Guy Vereecke
Impact in
- Surfaces, Coatings and Films top 2%
- Surface Modification and Superhydrophobicity
- Electron and X-Ray Spectroscopy Techniques
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- Semiconductor materials and devices
- Integrated Circuits and Semiconductor Failure Analysis
Papers in
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- Semiconductor materials and devices 47
- Integrated Circuits and Semiconductor Failure Analysis 12
- Advancements in Photolithography Techniques 11
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- Copper Interconnects and Reliability 36
- Co-authors
- J. Lemaı̂tre (1 shared paper)Marc Heyns (21 shared papers)E. Röhr (2 shared papers)Paul Mertens (23 shared papers)Frank Holsteyns (27 shared papers)Marcel Lux (23 shared papers)Quoc Toan Le (21 shared papers)Rita Vos (18 shared papers)
- Journals
- Microelectronic Engineering (9 papers)Journal of The Electrochemical Society (7 papers)Surface and Interface Analysis (4 papers)Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena (28 papers)Applied Physics Letters (3 papers)
- Partner nations
- BelgiumUnited StatesGermany
In The Last Decade
Guy Vereecke
97 papers receiving 1.2k citations
Peers
Comparison fields: 5 of 84
- Surfaces, Coatings and Films 226
- Electrical and Electronic Engineering 658
- Biomedical Engineering 478
- Computational Mechanics 218
- Electronic, Optical and Magnetic Materials 176
Countries citing papers authored by Guy Vereecke
This map shows the geographic impact of Guy Vereecke's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Guy Vereecke with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Guy Vereecke more than expected).
Fields of papers citing papers by Guy Vereecke
This network shows the impact of papers produced by Guy Vereecke. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Guy Vereecke. The network helps show where Guy Vereecke may publish in the future.
Co-authors
The 25 scholars most cited alongside Guy Vereecke, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 107 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 1990 | 142 | |
| 2 | The IMEC clean : A new concept for particle and metal removal on Si surfaces | 1995 | 100 |
| 3 | 1999 | 87 | |
| 4 | 1993 | 60 | |
| 5 | 2013 | 53 | |
| 6 | 2005 | 47 | |
| 7 | 2011 | 45 | |
| 8 | 2004 | 42 | |
| 9 | 2017 | 29 | |
| 10 | 2005 | 27 | |
| 11 | 2008 | 27 | |
| 12 | 2018 | 24 | |
| 13 | 2011 | 24 | |
| 14 | 1998 | 23 | |
| 15 | 1993 | 22 | |
| 16 | 2000 | 20 | |
| 17 | 2003 | 20 | |
| 18 | 2014 | 18 | |
| 19 | 2018 | 17 | |
| 20 | 2004 | 16 |
About Guy Vereecke
Guy Vereecke is a scholar working on Electrical and Electronic Engineering, Electronic, Optical and Magnetic Materials, Biomedical Engineering, Computational Mechanics and Surfaces, Coatings and Films, having authored 107 papers that have together received 1.3k indexed citations. Recurring topics across this work include Semiconductor materials and devices (47 papers), Copper Interconnects and Reliability (36 papers), Advanced Surface Polishing Techniques (13 papers), Surface Modification and Superhydrophobicity (12 papers), Integrated Circuits and Semiconductor Failure Analysis (12 papers), Advancements in Photolithography Techniques (11 papers), Ion-surface interactions and analysis (10 papers) and Metal and Thin Film Mechanics (9 papers). The work is most often cited by research in Surfaces, Coatings and Films (226 citations), Electrical and Electronic Engineering (658 citations), Biomedical Engineering (478 citations), Computational Mechanics (218 citations) and Electronic, Optical and Magnetic Materials (176 citations). Guy Vereecke has collaborated with scholars based in Belgium, United States and Germany. Frequent co-authors include J. Lemaı̂tre, Marc Heyns, E. Röhr, Paul Mertens, Frank Holsteyns, Marcel Lux, Quoc Toan Le, Rita Vos, XiuMei Xu and Lu‐Tao Weng. Their work appears in journals such as Microelectronic Engineering, Journal of The Electrochemical Society, Surface and Interface Analysis, Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena and Applied Physics Letters.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.