D. Louis

420 citations
28 papers · 326 · h-index 11

Impact in

Papers in

D. Louis

26 papers receiving 308 citations

Peers

D. Louis
Comparison fields: 5 of 31
  • Electronic, Optical and Magnetic Materials 108
  • Electrical and Electronic Engineering 298
  • Biomedical Engineering 71
  • Surfaces, Coatings and Films 11
  • Mechanics of Materials 36
Replace R. Carruthers with:
R. Carruthers United States
Yong Kong Siew Belgium
D. Dobuzinsky United States
Trace Hurd United States
T. Standaert United States
Efrain Altamirano Sánchez Belgium
R. Schulz United States
V. Terzieva Belgium
N. Jourdan Belgium
Y. Le Friec France
D. Louis relative to R. Carruthers United States R. Carruthers's profile →
Citations per field
00.5×1.7×
R. Carruthers · 1×
Citations per year

Countries citing papers authored by D. Louis

Since Specialization
Citations

This map shows the geographic impact of D. Louis's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by D. Louis with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites D. Louis more than expected).

Fields of papers citing papers by D. Louis

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by D. Louis. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by D. Louis. The network helps show where D. Louis may publish in the future.

Co-authors

The 25 scholars most cited alongside D. Louis, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with D. Louis Line = papers co-authored together D. Louis links everyone, so they are left out of the graph.

All Works

20 of 20 papers shown

Showing the 20 most-cited of 28 papers — load more, or switch the sort, to bring in the rest.

#Work
1 200346
2 200238
3 200436
4 200624
5 200224
6 200321
7 200220
8 199915
9 199815
10 200215
11 200111
12 20017
13 20037
14 20006
15 19976
16 19975
17 20195
18 20064
19 20034
20 20034

About D. Louis

D. Louis is a scholar working on Electrical and Electronic Engineering, Electronic, Optical and Magnetic Materials, Atomic and Molecular Physics, and Optics, Surfaces, Coatings and Films and Biomedical Engineering, having authored 28 papers that have together received 326 indexed citations. Recurring topics across this work include Semiconductor materials and devices (19 papers), Copper Interconnects and Reliability (16 papers), 3D IC and TSV technologies (7 papers), Integrated Circuits and Semiconductor Failure Analysis (6 papers), Advancements in Semiconductor Devices and Circuit Design (5 papers), Advancements in Photolithography Techniques (5 papers), Advanced Surface Polishing Techniques (3 papers) and Metal and Thin Film Mechanics (2 papers). The work is most often cited by research in Electronic, Optical and Magnetic Materials (108 citations), Electrical and Electronic Engineering (298 citations), Biomedical Engineering (71 citations), Surfaces, Coatings and Films (11 citations) and Mechanics of Materials (36 citations). D. Louis has collaborated with scholars based in France, Switzerland and United States. Frequent co-authors include D. Dutartre, S. Monfray, D.R. Holmes, F. Leverd, J. Farkas, Y. Morand, T. Skotnicki, M. Assous, C. Vizioz and P. Mazoyer. Their work appears in journals such as Microelectronic Engineering, Solid-State Electronics, JOURNAL OF RENEWABLE MATERIALS and Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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