Bart Onsia
Impact in
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- Semiconductor materials and devices
- Advancements in Semiconductor Devices and Circuit Design
- Ferroelectric and Negative Capacitance Devices
- Integrated Circuits and Semiconductor Failure Analysis
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- Semiconductor materials and interfaces
Papers in
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- Semiconductor materials and devices 16
- Advancements in Semiconductor Devices and Circuit Design 10
- Integrated Circuits and Semiconductor Failure Analysis 4
- Ferroelectric and Negative Capacitance Devices 3
- Silicon and Solar Cell Technologies 2
- Co-authors
- Marc Heyns (20 shared papers)Thierry Conard (12 shared papers)Stefan De Gendt (14 shared papers)Matty Caymax (11 shared papers)Marc Meuris (8 shared papers)Olivier Richard (8 shared papers)Jan Van Steenbergen (7 shared papers)Ivo Teerlinck (5 shared papers)
- Journals
- IEEE Electron Device Letters (2 papers)Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena (10 papers)Spectrochimica Acta Part B Atomic Spectroscopy (1 paper)Applied Physics Letters (1 paper)Journal of Applied Physics (1 paper)
- Partner nations
- BelgiumUnited StatesGermany
In The Last Decade
Bart Onsia
24 papers receiving 386 citations
Peers
Comparison fields: 5 of 25
- Electrical and Electronic Engineering 373
- Atomic and Molecular Physics, and Optics 103
- Materials Chemistry 145
- Surfaces, Coatings and Films 16
- Radiation 12
Countries citing papers authored by Bart Onsia
This map shows the geographic impact of Bart Onsia's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Bart Onsia with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Bart Onsia more than expected).
Fields of papers citing papers by Bart Onsia
This network shows the impact of papers produced by Bart Onsia. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Bart Onsia. The network helps show where Bart Onsia may publish in the future.
Co-authors
The 25 scholars most cited alongside Bart Onsia, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 25 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 2004 | 91 | |
| 2 | 2005 | 89 | |
| 3 | 2005 | 69 | |
| 4 | 2005 | 38 | |
| 5 | 2004 | 30 | |
| 6 | 2006 | 14 | |
| 7 | 2007 | 12 | |
| 8 | 1998 | 9 | |
| 9 | 2003 | 6 | |
| 10 | 2004 | 6 | |
| 11 | 2004 | 4 | |
| 12 | 2005 | 4 | |
| 13 | 2007 | 4 | |
| 14 | 2003 | 4 | |
| 15 | 2003 | 4 | |
| 16 | 2001 | 3 | |
| 17 | 2007 | 3 | |
| 18 | 2004 | 2 | |
| 19 | 2005 | 2 | |
| 20 | 2005 | 2 |
About Bart Onsia
Bart Onsia is a scholar working on Electrical and Electronic Engineering, Biomedical Engineering, Electronic, Optical and Magnetic Materials, Atomic and Molecular Physics, and Optics and Materials Chemistry, having authored 25 papers that have together received 402 indexed citations. Recurring topics across this work include Semiconductor materials and devices (16 papers), Advancements in Semiconductor Devices and Circuit Design (10 papers), Integrated Circuits and Semiconductor Failure Analysis (4 papers), Copper Interconnects and Reliability (4 papers), Ferroelectric and Negative Capacitance Devices (3 papers), Semiconductor materials and interfaces (3 papers), Silicon and Solar Cell Technologies (2 papers) and Electron and X-Ray Spectroscopy Techniques (2 papers). The work is most often cited by research in Electrical and Electronic Engineering (373 citations), Atomic and Molecular Physics, and Optics (103 citations), Materials Chemistry (145 citations), Surfaces, Coatings and Films (16 citations) and Radiation (12 citations). Bart Onsia has collaborated with scholars based in Belgium, United States and Germany. Frequent co-authors include Marc Heyns, Thierry Conard, Stefan De Gendt, Matty Caymax, Marc Meuris, Olivier Richard, Jan Van Steenbergen, Ivo Teerlinck, Chao Zhao and Bert Brijs. Their work appears in journals such as IEEE Electron Device Letters, Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena, Spectrochimica Acta Part B Atomic Spectroscopy, Applied Physics Letters and Journal of Applied Physics.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.