F. Chen
Impact in
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- Copper Interconnects and Reliability
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- Semiconductor materials and devices
- Integrated Circuits and Semiconductor Failure Analysis
- 3D IC and TSV technologies
- Electronic Packaging and Soldering Technologies
- Advancements in Semiconductor Devices and Circuit Design
- Advancements in Photolithography Techniques
Papers in
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- Semiconductor materials and devices 20
- Electronic Packaging and Soldering Technologies 9
- Integrated Circuits and Semiconductor Failure Analysis 6
- 3D IC and TSV technologies 4
- Ferroelectric and Negative Capacitance Devices 1
- Silicon and Solar Cell Technologies 1
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- Copper Interconnects and Reliability 17
- Co-authors
- J. Aitken (5 shared papers)P. McLaughlin (4 shared papers)M. Shinosky (8 shared papers)J. Gill (6 shared papers)T. Sullivan (4 shared papers)J. R. Lloyd (2 shared papers)Kaushik Chanda (2 shared papers)D. Harmon (3 shared papers)
- Journals
- Microelectronics Reliability (3 papers)Microelectronic Engineering (1 paper)IEEE Electron Device Letters (1 paper)MRS Proceedings (1 paper)
- Partner nations
- United StatesGermanySouth Korea
In The Last Decade
F. Chen
21 papers receiving 438 citations
Peers
Comparison fields: 5 of 32
- Electronic, Optical and Magnetic Materials 266
- Electrical and Electronic Engineering 433
- Hardware and Architecture 17
- Ceramics and Composites 7
- Atomic and Molecular Physics, and Optics 35
Countries citing papers authored by F. Chen
This map shows the geographic impact of F. Chen's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by F. Chen with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites F. Chen more than expected).
Fields of papers citing papers by F. Chen
This network shows the impact of papers produced by F. Chen. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by F. Chen. The network helps show where F. Chen may publish in the future.
Co-authors
The 25 scholars most cited alongside F. Chen, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 21 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 2006 | 121 | |
| 2 | 2011 | 93 | |
| 3 | 2008 | 37 | |
| 4 | 2008 | 34 | |
| 5 | 2007 | 26 | |
| 6 | 2015 | 18 | |
| 7 | 2004 | 18 | |
| 8 | 2009 | 18 | |
| 9 | 2011 | 14 | |
| 10 | 2006 | 13 | |
| 11 | 2010 | 13 | |
| 12 | 2007 | 11 | |
| 13 | 2005 | 8 | |
| 14 | 2013 | 6 | |
| 15 | 2011 | 5 | |
| 16 | 2015 | 3 | |
| 17 | 2014 | 3 | |
| 18 | 2006 | 3 | |
| 19 | 2012 | 3 | |
| 20 | 2005 | 2 |
About F. Chen
F. Chen is a scholar working on Electrical and Electronic Engineering, Electronic, Optical and Magnetic Materials, Mechanics of Materials, Hardware and Architecture and Surfaces, Coatings and Films, having authored 21 papers that have together received 451 indexed citations. Recurring topics across this work include Semiconductor materials and devices (20 papers), Copper Interconnects and Reliability (17 papers), Electronic Packaging and Soldering Technologies (9 papers), Integrated Circuits and Semiconductor Failure Analysis (6 papers), 3D IC and TSV technologies (4 papers), Ferroelectric and Negative Capacitance Devices (1 paper), VLSI and Analog Circuit Testing (1 paper) and Silicon and Solar Cell Technologies (1 paper). The work is most often cited by research in Electronic, Optical and Magnetic Materials (266 citations), Electrical and Electronic Engineering (433 citations), Hardware and Architecture (17 citations), Ceramics and Composites (7 citations) and Atomic and Molecular Physics, and Optics (35 citations). F. Chen has collaborated with scholars based in United States, Germany and South Korea. Frequent co-authors include J. Aitken, P. McLaughlin, M. Shinosky, J. Gill, T. Sullivan, J. R. Lloyd, Kaushik Chanda, D. Harmon, C. Kothandaraman and Cornelia Tsang. Their work appears in journals such as Microelectronics Reliability, Microelectronic Engineering, IEEE Electron Device Letters and MRS Proceedings.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.