IEEE Transactions on Instrumentation and Measurement · 1×
×4.216k/4kSRRQ
×0.691k/151kEEE
×9.58k/883CMP
×0.65k/8kAE
×0.53k/6kHA
Citations per year
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Countries where authors publish in Microelectronics Reliability
Since Specialization
Citations
This map shows the geographic impact of research published in Microelectronics Reliability. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by papers published in Microelectronics Reliability with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Microelectronics Reliability more than expected).
Fields of papers published in Microelectronics Reliability
This network shows the impact of papers published in Microelectronics Reliability. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers published in Microelectronics Reliability.
About Microelectronics Reliability
The 11.4k papers published in Microelectronics Reliability in the last decades have received a total of 148.2k indexed citations . Papers published in Microelectronics Reliability usually cover Safety, Risk, Reliability and Quality (2k papers), Electrical and Electronic Engineering (7.8k papers), Condensed Matter Physics (561 papers), Hardware and Architecture (356 papers) and Software (145 papers) specifically the topics of Electronic Packaging and Soldering Technologies (2.1k papers), Reliability and Maintenance Optimization (2k papers), Semiconductor materials and devices (1.7k papers), Integrated Circuits and Semiconductor Failure Analysis (1.1k papers), Silicon Carbide Semiconductor Technologies (1.1k papers), Radiation Effects in Electronics (940 papers), GaN-based semiconductor devices and materials (560 papers) and Advancements in Semiconductor Devices and Circuit Design (503 papers). The most active scholars publishing in Microelectronics Reliability are Michael Gerard Pecht, Mauro Ciappa, B.S. Dhillon, K. N. Tu, Tibor Grasser, Y.C. Chan, G.W.A.D., Yi‐Shao Lai, Souvik Mahapatra and Daniel M. Fleetwood.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive
bibliographic database. While OpenAlex provides broad and valuable coverage of the global
research landscape, it—like all bibliographic datasets—has inherent limitations. These include
incomplete records, variations in author disambiguation, differences in journal indexing, and
delays in data updates. As a result, some metrics and network relationships displayed in
Rankless may not fully capture the entirety of a scholar's output or impact.