Nicolas Daval

868 citations
51 papers · 481 · h-index 11

Impact in

  • Electrical and Electronic Engineering top 10%
    • Semiconductor materials and devices
    • Advancements in Semiconductor Devices and Circuit Design
    • Integrated Circuits and Semiconductor Failure Analysis
    • Silicon Carbide Semiconductor Technologies
    • Ferroelectric and Negative Capacitance Devices
    • Photonic and Optical Devices
  • Atomic and Molecular Physics, and Optics
    • Semiconductor Quantum Structures and Devices

Papers in

  • Electrical and Electronic Engineering 50
    • Advancements in Semiconductor Devices and Circuit Design 38
    • Semiconductor materials and devices 37
    • Integrated Circuits and Semiconductor Failure Analysis 18
    • Silicon and Solar Cell Technologies 9
    • Thin-Film Transistor Technologies 6
    • Silicon Carbide Semiconductor Technologies 4
  • Biomedical Engineering 10
    • Nanowire Synthesis and Applications 9
Co-authors
Bich-Yen Nguyen (19 shared papers)K.K. Bourdelle (10 shared papers)D. Delprat (7 shared papers)Asen Asenov (3 shared papers)A. R. Brown (2 shared papers)F. Andrieu (2 shared papers)J. M. Fastenau (10 shared papers)D. Lubyshev (9 shared papers)
Journals
IEEE Transactions on Electron Devices (3 papers)Microelectronic Engineering (2 papers)Journal of Applied Physics (2 papers)Solid-State Electronics (2 papers)ECS Transactions (10 papers)
Partner nations
FranceUnited StatesSingapore

In The Last Decade

Nicolas Daval

49 papers receiving 458 citations

Peers

Nicolas Daval
Comparison fields: 5 of 28
  • Electrical and Electronic Engineering 467
  • Atomic and Molecular Physics, and Optics 79
  • Biomedical Engineering 99
  • Structural Biology 3
  • Condensed Matter Physics 14
Replace J. Sandford with:
J. Sandford United States
P. Charvát United States
C. Kerner Belgium
Hiroaki Arimura Belgium
H. van Meer Belgium
F. Andrieu France
H. Enichlmair Austria
Reza Arghavani United States
Elvedin Memišević Sweden
J.T. Clemens United States
Nicolas Daval relative to J. Sandford United States J. Sandford's profile →
Citations per field
00.5×1.5×2×2.3×
J. Sandford · 1×
Citations per year

Countries citing papers authored by Nicolas Daval

Since Specialization
Citations

This map shows the geographic impact of Nicolas Daval's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Nicolas Daval with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Nicolas Daval more than expected).

Fields of papers citing papers by Nicolas Daval

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Nicolas Daval. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Nicolas Daval. The network helps show where Nicolas Daval may publish in the future.

Co-authors

The 25 scholars most cited alongside Nicolas Daval, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with Nicolas Daval Line = papers co-authored together Nicolas Daval links everyone, so they are left out of the graph.

All Works

20 of 20 papers shown

Showing the 20 most-cited of 51 papers — load more, or switch the sort, to bring in the rest.

