B. Kaczer
Impact in
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- Semiconductor materials and devices
- Integrated Circuits and Semiconductor Failure Analysis
- Advancements in Semiconductor Devices and Circuit Design
- Silicon Carbide Semiconductor Technologies
- Ferroelectric and Negative Capacitance Devices
Papers in
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- Integrated Circuits and Semiconductor Failure Analysis 16
- Semiconductor materials and devices 16
- Advancements in Semiconductor Devices and Circuit Design 11
- Ferroelectric and Negative Capacitance Devices 3
- Silicon Carbide Semiconductor Technologies 2
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- Semiconductor materials and interfaces 4
- Force Microscopy Techniques and Applications 4
- Co-authors
- J. P. Pelz (8 shared papers)G. Groeseneken (11 shared papers)W. J. Choyke (4 shared papers)Zhiguo Meng (1 shared paper)R. Degraeve (2 shared papers)Nadine Collaert (1 shared paper)M. W. Goodwin (1 shared paper)В. И. Архипов (1 shared paper)
- Journals
- Microelectronics Reliability (5 papers)Applied Physics Letters (4 papers)Physical review. B, Condensed matter (1 paper)Journal of Electronic Materials (1 paper)IEEE Electron Device Letters (1 paper)
- Partner nations
- BelgiumUnited StatesAustria
In The Last Decade
B. Kaczer
23 papers receiving 372 citations
Peers
Comparison fields: 5 of 30
- Structural Biology 12
- Electrical and Electronic Engineering 373
- Atomic and Molecular Physics, and Optics 140
- Surfaces, Coatings and Films 14
- Hardware and Architecture 13
Countries citing papers authored by B. Kaczer
This map shows the geographic impact of B. Kaczer's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by B. Kaczer with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites B. Kaczer more than expected).
Fields of papers citing papers by B. Kaczer
This network shows the impact of papers produced by B. Kaczer. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by B. Kaczer. The network helps show where B. Kaczer may publish in the future.
Co-authors
The 25 scholars most cited alongside B. Kaczer, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 23 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 2005 | 48 | |
| 2 | 2008 | 48 | |
| 3 | 1996 | 45 | |
| 4 | 1996 | 41 | |
| 5 | 1998 | 36 | |
| 6 | 2001 | 30 | |
| 7 | 2010 | 29 | |
| 8 | 1998 | 28 | |
| 9 | 2012 | 19 | |
| 10 | 1998 | 14 | |
| 11 | 1998 | 9 | |
| 12 | 2009 | 8 | |
| 13 | 2006 | 8 | |
| 14 | 1998 | 7 | |
| 15 | 2010 | 7 | |
| 16 | 2012 | 6 | |
| 17 | 1998 | 3 | |
| 18 | 2024 | 3 | |
| 19 | 2013 | 3 | |
| 20 | 2014 | 2 |
About B. Kaczer
B. Kaczer is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics, Structural Biology, Surfaces, Coatings and Films and Electronic, Optical and Magnetic Materials, having authored 23 papers that have together received 397 indexed citations. Recurring topics across this work include Integrated Circuits and Semiconductor Failure Analysis (16 papers), Semiconductor materials and devices (16 papers), Advancements in Semiconductor Devices and Circuit Design (11 papers), Advanced Electron Microscopy Techniques and Applications (4 papers), Semiconductor materials and interfaces (4 papers), Force Microscopy Techniques and Applications (4 papers), Ferroelectric and Negative Capacitance Devices (3 papers) and Silicon Carbide Semiconductor Technologies (2 papers). The work is most often cited by research in Structural Biology (12 citations), Electrical and Electronic Engineering (373 citations), Atomic and Molecular Physics, and Optics (140 citations), Surfaces, Coatings and Films (14 citations) and Hardware and Architecture (13 citations). B. Kaczer has collaborated with scholars based in Belgium, United States and Austria. Frequent co-authors include J. P. Pelz, G. Groeseneken, W. J. Choyke, Zhiguo Meng, R. Degraeve, Nadine Collaert, M. W. Goodwin, В. И. Архипов, Jianjun Chen and M. Nafrı́a. Their work appears in journals such as Microelectronics Reliability, Applied Physics Letters, Physical review. B, Condensed matter, Journal of Electronic Materials and IEEE Electron Device Letters.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.