Wilfried Vandervorst

13.5k citations
650 papers · 10.5k · h-index 47

Impact in

Papers in

Wilfried Vandervorst

636 papers receiving 10.2k citations

Peers

Wilfried Vandervorst
Comparison fields: 5 of 102
  • Electrical and Electronic Engineering 8.2k
  • Atomic and Molecular Physics, and Optics 3.4k
  • Materials Chemistry 3.7k
  • Structural Biology 111
  • Metals and Alloys 177
Replace K. N. Tu with:
K. N. Tu United States
Silvija Gradečak United States
Jong‐Lam Lee South Korea
H. Bender Belgium
Paul S. Ho United States
W. M. M. Kessels Netherlands
Kirill I. Bolotin Germany
Dougal G. McCulloch Australia
Christian Elsässer Germany
Dawn A. Bonnell United States
Wilfried Vandervorst relative to K. N. Tu United States K. N. Tu's profile →
Citations per field
00.5×4.2×
K. N. Tu · 1×
Citations per year

Countries citing papers authored by Wilfried Vandervorst

Since Specialization
Citations

This map shows the geographic impact of Wilfried Vandervorst's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Wilfried Vandervorst with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Wilfried Vandervorst more than expected).

Fields of papers citing papers by Wilfried Vandervorst

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Wilfried Vandervorst. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Wilfried Vandervorst. The network helps show where Wilfried Vandervorst may publish in the future.

Co-authors

The 25 scholars most cited alongside Wilfried Vandervorst, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with Wilfried Vandervorst Line = papers co-authored together Wilfried Vandervorst links everyone, so they are left out of the graph.

All Works

20 of 20 papers shown

Showing the 20 most-cited of 650 papers — load more, or switch the sort, to bring in the rest.

#Work
1 2004289
2 2014287
3 2002241
4 2002205
5 2015163
6 2011161
7 2000153
8 2004128
9 2014117
10 2005115
11 2009107
12 2013107
13 200696
14 200290
15 201389
16 201288
17 200583
18 199981
19 200681
20 200079

About Wilfried Vandervorst

Wilfried Vandervorst is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics, Biomedical Engineering, Materials Chemistry and Computational Mechanics, having authored 650 papers that have together received 10.5k indexed citations. Recurring topics across this work include Semiconductor materials and devices (261 papers), Integrated Circuits and Semiconductor Failure Analysis (242 papers), Force Microscopy Techniques and Applications (124 papers), Ion-surface interactions and analysis (121 papers), Silicon and Solar Cell Technologies (111 papers), Advancements in Semiconductor Devices and Circuit Design (103 papers), Semiconductor materials and interfaces (76 papers) and Advanced Materials Characterization Techniques (59 papers). The work is most often cited by research in Electrical and Electronic Engineering (8.2k citations), Atomic and Molecular Physics, and Optics (3.4k citations), Materials Chemistry (3.7k citations), Structural Biology (111 citations) and Metals and Alloys (177 citations). Wilfried Vandervorst has collaborated with scholars based in Belgium, United States and Netherlands. Frequent co-authors include H. Bender, Trudo Clarysse, Matty Caymax, Thomas Hantschel, Riikka L. Puurunen, Umberto Celano, Marc Heyns, Roger Loo, Olivier Richard and Thierry Conard. Their work appears in journals such as Journal of Applied Physics, Applied Physics Letters, Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms, Microelectronic Engineering and Applied Surface Science.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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