Gerald Beyer
Impact in
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- Copper Interconnects and Reliability
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- 3D IC and TSV technologies
- Electronic Packaging and Soldering Technologies
- Semiconductor materials and devices
- Integrated Circuits and Semiconductor Failure Analysis
Papers in
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- 3D IC and TSV technologies 151
- Semiconductor materials and devices 117
- Electronic Packaging and Soldering Technologies 112
- Integrated Circuits and Semiconductor Failure Analysis 31
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- Copper Interconnects and Reliability 117
- Co-authors
- Eric Beyne (157 shared papers)Andy Miller (70 shared papers)Zsolt Tökei (39 shared papers)Kristof Croes (48 shared papers)Mikhaı̈l R. Baklanov (22 shared papers)Alain Phommahaxay (53 shared papers)Zs. Tôkei (27 shared papers)N. Heylen (27 shared papers)
- Journals
- Microelectronic Engineering (32 papers)Japanese Journal of Applied Physics (6 papers)Applied Physics Letters (5 papers)ECS Journal of Solid State Science and Technology (5 papers)Journal of Applied Physics (4 papers)
- Partner nations
- BelgiumUnited StatesJapan
In The Last Decade
Gerald Beyer
264 papers receiving 3.2k citations
Peers
Comparison fields: 5 of 62
- Electronic, Optical and Magnetic Materials 1.2k
- Electrical and Electronic Engineering 3.0k
- Automotive Engineering 318
- Ceramics and Composites 103
- Mechanics of Materials 417
Countries citing papers authored by Gerald Beyer
This map shows the geographic impact of Gerald Beyer's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Gerald Beyer with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Gerald Beyer more than expected).
Fields of papers citing papers by Gerald Beyer
This network shows the impact of papers produced by Gerald Beyer. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Gerald Beyer. The network helps show where Gerald Beyer may publish in the future.
Co-authors
The 25 scholars most cited alongside Gerald Beyer, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 277 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 2017 | 115 | |
| 2 | 2001 | 90 | |
| 3 | 2005 | 87 | |
| 4 | 2020 | 84 | |
| 5 | 1999 | 82 | |
| 6 | 2019 | 61 | |
| 7 | 2003 | 57 | |
| 8 | 2016 | 51 | |
| 9 | 2005 | 47 | |
| 10 | 2007 | 47 | |
| 11 | 2009 | 46 | |
| 12 | 2020 | 44 | |
| 13 | 2010 | 44 | |
| 14 | 2011 | 43 | |
| 15 | 2002 | 39 | |
| 16 | 2018 | 38 | |
| 17 | 2011 | 35 | |
| 18 | 2019 | 34 | |
| 19 | 2021 | 34 | |
| 20 | 2006 | 34 |
About Gerald Beyer
Gerald Beyer is a scholar working on Electrical and Electronic Engineering, Electronic, Optical and Magnetic Materials, Biomedical Engineering, Automotive Engineering and Mechanics of Materials, having authored 277 papers that have together received 3.3k indexed citations. Recurring topics across this work include 3D IC and TSV technologies (151 papers), Semiconductor materials and devices (117 papers), Copper Interconnects and Reliability (117 papers), Electronic Packaging and Soldering Technologies (112 papers), Additive Manufacturing and 3D Printing Technologies (33 papers), Integrated Circuits and Semiconductor Failure Analysis (31 papers), Advanced Surface Polishing Techniques (28 papers) and Metal and Thin Film Mechanics (28 papers). The work is most often cited by research in Electronic, Optical and Magnetic Materials (1.2k citations), Electrical and Electronic Engineering (3.0k citations), Automotive Engineering (318 citations), Ceramics and Composites (103 citations) and Mechanics of Materials (417 citations). Gerald Beyer has collaborated with scholars based in Belgium, United States and Japan. Frequent co-authors include Eric Beyne, Andy Miller, Zsolt Tökei, Kristof Croes, Mikhaı̈l R. Baklanov, Alain Phommahaxay, Zs. Tôkei, N. Heylen, Karen Maex and Michele Stucchi. Their work appears in journals such as Microelectronic Engineering, Japanese Journal of Applied Physics, Applied Physics Letters, ECS Journal of Solid State Science and Technology and Journal of Applied Physics.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.