#Work
1
High immunity to threshold voltage variability in undoped ultra-thin FDSOI MOSFETs and its physical understanding
O. Weber, O. Faynot, F. Andrieu, C. Buj-Dufournet, F. Allain, P. Scheiblin, J. Foucher, Nicolas Daval, D. Lafond, L. Tosti, L. Brévard, O. Rozeau, C. Fenouillet-Béranger, M. Marin, (unknown), D. Delprat, K.K. Bourdelle, Bich-Yen Nguyen, S. Deleonibus
2008119
2
Monolithic integration of InP-based transistors on Si substrates using MBE
Journal of Crystal Growth ·W.K. Liu, D. Lubyshev, J. M. Fastenau, Ying Wu, Mayank T. Bulsara, Eugene A. Fitzgerald, Miguel Urteaga, W. Ha, J. Bergman, B. Brar, W. E. Hoke, J. R. LaRoche, K.J. Herrick, T.E. Kazior, David Clark, D. A. Smith, R. Thompson, Charlotte Drazek, Nicolas Daval
200855
3
Comparative Simulation Analysis of Process-Induced Variability in Nanoscale SOI and Bulk Trigate FinFETs
IEEE Transactions on Electron Devices ·A. R. Brown, Nicolas Daval, K.K. Bourdelle, Bich-Yen Nguyen, Asen Asenov
201335
4
A high performance differential amplifier through the direct monolithic integration of InP HBTs and Si CMOS on silicon substrates
T.E. Kazior, J. R. LaRoche, D. Lubyshev, J. M. Fastenau, W. K. Liu, Miguel Urteaga, W. Ha, J. Bergman, M. J. Choe, Mayank T. Bulsara, Eugene A. Fitzgerald, D. A. Smith, David Clark, R. Thompson, Charlotte Drazek, Nicolas Daval, L. Benaissa, E. Augendre
200935
5
High-Performance Germanium $\Omega$ -Gate MuGFET With Schottky-Barrier Nickel Germanide Source/Drain and Low-Temperature Disilane-Passivated Gate Stack
IEEE Electron Device Letters ·Bin Liu, Xiao Gong, Genquan Han, Phyllis Shi Ya Lim, Yi Tong, Qian Zhou, Yue Yang, Nicolas Daval, Christelle Veytizou, D. Delprat, Bich-Yen Nguyen, Yee‐Chia Yeo
201219
6
Germanium Multiple-Gate Field-Effect Transistors Formed on Germanium-on-Insulator Substrate
IEEE Transactions on Electron Devices ·Bin Liu, Xiao Gong, Chunlei Zhan, Genquan Han, Hock-Chun Chin, Moh-Lung Ling, Jie Li, Yongdong Liu, Jiangtao Hu, Nicolas Daval, Christelle Veytizou, D. Delprat, Bich-Yen Nguyen, Yee‐Chia Yeo
201316
7
Atomic Scale Thickness Control of SOI Wafers for Fully Depleted Applications
ECS Transactions ·W. Schwarzenbach, Nicolas Daval, Vincent Barec, Olivier Bonnin, Pablo Acosta-Alba, C. Maddalon, Alexandre Chibko, Timothy Robson, Bich-Yen Nguyen, Christophe Maleville
201315
8
Germanium Multiple-Gate Field-Effect Transistor With In Situ Boron-Doped Raised Source/Drain
IEEE Transactions on Electron Devices ·Bin Liu, Chunlei Zhan, Yue Yang, Ran Cheng, Pengfei Guo, Qian Zhou, Eugene Yu-Jin Kong, Nicolas Daval, Christelle Veytizou, D. Delprat, Bich-Yen Nguyen, Yee‐Chia Yeo
201315
9
Monolithic III-V/Si Integration
ECS Transactions ·Eugene A. Fitzgerald, M. T. Bulsara, Y. Bai, C. Cheng, W. K. Liu, D. Lubyshev, J. M. Fastenau, Y. Wu, M. Urtega, W. Ha, J. Bergman, B. Briar, C. Drazek, Nicolas Daval, F. Letertre, W. E. Hoke, J. R. LaRoche, K. J. Herrick, T. E. Kazior
200911
10
New opportunities for SiGe and Ge channel p-FETs
Microelectronic Engineering ·Stephen W. Bedell, Nicolas Daval, A. Khakifirooz, P. Kulkarni, Keith Fogel, A. Domenicucci, D. K. Sadana
201011
11
Advanced FD-SOI and Beyond Low Temperature SmartCut™ Enables High Density 3-D SoC Applications
IEEE Journal of the Electron Devices Society ·W. Schwarzenbach, Nicolas Daval, Christophe Maleville, B.-Y. Nguyen, Ludovic Ecarnot, S. Loubriat, M. Detard, Enrica Cela, C. Bertrand-Giuliani, G. Chabanne, C. Maddalon
201911
12
Opportunities and Challenges for Germanium and Silicon-Germanium Channel p-FETs
ECS Transactions ·Stephen W. Bedell, Nicolas Daval, Keith Fogel, Ken Shimizu, J. A. Ott, J. Newbury, D. K. Sadana
200910
13
Ultra-Thin Film SOI/BOX Substrate Development, Its Application and Readiness
ECS Transactions ·W. Schwarzenbach, Xavier Cauchy, Olivier Bonnin, Nicolas Daval, C. Aulnette, C. Girard, Bich-Yen Nguyen, Christophe Maleville
201110
14
Asymetrically strained high performance Germanium gate-all-around nanowire p-FETs featuring 3.5 nm wire width and contractible phase change liner stressor (Ge<inf>2</inf>Sb<inf>2</inf>Te<inf>5</inf>)
National University of Singapore ·Ran Cheng, Bin Liu, Pengfei Guo, Yue Yang, Qian Zhou, Xiao Gong, Yuan Dong, Yi Tong, K.K. Bourdelle, Nicolas Daval, D. Delprat, Bich-Yen Nguyen, E. Augendre, Yee‐Chia Yeo
201310
15
Stress Metrology : The challenge for the next generation of engineered wafers
MRS Proceedings ·Antoine Tiberj, Vincent Paillard, C. Aulnette, Nicolas Daval, K.K. Bourdelle, Myriam Moreau, M. Kennard, Ian Cayrefourcq
20049
16
Monolithic III-V/Si Integration
ECS Transactions ·Eugene A. Fitzgerald, Mayank T. Bulsara, Yaoting Bai, Chih‐Wei Cheng, W. K. Liu, D. Lubyshev, J. M. Fastenau, Yang Wu, M. Urtega, Hao Wang, J. P. Bergman, B. Brar, Charlotte Drazek, Nicolas Daval, F. Leterte, W. E. Hoke, J. R. LaRoche, Katherine J. Herrick, T.E. Kazior
20088
17
SiC Power Devices on QUASIC and SiCOI Smart-Cut<sup>®</sup> Substrates: First Demonstrations
Materials science forum ·F. Letertre, François Templier, Nicolas Daval, Edwige Bano, Dominique Planson, L. Di Cioccio, E. Jalaguier, Jean‐Marie Bluet, T. Billon, R. Madar, Jean-Pierre Chante
20037
18
Strained silicon on insulator substrates for fully depleted application
W. Schwarzenbach, Nicolas Daval, S. Kerdilès, G. Chabanne, Christophe Figuet, S. Guerroudj, Olivier Bonnin, Xavier Cauchy, B.-Y. Nguyen, Christophe Maleville
20126
19
High Sensitivity Surface Defect Inspection of SiC and SmartSiC<sup>TM</sup> Substrates Using a DUV Laser-Based System
Defect and diffusion forum/Diffusion and defect data, solid state data. Part A, Defect and diffusion forum ·Enrica Cela, Sam Shahidi, Prasant Parangi, Ramesh Shrestha, Gavin Simpson, J. Widiez, Nicolas Daval, Audrey Chapelle, Séverin Rouchier, W. Schwarzenbach
20235
20
Modeling and direct extraction of band offset induced by stress engineering in silicon-on-insulator metal-oxide-semiconductor field effect transistors: Implications for device reliability
Journal of Applied Physics ·X. Garros, F. Rochette, F. Andrieu, S. Baudot, G. Reimbold, C. Aulnette, Nicolas Daval, F. Boulanger
20095

