P. Besson
Impact in
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- Semiconductor materials and devices
- Advancements in Semiconductor Devices and Circuit Design
- Integrated Circuits and Semiconductor Failure Analysis
- Ferroelectric and Negative Capacitance Devices
- Surfaces, Coatings and Films top 10%
Papers in
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- Semiconductor materials and devices 53
- Integrated Circuits and Semiconductor Failure Analysis 20
- Advancements in Semiconductor Devices and Circuit Design 17
- Silicon and Solar Cell Technologies 9
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- Silicon Nanostructures and Photoluminescence 8
- Co-authors
- O. Renault (4 shared papers)F. Martín (8 shared papers)N. Barrett (3 shared papers)J.-F. Damlencourt (2 shared papers)S. Marthon (1 shared paper)D. Blin (1 shared paper)Jean‐Michel Hartmann (13 shared papers)V. Loup (21 shared papers)
In The Last Decade
P. Besson
69 papers receiving 794 citations
Peers
Comparison fields: 5 of 44
- Electrical and Electronic Engineering 748
- Surfaces, Coatings and Films 58
- Materials Chemistry 232
- Atomic and Molecular Physics, and Optics 148
- Electronic, Optical and Magnetic Materials 87
Countries citing papers authored by P. Besson
This map shows the geographic impact of P. Besson's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by P. Besson with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites P. Besson more than expected).
Fields of papers citing papers by P. Besson
This network shows the impact of papers produced by P. Besson. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by P. Besson. The network helps show where P. Besson may publish in the future.
Co-authors
The 25 scholars most cited alongside P. Besson, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 74 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 2002 | 187 | |
| 2 | 2005 | 102 | |
| 3 | 2007 | 40 | |
| 4 | 2003 | 30 | |
| 5 | 2002 | 28 | |
| 6 | 2002 | 24 | |
| 7 | 2004 | 23 | |
| 8 | 2021 | 21 | |
| 9 | 2010 | 20 | |
| 10 | 2004 | 16 | |
| 11 | 2013 | 15 | |
| 12 | 2003 | 15 | |
| 13 | 2006 | 14 | |
| 14 | 2006 | 14 | |
| 15 | 2003 | 13 | |
| 16 | 2015 | 12 | |
| 17 | 2009 | 12 | |
| 18 | 2017 | 12 | |
| 19 | 2016 | 12 | |
| 20 | 2003 | 12 |
About P. Besson
P. Besson is a scholar working on Electrical and Electronic Engineering, Materials Chemistry, Biomedical Engineering, Atomic and Molecular Physics, and Optics and Electronic, Optical and Magnetic Materials, having authored 74 papers that have together received 823 indexed citations. Recurring topics across this work include Semiconductor materials and devices (53 papers), Integrated Circuits and Semiconductor Failure Analysis (20 papers), Advancements in Semiconductor Devices and Circuit Design (17 papers), Semiconductor materials and interfaces (9 papers), Silicon and Solar Cell Technologies (9 papers), Copper Interconnects and Reliability (9 papers), Advanced Surface Polishing Techniques (8 papers) and Silicon Nanostructures and Photoluminescence (8 papers). The work is most often cited by research in Electrical and Electronic Engineering (748 citations), Surfaces, Coatings and Films (58 citations), Materials Chemistry (232 citations), Atomic and Molecular Physics, and Optics (148 citations) and Electronic, Optical and Magnetic Materials (87 citations). P. Besson has collaborated with scholars based in France, Czechia and India. Frequent co-authors include O. Renault, F. Martín, N. Barrett, J.-F. Damlencourt, S. Marthon, D. Blin, Jean‐Michel Hartmann, V. Loup, N. Rochat and S. Deleonibus. Their work appears in journals such as Microelectronic Engineering, Applied Surface Science, Applied Physics Letters, Materials Science and Engineering B and IEEE Electron Device Letters.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.