Rita Vos
Impact in
- Surfaces, Coatings and Films top 10%
- Biomedical Engineering top 10%
- Advanced Surface Polishing Techniques
- Nanowire Synthesis and Applications
- Biosensors and Analytical Detection
Papers in
-
- Semiconductor materials and devices 34
- Advancements in Semiconductor Devices and Circuit Design 14
- Integrated Circuits and Semiconductor Failure Analysis 12
- Silicon and Solar Cell Technologies 10
- Molecular Junctions and Nanostructures 7
-
- Advanced Surface Polishing Techniques 8
- Nanowire Synthesis and Applications 7
- Co-authors
- Paul Mertens (51 shared papers)Guy Vereecke (18 shared papers)Marc Heyns (34 shared papers)Wim Fyen (11 shared papers)Kai Xu (8 shared papers)Marcel Lux (16 shared papers)Thierry Conard (15 shared papers)P. Mertens (6 shared papers)
- Journals
- Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena (28 papers)Journal of The Electrochemical Society (3 papers)Surfaces and Interfaces (2 papers)Microelectronic Engineering (2 papers)Plasma Processes and Polymers (2 papers)
- Partner nations
- BelgiumUnited StatesNetherlands
In The Last Decade
Rita Vos
86 papers receiving 670 citations
Peers
Comparison fields: 5 of 67
- Surfaces, Coatings and Films 57
- Biomedical Engineering 323
- Electrical and Electronic Engineering 418
- Bioengineering 39
- Materials Chemistry 176
Countries citing papers authored by Rita Vos
This map shows the geographic impact of Rita Vos's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Rita Vos with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Rita Vos more than expected).
Fields of papers citing papers by Rita Vos
This network shows the impact of papers produced by Rita Vos. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Rita Vos. The network helps show where Rita Vos may publish in the future.
Co-authors
The 25 scholars most cited alongside Rita Vos, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 92 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 2018 | 51 | |
| 2 | 2005 | 47 | |
| 3 | 2004 | 42 | |
| 4 | 2018 | 41 | |
| 5 | 1999 | 38 | |
| 6 | 2001 | 29 | |
| 7 | 2005 | 27 | |
| 8 | 2017 | 23 | |
| 9 | 2020 | 22 | |
| 10 | 1998 | 21 | |
| 11 | 2014 | 21 | |
| 12 | 2003 | 20 | |
| 13 | 2017 | 16 | |
| 14 | 2016 | 15 | |
| 15 | First demonstration of strained Ge-in-STI IFQW pFETs featuring raised SiGe75% S/D, replacement metal gate and germanided local interconnects | 2013 | 13 |
| 16 | 2019 | 12 | |
| 17 | 2007 | 11 | |
| 18 | 2003 | 11 | |
| 19 | 2020 | 10 | |
| 20 | 2007 | 10 |
About Rita Vos
Rita Vos is a scholar working on Electrical and Electronic Engineering, Biomedical Engineering, Materials Chemistry, Computational Mechanics and Surfaces, Coatings and Films, having authored 92 papers that have together received 705 indexed citations. Recurring topics across this work include Semiconductor materials and devices (34 papers), Advancements in Semiconductor Devices and Circuit Design (14 papers), Integrated Circuits and Semiconductor Failure Analysis (12 papers), Silicon and Solar Cell Technologies (10 papers), Advanced Surface Polishing Techniques (8 papers), Ion-surface interactions and analysis (7 papers), Nanowire Synthesis and Applications (7 papers) and Molecular Junctions and Nanostructures (7 papers). The work is most often cited by research in Surfaces, Coatings and Films (57 citations), Biomedical Engineering (323 citations), Electrical and Electronic Engineering (418 citations), Bioengineering (39 citations) and Materials Chemistry (176 citations). Rita Vos has collaborated with scholars based in Belgium, United States and Netherlands. Frequent co-authors include Paul Mertens, Guy Vereecke, Marc Heyns, Wim Fyen, Kai Xu, Marcel Lux, Thierry Conard, P. Mertens, M. M. Heyns and Jan Fransaer. Their work appears in journals such as Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena, Journal of The Electrochemical Society, Surfaces and Interfaces, Microelectronic Engineering and Plasma Processes and Polymers.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.