About Nicolas Daval

Nicolas Daval is a scholar working on Electrical and Electronic Engineering, Biomedical Engineering, Atomic and Molecular Physics, and Optics, Artificial Intelligence and Computational Theory and Mathematics, having authored 51 papers that have together received 481 indexed citations. Recurring topics across this work include Advancements in Semiconductor Devices and Circuit Design (38 papers), Semiconductor materials and devices (37 papers), Integrated Circuits and Semiconductor Failure Analysis (18 papers), Nanowire Synthesis and Applications (9 papers), Silicon and Solar Cell Technologies (9 papers), Thin-Film Transistor Technologies (6 papers), Silicon Carbide Semiconductor Technologies (4 papers) and Semiconductor materials and interfaces (4 papers). The work is most often cited by research in Electrical and Electronic Engineering (467 citations), Atomic and Molecular Physics, and Optics (79 citations), Biomedical Engineering (99 citations), Structural Biology (3 citations) and Condensed Matter Physics (14 citations). Nicolas Daval has collaborated with scholars based in France, United States and Singapore. Frequent co-authors include Bich-Yen Nguyen, K.K. Bourdelle, D. Delprat, Asen Asenov, A. R. Brown, F. Andrieu, J. M. Fastenau, D. Lubyshev, F. Allain and Eugene A. Fitzgerald. Their work appears in journals such as IEEE Transactions on Electron Devices, Microelectronic Engineering, Journal of Applied Physics, Solid-State Electronics and ECS Transactions.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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