Marcel Lux
Impact in
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- Copper Interconnects and Reliability
Papers in
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- Semiconductor materials and devices 22
- Advancements in Photolithography Techniques 6
- Integrated Circuits and Semiconductor Failure Analysis 4
- Silicon and Solar Cell Technologies 3
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- Copper Interconnects and Reliability 17
- Co-authors
- Guy Vereecke (24 shared papers)Martin Klußmann (2 shared papers)Paul Mertens (19 shared papers)Rita Vos (16 shared papers)Quoc Toan Le (18 shared papers)Thierry Conard (6 shared papers)Marius Peters (1 shared paper)Laurent Maron (1 shared paper)
- Journals
- Microelectronic Engineering (4 papers)Journal of The Electrochemical Society (2 papers)Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena (13 papers)Thin Solid Films (1 paper)Organic Letters (1 paper)
- Partner nations
- BelgiumUnited StatesGermany
In The Last Decade
Marcel Lux
38 papers receiving 420 citations
Peers
Comparison fields: 5 of 47
- Surfaces, Coatings and Films 33
- Electronic, Optical and Magnetic Materials 76
- Electrical and Electronic Engineering 224
- Inorganic Chemistry 53
- Organic Chemistry 105
Countries citing papers authored by Marcel Lux
This map shows the geographic impact of Marcel Lux's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Marcel Lux with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Marcel Lux more than expected).
Fields of papers citing papers by Marcel Lux
This network shows the impact of papers produced by Marcel Lux. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Marcel Lux. The network helps show where Marcel Lux may publish in the future.
Co-authors
The 25 scholars most cited alongside Marcel Lux, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 41 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 2015 | 65 | |
| 2 | 2017 | 39 | |
| 3 | 2005 | 38 | |
| 4 | 2001 | 35 | |
| 5 | 2020 | 30 | |
| 6 | 2008 | 29 | |
| 7 | 1998 | 24 | |
| 8 | 2003 | 20 | |
| 9 | 2019 | 15 | |
| 10 | 2008 | 13 | |
| 11 | 2007 | 12 | |
| 12 | 2007 | 10 | |
| 13 | 2008 | 10 | |
| 14 | 2008 | 10 | |
| 15 | 2003 | 10 | |
| 16 | 2009 | 9 | |
| 17 | 2017 | 7 | |
| 18 | 2009 | 6 | |
| 19 | 2001 | 5 | |
| 20 | The IMEC Clean: implementation in advanced CMOS manufacturing | 2000 | 5 |
About Marcel Lux
Marcel Lux is a scholar working on Electrical and Electronic Engineering, Electronic, Optical and Magnetic Materials, Biomedical Engineering, Materials Chemistry and Mechanics of Materials, having authored 41 papers that have together received 441 indexed citations. Recurring topics across this work include Semiconductor materials and devices (22 papers), Copper Interconnects and Reliability (17 papers), Advancements in Photolithography Techniques (6 papers), Integrated Circuits and Semiconductor Failure Analysis (4 papers), Advanced Surface Polishing Techniques (4 papers), Metal and Thin Film Mechanics (3 papers), Silicon and Solar Cell Technologies (3 papers) and Recycling and Waste Management Techniques (2 papers). The work is most often cited by research in Surfaces, Coatings and Films (33 citations), Electronic, Optical and Magnetic Materials (76 citations), Electrical and Electronic Engineering (224 citations), Inorganic Chemistry (53 citations) and Organic Chemistry (105 citations). Marcel Lux has collaborated with scholars based in Belgium, United States and Germany. Frequent co-authors include Guy Vereecke, Martin Klußmann, Paul Mertens, Rita Vos, Quoc Toan Le, Thierry Conard, Marius Peters, Laurent Maron, Hassan Osseili and Marc Heyns. Their work appears in journals such as Microelectronic Engineering, Journal of The Electrochemical Society, Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena, Thin Solid Films and Organic Letters.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.