J. Torrès
Impact in
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- Copper Interconnects and Reliability
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- Semiconductor materials and devices
- Electronic Packaging and Soldering Technologies
- 3D IC and TSV technologies
- Integrated Circuits and Semiconductor Failure Analysis
Papers in
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- Semiconductor materials and devices 81
- 3D IC and TSV technologies 26
- Electronic Packaging and Soldering Technologies 23
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- Copper Interconnects and Reliability 89
- Co-authors
- J. Palleau (26 shared papers)G. Bomchil (5 shared papers)V. Arnal (22 shared papers)A. Farcy (37 shared papers)R. Madar (10 shared papers)R. Pantel (9 shared papers)L.G. Gosset (19 shared papers)L.L. Chapelon (9 shared papers)
- Journals
- Microelectronic Engineering (49 papers)Thin Solid Films (5 papers)Applied Surface Science (4 papers)Journal of Applied Physics (4 papers)Microelectronics Reliability (3 papers)
- Partner nations
- FranceSwitzerlandMexico
In The Last Decade
J. Torrès
126 papers receiving 1.2k citations
Peers
Comparison fields: 5 of 48
- Electronic, Optical and Magnetic Materials 602
- Electrical and Electronic Engineering 978
- Mechanics of Materials 261
- Atomic and Molecular Physics, and Optics 273
- Materials Chemistry 295
Countries citing papers authored by J. Torrès
This map shows the geographic impact of J. Torrès's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by J. Torrès with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites J. Torrès more than expected).
Fields of papers citing papers by J. Torrès
This network shows the impact of papers produced by J. Torrès. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by J. Torrès. The network helps show where J. Torrès may publish in the future.
Co-authors
The 25 scholars most cited alongside J. Torrès, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 132 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 1995 | 88 | |
| 2 | 2008 | 54 | |
| 3 | 1986 | 39 | |
| 4 | 1997 | 37 | |
| 5 | 2004 | 32 | |
| 6 | 1999 | 28 | |
| 7 | 1986 | 26 | |
| 8 | 1985 | 26 | |
| 9 | 1987 | 25 | |
| 10 | 2005 | 25 | |
| 11 | 2000 | 25 | |
| 12 | 2002 | 24 | |
| 13 | 1984 | 23 | |
| 14 | 1998 | 23 | |
| 15 | 2008 | 23 | |
| 16 | 1995 | 22 | |
| 17 | 1996 | 22 | |
| 18 | 2007 | 21 | |
| 19 | 2005 | 19 | |
| 20 | 1986 | 18 |
About J. Torrès
J. Torrès is a scholar working on Electrical and Electronic Engineering, Electronic, Optical and Magnetic Materials, Atomic and Molecular Physics, and Optics, Materials Chemistry and Mechanics of Materials, having authored 132 papers that have together received 1.3k indexed citations. Recurring topics across this work include Copper Interconnects and Reliability (89 papers), Semiconductor materials and devices (81 papers), Semiconductor materials and interfaces (27 papers), 3D IC and TSV technologies (26 papers), Electronic Packaging and Soldering Technologies (23 papers), Metal and Thin Film Mechanics (8 papers), Anodic Oxide Films and Nanostructures (7 papers) and Advanced Surface Polishing Techniques (6 papers). The work is most often cited by research in Electronic, Optical and Magnetic Materials (602 citations), Electrical and Electronic Engineering (978 citations), Mechanics of Materials (261 citations), Atomic and Molecular Physics, and Optics (273 citations) and Materials Chemistry (295 citations). J. Torrès has collaborated with scholars based in France, Switzerland and Mexico. Frequent co-authors include J. Palleau, G. Bomchil, V. Arnal, A. Farcy, R. Madar, R. Pantel, L.G. Gosset, L.L. Chapelon, A. Pério and Flavie Braud. Their work appears in journals such as Microelectronic Engineering, Thin Solid Films, Applied Surface Science, Journal of Applied Physics and Microelectronics Reliability.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.