S. Moreau
Impact in
- Otorhinolaryngology top 5%
- Ear Surgery and Otitis Media
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- 3D IC and TSV technologies
- Electronic Packaging and Soldering Technologies
- Semiconductor materials and devices
- Integrated Circuits and Semiconductor Failure Analysis
Papers in
-
- 3D IC and TSV technologies 60
- Electronic Packaging and Soldering Technologies 42
- Semiconductor materials and devices 25
- Integrated Circuits and Semiconductor Failure Analysis 14
- Advancements in Semiconductor Devices and Circuit Design 7
- Electrowetting and Microfluidic Technologies 5
-
- Copper Interconnects and Reliability 31
- Co-authors
- L. Arnaud (9 shared papers)S. Lhostis (19 shared papers)D. Bouchu (15 shared papers)C. Chappaz (4 shared papers)E. Babin (8 shared papers)H. Frémont (13 shared papers)F. Lorut (4 shared papers)Aurélie Thuaire (2 shared papers)
- Journals
- Microelectronics Reliability (5 papers)IEEE Electron Device Letters (4 papers)IEEE Transactions on Nuclear Science (3 papers)ECS Journal of Solid State Science and Technology (3 papers)IEEE Transactions on Device and Materials Reliability (2 papers)
- Partner nations
- FranceUnited StatesSwitzerland
In The Last Decade
S. Moreau
97 papers receiving 973 citations
Peers
Comparison fields: 5 of 108
- Otorhinolaryngology 97
- Electrical and Electronic Engineering 683
- Electronic, Optical and Magnetic Materials 196
- Automotive Engineering 81
- Neurology 53
Countries citing papers authored by S. Moreau
This map shows the geographic impact of S. Moreau's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by S. Moreau with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites S. Moreau more than expected).
Fields of papers citing papers by S. Moreau
This network shows the impact of papers produced by S. Moreau. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by S. Moreau. The network helps show where S. Moreau may publish in the future.
Co-authors
The 25 scholars most cited alongside S. Moreau, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 111 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 2012 | 98 | |
| 2 | [Intracranial complications of acute mastoiditis]. | 2001 | 95 |
| 3 | 2011 | 65 | |
| 4 | 2016 | 51 | |
| 5 | 2022 | 38 | |
| 6 | 2013 | 35 | |
| 7 | 2014 | 33 | |
| 8 | 2019 | 27 | |
| 9 | 2017 | 26 | |
| 10 | 2011 | 25 | |
| 11 | 2009 | 24 | |
| 12 | 2011 | 23 | |
| 13 | 2018 | 22 | |
| 14 | 2011 | 19 | |
| 15 | 2010 | 16 | |
| 16 | 2018 | 16 | |
| 17 | 2016 | 15 | |
| 18 | 2013 | 15 | |
| 19 | 2022 | 14 | |
| 20 | 2020 | 14 |
About S. Moreau
S. Moreau is a scholar working on Electrical and Electronic Engineering, Electronic, Optical and Magnetic Materials, Biomedical Engineering, Surgery and Rheumatology, having authored 111 papers that have together received 1.0k indexed citations. Recurring topics across this work include 3D IC and TSV technologies (60 papers), Electronic Packaging and Soldering Technologies (42 papers), Copper Interconnects and Reliability (31 papers), Semiconductor materials and devices (25 papers), Integrated Circuits and Semiconductor Failure Analysis (14 papers), Advanced Surface Polishing Techniques (7 papers), Advancements in Semiconductor Devices and Circuit Design (7 papers) and Electrowetting and Microfluidic Technologies (5 papers). The work is most often cited by research in Otorhinolaryngology (97 citations), Electrical and Electronic Engineering (683 citations), Electronic, Optical and Magnetic Materials (196 citations), Automotive Engineering (81 citations) and Neurology (53 citations). S. Moreau has collaborated with scholars based in France, United States and Switzerland. Frequent co-authors include L. Arnaud, S. Lhostis, D. Bouchu, C. Chappaz, E. Babin, H. Frémont, F. Lorut, Aurélie Thuaire, Thomas Frank and Lorena Anghel. Their work appears in journals such as Microelectronics Reliability, IEEE Electron Device Letters, IEEE Transactions on Nuclear Science, ECS Journal of Solid State Science and Technology and IEEE Transactions on Device and Materials Reliability.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.