W. Landers
Impact in
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- 3D IC and TSV technologies
- Electronic Packaging and Soldering Technologies
- Semiconductor materials and devices
- Integrated Circuits and Semiconductor Failure Analysis
- Advanced Memory and Neural Computing
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- Quantum and electron transport phenomena
Papers in
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- 3D IC and TSV technologies 4
- Semiconductor materials and devices 4
- Integrated Circuits and Semiconductor Failure Analysis 1
- Electronic Packaging and Soldering Technologies 1
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- Copper Interconnects and Reliability 2
- Co-authors
- Subramanian S. Iyer (3 shared papers)C. Kothandaraman (4 shared papers)John Safran (4 shared papers)K. Petrarca (3 shared papers)Timothy D. Sullivan (2 shared papers)Cornelia Tsang (1 shared paper)E. Sprogis (1 shared paper)R. W. Liptak (1 shared paper)
- Journals
- Physical Review Letters (1 paper)
- Partner nations
- United States
In The Last Decade
W. Landers
5 papers receiving 159 citations
Peers
Comparison fields: 5 of 16
- Electrical and Electronic Engineering 114
- Atomic and Molecular Physics, and Optics 51
- Artificial Intelligence 47
- Automotive Engineering 9
- Hardware and Architecture 5
Countries citing papers authored by W. Landers
This map shows the geographic impact of W. Landers's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by W. Landers with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites W. Landers more than expected).
Fields of papers citing papers by W. Landers
This network shows the impact of papers produced by W. Landers. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by W. Landers. The network helps show where W. Landers may publish in the future.
Co-authors
The 25 scholars most cited alongside W. Landers, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2011 | 96 | |
| 2 | 2022 | 53 | |
| 3 | 2012 | 6 | |
| 4 | 2014 | 5 | |
| 5 | 2015 | 3 |
About W. Landers
W. Landers is a scholar working on Electrical and Electronic Engineering, Electronic, Optical and Magnetic Materials, Atomic and Molecular Physics, and Optics, Artificial Intelligence and Infectious Diseases, having authored 5 papers that have together received 163 indexed citations. Recurring topics across this work include 3D IC and TSV technologies (4 papers), Semiconductor materials and devices (4 papers), Copper Interconnects and Reliability (2 papers), Quantum Computing Algorithms and Architecture (1 paper), Integrated Circuits and Semiconductor Failure Analysis (1 paper), Electronic Packaging and Soldering Technologies (1 paper), Quantum Information and Cryptography (1 paper) and Quantum Mechanics and Applications (1 paper). The work is most often cited by research in Electrical and Electronic Engineering (114 citations), Atomic and Molecular Physics, and Optics (51 citations), Artificial Intelligence (47 citations), Automotive Engineering (9 citations) and Hardware and Architecture (5 citations). W. Landers has collaborated with scholars based in United States. Frequent co-authors include Subramanian S. Iyer, C. Kothandaraman, John Safran, K. Petrarca, Timothy D. Sullivan, Cornelia Tsang, E. Sprogis, R. W. Liptak, Paul Andry and F. Chen. Their work appears in journals such as Physical Review Letters.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.