S. List
Impact in
- Surfaces, Coatings and Films top 10%
- Electron and X-Ray Spectroscopy Techniques
Papers in
-
- Semiconductor materials and devices 8
- Integrated Circuits and Semiconductor Failure Analysis 7
- Silicon and Solar Cell Technologies 6
- Advancements in Photolithography Techniques 3
- Advancements in Semiconductor Devices and Circuit Design 3
- Electromagnetic Compatibility and Noise Suppression 3
-
- Semiconductor materials and interfaces 4
- Co-authors
- R. Joseph Kline (2 shared papers)John S. Villarrubia (2 shared papers)H. Ryssel (3 shared papers)Daniel F. Sunday (1 shared paper)Dan Jiao (3 shared papers)M. Kobrinsky (3 shared papers)András Vládar (2 shared papers)J. S. Chawla (2 shared papers)
- Journals
- Journal of Applied Physics (3 papers)Microelectronic Engineering (2 papers)Applied Physics Letters (2 papers)Journal of Instrumentation (1 paper)IEEE Electron Device Letters (1 paper)
- Partner nations
- United StatesBelgiumGermany
In The Last Decade
S. List
21 papers receiving 336 citations
Peers
Comparison fields: 5 of 50
- Surfaces, Coatings and Films 71
- Structural Biology 10
- Electrical and Electronic Engineering 277
- Electronic, Optical and Magnetic Materials 83
- Atomic and Molecular Physics, and Optics 113
Countries citing papers authored by S. List
This map shows the geographic impact of S. List's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by S. List with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites S. List more than expected).
Fields of papers citing papers by S. List
This network shows the impact of papers produced by S. List. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by S. List. The network helps show where S. List may publish in the future.
Co-authors
The 25 scholars most cited alongside S. List, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 22 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 2015 | 84 | |
| 2 | 1998 | 44 | |
| 3 | 2009 | 40 | |
| 4 | 2005 | 33 | |
| 5 | 2006 | 33 | |
| 6 | 2003 | 29 | |
| 7 | 1994 | 18 | |
| 8 | 2003 | 12 | |
| 9 | 1996 | 11 | |
| 10 | 1998 | 7 | |
| 11 | 2007 | 7 | |
| 12 | 2008 | 7 | |
| 13 | 2006 | 5 | |
| 14 | 1998 | 4 | |
| 15 | 2007 | 4 | |
| 16 | 2015 | 4 | |
| 17 | 10 nm Three-Dimensional CD-SEM Metrology | NIST | 2014 | 1 |
| 18 | 2002 | 1 | |
| 19 | 1993 | 1 | |
| 20 | 2002 | 1 |
About S. List
S. List is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics, Electronic, Optical and Magnetic Materials, Biomedical Engineering and Materials Chemistry, having authored 22 papers that have together received 347 indexed citations. Recurring topics across this work include Semiconductor materials and devices (8 papers), Integrated Circuits and Semiconductor Failure Analysis (7 papers), Silicon and Solar Cell Technologies (6 papers), Copper Interconnects and Reliability (6 papers), Semiconductor materials and interfaces (4 papers), Advancements in Photolithography Techniques (3 papers), Advancements in Semiconductor Devices and Circuit Design (3 papers) and Electromagnetic Compatibility and Noise Suppression (3 papers). The work is most often cited by research in Surfaces, Coatings and Films (71 citations), Structural Biology (10 citations), Electrical and Electronic Engineering (277 citations), Electronic, Optical and Magnetic Materials (83 citations) and Atomic and Molecular Physics, and Optics (113 citations). S. List has collaborated with scholars based in United States, Belgium and Germany. Frequent co-authors include R. Joseph Kline, John S. Villarrubia, H. Ryssel, Daniel F. Sunday, Dan Jiao, M. Kobrinsky, András Vládar, J. S. Chawla, Bin Ming and S. Chakravarty. Their work appears in journals such as Journal of Applied Physics, Microelectronic Engineering, Applied Physics Letters, Journal of Instrumentation and IEEE Electron Device Letters.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.