B. Kaczer
Impact in
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- Semiconductor materials and devices
- Advancements in Semiconductor Devices and Circuit Design
- Low-power high-performance VLSI design
- Radiation Effects in Electronics
- Integrated Circuits and Semiconductor Failure Analysis
- Ferroelectric and Negative Capacitance Devices
- Hardware and Architecture top 0.5%
- VLSI and Analog Circuit Testing
Papers in
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- Semiconductor materials and devices 498
- Advancements in Semiconductor Devices and Circuit Design 148
- Low-power high-performance VLSI design 68
- Radiation Effects in Electronics 47
- Integrated Circuits and Semiconductor Failure Analysis 46
- Ferroelectric and Negative Capacitance Devices 26
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- VLSI and Analog Circuit Testing 16
- Co-authors
- G. Groeseneken (251 shared papers)Tibor Grasser (166 shared papers)R. Degraeve (132 shared papers)Jacopo Franco (203 shared papers)Philippe J. Roussel (123 shared papers)H. Reisinger (32 shared papers)Wolfgang Goes (40 shared papers)P.-J. Wagner (15 shared papers)
- Journals
- IEEE Transactions on Electron Devices (61 papers)IEEE Electron Device Letters (32 papers)Microelectronic Engineering (29 papers)IEEE Transactions on Device and Materials Reliability (17 papers)Microelectronics Reliability (14 papers)
- Partner nations
- BelgiumAustriaUnited Kingdom
In The Last Decade
B. Kaczer
606 papers receiving 12.7k citations
B. Kaczer's Hit Papers
Peers
Comparison fields: 5 of 55
- Electrical and Electronic Engineering 11.9k
- Hardware and Architecture 819
- Safety, Risk, Reliability and Quality 257
- Condensed Matter Physics 242
- Materials Chemistry 537
Countries citing papers authored by B. Kaczer
This map shows the geographic impact of B. Kaczer's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by B. Kaczer with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites B. Kaczer more than expected).
Fields of papers citing papers by B. Kaczer
This network shows the impact of papers produced by B. Kaczer. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by B. Kaczer. The network helps show where B. Kaczer may publish in the future.
Co-authors
The 25 scholars most cited alongside B. Kaczer, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 617 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | The Paradigm Shift in Understanding the Bias Temperature Instability: From Reaction–Diffusion to Switching Oxide Traps Hit paper breakdown → | 2011 | 408 |
| 2 | 2010 | 276 | |
| 3 | 2010 | 256 | |
| 4 | 2008 | 231 | |
| 5 | 2002 | 224 | |
| 6 | 2009 | 219 | |
| 7 | 2009 | 180 | |
| 8 | 2018 | 172 | |
| 9 | 2011 | 160 | |
| 10 | 1999 | 159 | |
| 11 | 2007 | 150 | |
| 12 | 2002 | 148 | |
| 13 | 2005 | 142 | |
| 14 | 2010 | 139 | |
| 15 | 2006 | 135 | |
| 16 | 2011 | 116 | |
| 17 | 2007 | 114 | |
| 18 | 2002 | 112 | |
| 19 | 2010 | 108 | |
| 20 | 2009 | 104 |
About B. Kaczer
B. Kaczer is a scholar working on Electrical and Electronic Engineering, Hardware and Architecture, Materials Chemistry, Atomic and Molecular Physics, and Optics and Safety, Risk, Reliability and Quality, having authored 617 papers that have together received 12.9k indexed citations. Recurring topics across this work include Semiconductor materials and devices (498 papers), Advancements in Semiconductor Devices and Circuit Design (148 papers), Low-power high-performance VLSI design (68 papers), Radiation Effects in Electronics (47 papers), Integrated Circuits and Semiconductor Failure Analysis (46 papers), Ferroelectric and Negative Capacitance Devices (26 papers), VLSI and Analog Circuit Testing (16 papers) and 2D Materials and Applications (12 papers). The work is most often cited by research in Electrical and Electronic Engineering (11.9k citations), Hardware and Architecture (819 citations), Safety, Risk, Reliability and Quality (257 citations), Condensed Matter Physics (242 citations) and Materials Chemistry (537 citations). B. Kaczer has collaborated with scholars based in Belgium, Austria and United Kingdom. Frequent co-authors include G. Groeseneken, Tibor Grasser, R. Degraeve, Jacopo Franco, Philippe J. Roussel, H. Reisinger, Wolfgang Goes, P.-J. Wagner, M. Toledano-Luque and Michael Nelhiebel. Their work appears in journals such as IEEE Transactions on Electron Devices, IEEE Electron Device Letters, Microelectronic Engineering, IEEE Transactions on Device and Materials Reliability and Microelectronics Reliability.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.