D. Louis
Impact in
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- Copper Interconnects and Reliability
-
- Semiconductor materials and devices
- Advancements in Semiconductor Devices and Circuit Design
- Integrated Circuits and Semiconductor Failure Analysis
- Silicon Carbide Semiconductor Technologies
Papers in
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- Semiconductor materials and devices 19
- 3D IC and TSV technologies 7
- Integrated Circuits and Semiconductor Failure Analysis 6
- Advancements in Semiconductor Devices and Circuit Design 5
- Advancements in Photolithography Techniques 5
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- Copper Interconnects and Reliability 16
- Co-authors
- D. Dutartre (4 shared papers)S. Monfray (4 shared papers)D.R. Holmes (6 shared papers)F. Leverd (4 shared papers)J. Farkas (1 shared paper)Y. Morand (5 shared papers)T. Skotnicki (4 shared papers)M. Assous (6 shared papers)
- Journals
- Microelectronic Engineering (11 papers)Solid-State Electronics (1 paper)JOURNAL OF RENEWABLE MATERIALS (1 paper)Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena (2 papers)
- Partner nations
- FranceSwitzerlandUnited States
In The Last Decade
D. Louis
26 papers receiving 308 citations
Peers
Comparison fields: 5 of 31
- Electronic, Optical and Magnetic Materials 108
- Electrical and Electronic Engineering 298
- Biomedical Engineering 71
- Surfaces, Coatings and Films 11
- Mechanics of Materials 36
Countries citing papers authored by D. Louis
This map shows the geographic impact of D. Louis's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by D. Louis with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites D. Louis more than expected).
Fields of papers citing papers by D. Louis
This network shows the impact of papers produced by D. Louis. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by D. Louis. The network helps show where D. Louis may publish in the future.
Co-authors
The 25 scholars most cited alongside D. Louis, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 28 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 2003 | 46 | |
| 2 | 2002 | 38 | |
| 3 | 2004 | 36 | |
| 4 | 2006 | 24 | |
| 5 | 2002 | 24 | |
| 6 | 2003 | 21 | |
| 7 | 2002 | 20 | |
| 8 | 1999 | 15 | |
| 9 | 1998 | 15 | |
| 10 | 2002 | 15 | |
| 11 | 2001 | 11 | |
| 12 | 2001 | 7 | |
| 13 | 2003 | 7 | |
| 14 | 2000 | 6 | |
| 15 | 1997 | 6 | |
| 16 | 1997 | 5 | |
| 17 | 2019 | 5 | |
| 18 | 2006 | 4 | |
| 19 | 2003 | 4 | |
| 20 | 2003 | 4 |
About D. Louis
D. Louis is a scholar working on Electrical and Electronic Engineering, Electronic, Optical and Magnetic Materials, Atomic and Molecular Physics, and Optics, Surfaces, Coatings and Films and Biomedical Engineering, having authored 28 papers that have together received 326 indexed citations. Recurring topics across this work include Semiconductor materials and devices (19 papers), Copper Interconnects and Reliability (16 papers), 3D IC and TSV technologies (7 papers), Integrated Circuits and Semiconductor Failure Analysis (6 papers), Advancements in Semiconductor Devices and Circuit Design (5 papers), Advancements in Photolithography Techniques (5 papers), Advanced Surface Polishing Techniques (3 papers) and Metal and Thin Film Mechanics (2 papers). The work is most often cited by research in Electronic, Optical and Magnetic Materials (108 citations), Electrical and Electronic Engineering (298 citations), Biomedical Engineering (71 citations), Surfaces, Coatings and Films (11 citations) and Mechanics of Materials (36 citations). D. Louis has collaborated with scholars based in France, Switzerland and United States. Frequent co-authors include D. Dutartre, S. Monfray, D.R. Holmes, F. Leverd, J. Farkas, Y. Morand, T. Skotnicki, M. Assous, C. Vizioz and P. Mazoyer. Their work appears in journals such as Microelectronic Engineering, Solid-State Electronics, JOURNAL OF RENEWABLE MATERIALS and Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.