Microelectronics Reliability
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In The Last Decade
Fields of papers published in Microelectronics Reliability
Since SpecializationThis network shows the impact of papers published in Microelectronics Reliability. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers published in Microelectronics Reliability.
Countries where authors publish in Microelectronics Reliability
Since SpecializationThis map shows the geographic impact of research published in Microelectronics Reliability. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by papers published in Microelectronics Reliability with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Microelectronics Reliability more than expected).
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar’s output or impact.