravaix, Jérôme Mitard and F. Perrier. Their work appears in journals such as Microelectronics Reliability, IEEE Transactions on Device and Materials Reliability, Microelectronic Engineering and Journal of Medical Internet Research.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.