John Safran

462 citations
19 papers · 352 · h-index 9

Impact in

    • Physical Unclonable Functions (PUFs) and Hardware Security
    • Semiconductor materials and devices
    • 3D IC and TSV technologies
    • Integrated Circuits and Semiconductor Failure Analysis
    • Advanced Memory and Neural Computing
    • Radio Frequency Integrated Circuit Design
    • Electronic Packaging and Soldering Technologies
    • Advancements in Semiconductor Devices and Circuit Design

Papers in

John Safran

18 papers receiving 335 citations

Peers

John Safran
Comparison fields: 5 of 24
  • Hardware and Architecture 95
  • Electrical and Electronic Engineering 333
  • Cellular and Molecular Neuroscience 32
  • Biomedical Engineering 50
  • Computer Networks and Communications 19
Replace Norman Robson with:
Norman Robson United States
Saibal Mukhopadhyay United States
Kaushik Vaidyanathan United States
Jiyang Kang China
Jim Holmes United States
A. Mallik Belgium
Che-Wei Wu Taiwan
Gicheol Shin South Korea
H. McAdams United States
Z. Abid Canada
John Safran relative to Norman Robson United States Norman Robson's profile →
Citations per field
00.5×1.7×
Norman Robson · 1×
Citations per year

Countries citing papers authored by John Safran

Since Specialization
Citations

This map shows the geographic impact of John Safran's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by John Safran with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites John Safran more than expected).

Fields of papers citing papers by John Safran

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by John Safran. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by John Safran. The network helps show where John Safran may publish in the future.

Co-authors

The 25 scholars most cited alongside John Safran, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with John Safran Line = papers co-authored together John Safran links everyone, so they are left out of the graph.

All Works

19 of 19 papers shown
#Work
1 201193
2 200756
3 201339
4 200339
5 200420
6 200720
7 200819
8
3D stackable 32nm High-K/Metal Gate SOI embedded DRAM prototype
201116
9 200614
10 20086
11 20126
12 20145
13 19985
14 20045
15 20153
16 20163
17 20162
18 20071
19 20150

About John Safran

John Safran is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics, Hardware and Architecture, Biomedical Engineering and Cellular and Molecular Neuroscience, having authored 19 papers that have together received 352 indexed citations. Recurring topics across this work include Semiconductor materials and devices (8 papers), 3D IC and TSV technologies (5 papers), Integrated Circuits and Semiconductor Failure Analysis (5 papers), Physical Unclonable Functions (PUFs) and Hardware Security (4 papers), Advanced Memory and Neural Computing (4 papers), Semiconductor materials and interfaces (3 papers), Radio Frequency Integrated Circuit Design (3 papers) and Analog and Mixed-Signal Circuit Design (2 papers). The work is most often cited by research in Hardware and Architecture (95 citations), Electrical and Electronic Engineering (333 citations), Cellular and Molecular Neuroscience (32 citations), Biomedical Engineering (50 citations) and Computer Networks and Communications (19 citations). John Safran has collaborated with scholars based in United States, Netherlands and India. Frequent co-authors include Subramanian S. Iyer, C. Kothandaraman, T. Kirihata, Alberto Cestero, Norman Robson, D. Moy, N. Zamdmer, Jean‐Olivier Plouchart, K. Petrarca and Sami Rosenblatt. Their work appears in journals such as IEEE Journal of Solid-State Circuits, IEEE Transactions on Device and Materials Reliability, IEEE Transactions on Semiconductor Manufacturing and Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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