S. Lhostis
Impact in
-
- 3D IC and TSV technologies
- Semiconductor materials and devices
- Electronic Packaging and Soldering Technologies
- Chalcogenide Semiconductor Thin Films
- Ferroelectric and Negative Capacitance Devices
-
- Copper Interconnects and Reliability
Papers in
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- Semiconductor materials and devices 31
- 3D IC and TSV technologies 29
- Electronic Packaging and Soldering Technologies 17
- Integrated Circuits and Semiconductor Failure Analysis 16
- Advancements in Semiconductor Devices and Circuit Design 10
- Ferroelectric and Negative Capacitance Devices 8
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- Electronic and Structural Properties of Oxides 8
- Co-authors
- S. Moreau (19 shared papers)S. Maı̂trejean (7 shared papers)H. Frémont (13 shared papers)A. Roule (4 shared papers)E. Gourvest (6 shared papers)C. Vallée (3 shared papers)E. Martínez (12 shared papers)B. Pelissier (1 shared paper)
- Journals
- Microelectronics Reliability (5 papers)Microelectronic Engineering (4 papers)Journal of The Electrochemical Society (3 papers)ECS Journal of Solid State Science and Technology (3 papers)Applied Physics Letters (2 papers)
- Partner nations
- FranceSwitzerlandCzechia
In The Last Decade
S. Lhostis
68 papers receiving 765 citations
Peers
Comparison fields: 5 of 42
- Electrical and Electronic Engineering 630
- Electronic, Optical and Magnetic Materials 178
- Materials Chemistry 299
- Surfaces, Coatings and Films 36
- Automotive Engineering 58
Countries citing papers authored by S. Lhostis
This map shows the geographic impact of S. Lhostis's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by S. Lhostis with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites S. Lhostis more than expected).
Fields of papers citing papers by S. Lhostis
This network shows the impact of papers produced by S. Lhostis. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by S. Lhostis. The network helps show where S. Lhostis may publish in the future.
Co-authors
The 25 scholars most cited alongside S. Lhostis, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 71 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 2012 | 61 | |
| 2 | 2017 | 42 | |
| 3 | 2009 | 40 | |
| 4 | 2022 | 38 | |
| 5 | 2009 | 37 | |
| 6 | 2003 | 34 | |
| 7 | 2017 | 31 | |
| 8 | 2009 | 30 | |
| 9 | 2005 | 27 | |
| 10 | 2019 | 27 | |
| 11 | 2013 | 23 | |
| 12 | 2007 | 22 | |
| 13 | 2007 | 21 | |
| 14 | 2011 | 19 | |
| 15 | 2018 | 19 | |
| 16 | 2016 | 18 | |
| 17 | 2015 | 16 | |
| 18 | 2018 | 16 | |
| 19 | 2011 | 14 | |
| 20 | 2010 | 14 |
About S. Lhostis
S. Lhostis is a scholar working on Electrical and Electronic Engineering, Materials Chemistry, Electronic, Optical and Magnetic Materials, Surfaces, Coatings and Films and Biomedical Engineering, having authored 71 papers that have together received 790 indexed citations. Recurring topics across this work include Semiconductor materials and devices (31 papers), 3D IC and TSV technologies (29 papers), Electronic Packaging and Soldering Technologies (17 papers), Integrated Circuits and Semiconductor Failure Analysis (16 papers), Copper Interconnects and Reliability (13 papers), Advancements in Semiconductor Devices and Circuit Design (10 papers), Ferroelectric and Negative Capacitance Devices (8 papers) and Electronic and Structural Properties of Oxides (8 papers). The work is most often cited by research in Electrical and Electronic Engineering (630 citations), Electronic, Optical and Magnetic Materials (178 citations), Materials Chemistry (299 citations), Surfaces, Coatings and Films (36 citations) and Automotive Engineering (58 citations). S. Lhostis has collaborated with scholars based in France, Switzerland and Czechia. Frequent co-authors include S. Moreau, S. Maı̂trejean, H. Frémont, A. Roule, E. Gourvest, C. Vallée, E. Martínez, B. Pelissier, L. Arnaud and E. Deloffre. Their work appears in journals such as Microelectronics Reliability, Microelectronic Engineering, Journal of The Electrochemical Society, ECS Journal of Solid State Science and Technology and Applied Physics Letters.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.