N. Jourdan
Impact in
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- Copper Interconnects and Reliability
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- Semiconductor materials and devices
- Electronic Packaging and Soldering Technologies
- 3D IC and TSV technologies
- Advancements in Semiconductor Devices and Circuit Design
- Integrated Circuits and Semiconductor Failure Analysis
Papers in
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- Semiconductor materials and devices 17
- Electronic Packaging and Soldering Technologies 8
- Integrated Circuits and Semiconductor Failure Analysis 5
- 3D IC and TSV technologies 4
- Electrodeposition and Electroless Coatings 4
- Advancements in Semiconductor Devices and Circuit Design 3
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- Copper Interconnects and Reliability 17
- Co-authors
- Zs. Tôkei (14 shared papers)Kristof Croes (12 shared papers)Marleen H. van der Veen (10 shared papers)Olalla Varela Pedreira (10 shared papers)J. Bömmels (8 shared papers)Herbert Struyf (6 shared papers)K. Vandersmissen (3 shared papers)Ivan Ciofi (4 shared papers)
- Journals
- IEEE Transactions on Electron Devices (2 papers)Journal of Crystal Growth (1 paper)Microelectronic Engineering (1 paper)Microelectronics Reliability (1 paper)ECS Solid State Letters (1 paper)
- Partner nations
- BelgiumUnited StatesFrance
In The Last Decade
N. Jourdan
25 papers receiving 333 citations
Peers
Comparison fields: 5 of 28
- Electronic, Optical and Magnetic Materials 164
- Electrical and Electronic Engineering 314
- Atomic and Molecular Physics, and Optics 75
- Mechanics of Materials 37
- Materials Chemistry 51
Countries citing papers authored by N. Jourdan
This map shows the geographic impact of N. Jourdan's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by N. Jourdan with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites N. Jourdan more than expected).
Fields of papers citing papers by N. Jourdan
This network shows the impact of papers produced by N. Jourdan. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by N. Jourdan. The network helps show where N. Jourdan may publish in the future.
Co-authors
The 25 scholars most cited alongside N. Jourdan, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 26 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 2017 | 63 | |
| 2 | 2018 | 50 | |
| 3 | 2011 | 43 | |
| 4 | 1992 | 24 | |
| 5 | 2008 | 23 | |
| 6 | 2016 | 19 | |
| 7 | 2016 | 18 | |
| 8 | 2005 | 13 | |
| 9 | 2020 | 10 | |
| 10 | 2012 | 10 | |
| 11 | 2014 | 10 | |
| 12 | 2019 | 9 | |
| 13 | 2016 | 9 | |
| 14 | 2013 | 8 | |
| 15 | 1993 | 7 | |
| 16 | 2016 | 6 | |
| 17 | 2022 | 5 | |
| 18 | 2020 | 5 | |
| 19 | 2024 | 3 | |
| 20 | 2007 | 3 |
About N. Jourdan
N. Jourdan is a scholar working on Electrical and Electronic Engineering, Electronic, Optical and Magnetic Materials, Atomic and Molecular Physics, and Optics, Condensed Matter Physics and Materials Chemistry, having authored 26 papers that have together received 347 indexed citations. Recurring topics across this work include Copper Interconnects and Reliability (17 papers), Semiconductor materials and devices (17 papers), Electronic Packaging and Soldering Technologies (8 papers), Semiconductor materials and interfaces (5 papers), Integrated Circuits and Semiconductor Failure Analysis (5 papers), 3D IC and TSV technologies (4 papers), Electrodeposition and Electroless Coatings (4 papers) and Advancements in Semiconductor Devices and Circuit Design (3 papers). The work is most often cited by research in Electronic, Optical and Magnetic Materials (164 citations), Electrical and Electronic Engineering (314 citations), Atomic and Molecular Physics, and Optics (75 citations), Mechanics of Materials (37 citations) and Materials Chemistry (51 citations). N. Jourdan has collaborated with scholars based in Belgium, United States and France. Frequent co-authors include Zs. Tôkei, Kristof Croes, Marleen H. van der Veen, Olalla Varela Pedreira, J. Bömmels, Herbert Struyf, K. Vandersmissen, Ivan Ciofi, Christopher J. Wilson and C. Dubon‐Chevallier. Their work appears in journals such as IEEE Transactions on Electron Devices, Journal of Crystal Growth, Microelectronic Engineering, Microelectronics Reliability and ECS Solid State Letters.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.