Wilfried Vandervorst

13.5k citations
663 papers · 11.1k · h-index 49

Impact in

Papers in

Wilfried Vandervorst

646 papers receiving 10.7k citations

Peers

Wilfried Vandervorst
Comparison fields: 5 of 102
  • Electrical and Electronic Engineering 8.6k
  • Atomic and Molecular Physics, and Optics 3.7k
  • Structural Biology 120
  • Materials Chemistry 3.8k
  • Metals and Alloys 189
Replace K. N. Tu with:
K. N. Tu United States
Silvija Gradečak United States
Paul S. Ho United States
H. Bender Belgium
W. M. M. Kessels Netherlands
Jong‐Lam Lee South Korea
Kirill I. Bolotin Germany
Dougal G. McCulloch Australia
Christian Elsässer Germany
Dawn A. Bonnell United States
Wilfried Vandervorst relative to K. N. Tu United States K. N. Tu's profile →
Citations per field
00.5×4.5×
K. N. Tu · 1×
Citations per year

Countries citing papers authored by Wilfried Vandervorst

Since Specialization
Citations

This map shows the geographic impact of Wilfried Vandervorst's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Wilfried Vandervorst with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Wilfried Vandervorst more than expected).

Fields of papers citing papers by Wilfried Vandervorst

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Wilfried Vandervorst. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Wilfried Vandervorst. The network helps show where Wilfried Vandervorst may publish in the future.

Co-authors

The 25 scholars most cited alongside Wilfried Vandervorst, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with Wilfried Vandervorst Line = papers co-authored together Wilfried Vandervorst links everyone, so they are left out of the graph.

All Works

20 of 20 papers shown

Showing the 20 most-cited of 663 papers — load more, or switch the sort, to bring in the rest.

#Work
1 2014298
2 2004292
3 2002251
4 2002211
5 2015170
6 2011169
7 2000168
8 2004133
9 2014127
10 2005120
11 2009111
12 2013109
13 200299
14 200698
15 201394
16 201293
17 200589
18 200089
19 200684
20 199982

About Wilfried Vandervorst

Wilfried Vandervorst is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics, Biomedical Engineering, Materials Chemistry and Computational Mechanics, having authored 663 papers that have together received 11.1k indexed citations. Recurring topics across this work include Semiconductor materials and devices (268 papers), Integrated Circuits and Semiconductor Failure Analysis (247 papers), Force Microscopy Techniques and Applications (128 papers), Ion-surface interactions and analysis (125 papers), Silicon and Solar Cell Technologies (117 papers), Advancements in Semiconductor Devices and Circuit Design (106 papers), Semiconductor materials and interfaces (78 papers) and Advanced Materials Characterization Techniques (59 papers). The work is most often cited by research in Electrical and Electronic Engineering (8.6k citations), Atomic and Molecular Physics, and Optics (3.7k citations), Structural Biology (120 citations), Materials Chemistry (3.8k citations) and Metals and Alloys (189 citations). Wilfried Vandervorst has collaborated with scholars based in Belgium, United States and Netherlands. Frequent co-authors include Trudo Clarysse, H. Bender, Matty Caymax, Thomas Hantschel, Umberto Celano, Riikka L. Puurunen, Marc Heyns, Pierre Eyben, Olivier Richard and Roger Loo. Their work appears in journals such as Journal of Applied Physics, Applied Physics Letters, Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms, Microelectronic Engineering and Applied Surface Science.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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