F. Lorut
Impact in
- Structural Biology top 5%
- Advanced Electron Microscopy Techniques and Applications
- Surfaces, Coatings and Films top 10%
- Electron and X-Ray Spectroscopy Techniques
Papers in
-
- Integrated Circuits and Semiconductor Failure Analysis 24
- Semiconductor materials and devices 12
- 3D IC and TSV technologies 7
- Advancements in Photolithography Techniques 7
-
- Electron and X-Ray Spectroscopy Techniques 17
- Co-authors
- S. Moreau (4 shared papers)Philip R. LeDuc (3 shared papers)L. Arnaud (2 shared papers)Lorena Anghel (2 shared papers)Aurélie Thuaire (2 shared papers)Thomas Frank (2 shared papers)C. Chappaz (2 shared papers)R. Pantel (5 shared papers)
- Journals
- Microscopy and Microanalysis (4 papers)Applied Physics Letters (3 papers)Journal of Applied Physics (3 papers)Journal of Microscopy (2 papers)Nanotechnology (2 papers)
- Partner nations
- FranceIndiaSwitzerland
In The Last Decade
F. Lorut
49 papers receiving 451 citations
Peers
Comparison fields: 5 of 41
- Structural Biology 66
- Surfaces, Coatings and Films 73
- Electronic, Optical and Magnetic Materials 106
- Electrical and Electronic Engineering 298
- Radiation 28
Countries citing papers authored by F. Lorut
This map shows the geographic impact of F. Lorut's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by F. Lorut with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites F. Lorut more than expected).
Fields of papers citing papers by F. Lorut
This network shows the impact of papers produced by F. Lorut. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by F. Lorut. The network helps show where F. Lorut may publish in the future.
Co-authors
The 25 scholars most cited alongside F. Lorut, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 51 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 2012 | 85 | |
| 2 | 2011 | 65 | |
| 3 | 2013 | 43 | |
| 4 | 2017 | 23 | |
| 5 | 1999 | 22 | |
| 6 | 2011 | 19 | |
| 7 | 2009 | 19 | |
| 8 | 2013 | 18 | |
| 9 | 2013 | 12 | |
| 10 | 2019 | 10 | |
| 11 | 2000 | 10 | |
| 12 | 2005 | 9 | |
| 13 | 2014 | 8 | |
| 14 | 2013 | 8 | |
| 15 | 2010 | 8 | |
| 16 | 2013 | 6 | |
| 17 | 2005 | 6 | |
| 18 | 2013 | 6 | |
| 19 | 2014 | 6 | |
| 20 | 2016 | 5 |
About F. Lorut
F. Lorut is a scholar working on Electrical and Electronic Engineering, Surfaces, Coatings and Films, Biomedical Engineering, Atomic and Molecular Physics, and Optics and Materials Chemistry, having authored 51 papers that have together received 459 indexed citations. Recurring topics across this work include Integrated Circuits and Semiconductor Failure Analysis (24 papers), Electron and X-Ray Spectroscopy Techniques (17 papers), Semiconductor materials and devices (12 papers), Advanced Electron Microscopy Techniques and Applications (8 papers), 3D IC and TSV technologies (7 papers), Advancements in Photolithography Techniques (7 papers), Phase-change materials and chalcogenides (7 papers) and Copper Interconnects and Reliability (5 papers). The work is most often cited by research in Structural Biology (66 citations), Surfaces, Coatings and Films (73 citations), Electronic, Optical and Magnetic Materials (106 citations), Electrical and Electronic Engineering (298 citations) and Radiation (28 citations). F. Lorut has collaborated with scholars based in France, India and Switzerland. Frequent co-authors include S. Moreau, Philip R. LeDuc, L. Arnaud, Lorena Anghel, Aurélie Thuaire, Thomas Frank, C. Chappaz, R. Pantel, Thierry Épicier and L. Clément. Their work appears in journals such as Microscopy and Microanalysis, Applied Physics Letters, Journal of Applied Physics, Journal of Microscopy and Nanotechnology.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.