F.H. Baumann
Impact in
- Structural Biology top 0.5%
- Advanced Electron Microscopy Techniques and Applications
- Surfaces, Coatings and Films top 1%
- Electron and X-Ray Spectroscopy Techniques
Papers in
-
- Semiconductor materials and devices 41
- Integrated Circuits and Semiconductor Failure Analysis 22
- Advancements in Semiconductor Devices and Circuit Design 18
-
- Semiconductor materials and interfaces 8
- Co-authors
- G. Timp (10 shared papers)T. Sorsch (8 shared papers)K. Evans‐Lutterodt (5 shared papers)David A. Muller (4 shared papers)S. Moccio (3 shared papers)A. Ourmazd (13 shared papers)Peter Schwander (6 shared papers)Y. Kim (6 shared papers)
- Journals
- Microscopy and Microanalysis (7 papers)Microelectronic Engineering (4 papers)Journal of Applied Physics (4 papers)Ultramicroscopy (4 papers)Applied Physics Letters (3 papers)
- Partner nations
- United StatesGermanyFrance
In The Last Decade
F.H. Baumann
81 papers receiving 2.4k citations
F.H. Baumann's Hit Papers
Peers
Comparison fields: 5 of 74
- Structural Biology 367
- Surfaces, Coatings and Films 399
- Electrical and Electronic Engineering 1.7k
- Atomic and Molecular Physics, and Optics 594
- Materials Chemistry 824
Countries citing papers authored by F.H. Baumann
This map shows the geographic impact of F.H. Baumann's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by F.H. Baumann with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites F.H. Baumann more than expected).
Fields of papers citing papers by F.H. Baumann
This network shows the impact of papers produced by F.H. Baumann. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by F.H. Baumann. The network helps show where F.H. Baumann may publish in the future.
Co-authors
The 25 scholars most cited alongside F.H. Baumann, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 87 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | The electronic structure at the atomic scale of ultrathin gate oxides Hit paper breakdown → | 1999 | 781 |
| 2 | 1999 | 283 | |
| 3 | 2002 | 121 | |
| 4 | 1990 | 117 | |
| 5 | 2000 | 107 | |
| 6 | 1995 | 84 | |
| 7 | 2002 | 75 | |
| 8 | 2001 | 74 | |
| 9 | 1993 | 71 | |
| 10 | 2000 | 66 | |
| 11 | 2003 | 64 | |
| 12 | 1996 | 48 | |
| 13 | 2014 | 46 | |
| 14 | 1991 | 43 | |
| 15 | 1997 | 33 | |
| 16 | 2013 | 31 | |
| 17 | 2000 | 20 | |
| 18 | 1995 | 20 | |
| 19 | 1994 | 20 | |
| 20 | 2011 | 18 |
About F.H. Baumann
F.H. Baumann is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics, Electronic, Optical and Magnetic Materials, Surfaces, Coatings and Films and Materials Chemistry, having authored 87 papers that have together received 2.5k indexed citations. Recurring topics across this work include Semiconductor materials and devices (41 papers), Integrated Circuits and Semiconductor Failure Analysis (22 papers), Copper Interconnects and Reliability (21 papers), Advancements in Semiconductor Devices and Circuit Design (18 papers), Electron and X-Ray Spectroscopy Techniques (15 papers), Advanced Electron Microscopy Techniques and Applications (13 papers), Metal and Thin Film Mechanics (9 papers) and Semiconductor materials and interfaces (8 papers). The work is most often cited by research in Structural Biology (367 citations), Surfaces, Coatings and Films (399 citations), Electrical and Electronic Engineering (1.7k citations), Atomic and Molecular Physics, and Optics (594 citations) and Materials Chemistry (824 citations). F.H. Baumann has collaborated with scholars based in United States, Germany and France. Frequent co-authors include G. Timp, T. Sorsch, K. Evans‐Lutterodt, David A. Muller, S. Moccio, A. Ourmazd, Peter Schwander, Y. Kim, W.D. Rau and W. Höppner. Their work appears in journals such as Microscopy and Microanalysis, Microelectronic Engineering, Journal of Applied Physics, Ultramicroscopy and Applied Physics Letters.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.