Patrick Jaenen

1.3k citations
52 papers · 1.1k · h-index 14

Impact in

Papers in

Patrick Jaenen

52 papers receiving 1.0k citations

Peers

Patrick Jaenen
Comparison fields: 5 of 43
  • Surfaces, Coatings and Films 153
  • Electrical and Electronic Engineering 1.0k
  • Atomic and Molecular Physics, and Optics 485
  • Biomedical Engineering 195
  • Hardware and Architecture 30
Replace Tolga Tekin with:
Tolga Tekin Germany
Guy M. Cohen United States
Marc Zussy France
Véronique Carron France
Hans Loeschner Austria
Jangho Shin South Korea
Thomas M. Chiarella Belgium
Katsuya Okumura Japan
Chunshui Du China
Candi S. Cook United States
Patrick Jaenen relative to Tolga Tekin Germany Tolga Tekin's profile →
Citations per field
00.5×1.5×2×2.5×
Tolga Tekin · 1×
Citations per year

Countries citing papers authored by Patrick Jaenen

Since Specialization
Citations

This map shows the geographic impact of Patrick Jaenen's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Patrick Jaenen with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Patrick Jaenen more than expected).

Fields of papers citing papers by Patrick Jaenen

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Patrick Jaenen. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Patrick Jaenen. The network helps show where Patrick Jaenen may publish in the future.

Co-authors

The 25 scholars most cited alongside Patrick Jaenen, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with Patrick Jaenen Line = papers co-authored together Patrick Jaenen links everyone, so they are left out of the graph.

All Works

20 of 20 papers shown

Showing the 20 most-cited of 52 papers — load more, or switch the sort, to bring in the rest.

#Work
1 2006281
2 2009180
3 2006110
4 200773
5 200666
6 201146
7 201143
8 200539
9 200924
10 200519
11 200117
12 200815
13 202115
14 201014
15 200511
16 200511
17 200511
18 200710
19 201310
20 20059

About Patrick Jaenen

Patrick Jaenen is a scholar working on Electrical and Electronic Engineering, Surfaces, Coatings and Films, Biomedical Engineering, Atomic and Molecular Physics, and Optics and Electronic, Optical and Magnetic Materials, having authored 52 papers that have together received 1.1k indexed citations. Recurring topics across this work include Advancements in Photolithography Techniques (24 papers), 3D IC and TSV technologies (15 papers), Integrated Circuits and Semiconductor Failure Analysis (13 papers), Semiconductor materials and devices (13 papers), Photonic and Optical Devices (10 papers), Photonic Crystals and Applications (10 papers), Advanced Surface Polishing Techniques (9 papers) and Nanofabrication and Lithography Techniques (9 papers). The work is most often cited by research in Surfaces, Coatings and Films (153 citations), Electrical and Electronic Engineering (1.0k citations), Atomic and Molecular Physics, and Optics (485 citations), Biomedical Engineering (195 citations) and Hardware and Architecture (30 citations). Patrick Jaenen has collaborated with scholars based in Belgium, Netherlands and United States. Frequent co-authors include Pieter Dumon, Dries Van Thourhout, Wim Bogaerts, Roel Baets, Johan Wouters, Dirk Taillaert, Stephan Beckx, Vincent I. Wiaux, Shankar Kumar Selvaraja and S. Beckx. Their work appears in journals such as Microelectronic Engineering, Journal of Photopolymer Science and Technology, Microelectronics Reliability, Japanese Journal of Applied Physics and IEEE Journal of Selected Topics in Quantum Electronics.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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