Bin Ming
Impact in
- Structural Biology top 5%
- Advanced Electron Microscopy Techniques and Applications
- Surfaces, Coatings and Films top 5%
- Electron and X-Ray Spectroscopy Techniques
Papers in
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- Advancements in Photolithography Techniques 12
- Integrated Circuits and Semiconductor Failure Analysis 6
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- Electron and X-Ray Spectroscopy Techniques 13
- Co-authors
- András Vládar (17 shared papers)Michael T. Postek (14 shared papers)John S. Villarrubia (6 shared papers)J. S. Chawla (3 shared papers)R. Joseph Kline (2 shared papers)Daniel F. Sunday (1 shared paper)S. List (2 shared papers)Ronald Sabo (2 shared papers)
- Journals
- Measurement Science and Technology (3 papers)IEEE Transactions on Applied Superconductivity (1 paper)MRS Internet Journal of Nitride Semiconductor Research (1 paper)Ultramicroscopy (1 paper)Journal of Micro/Nanolithography MEMS and MOEMS (1 paper)
- Partner nations
- United StatesGermanyEgypt
In The Last Decade
Bin Ming
23 papers receiving 462 citations
Peers
Comparison fields: 5 of 64
- Structural Biology 62
- Surfaces, Coatings and Films 175
- Biomaterials 110
- Electrical and Electronic Engineering 243
- Computational Mechanics 75
Countries citing papers authored by Bin Ming
This map shows the geographic impact of Bin Ming's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Bin Ming with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Bin Ming more than expected).
Fields of papers citing papers by Bin Ming
This network shows the impact of papers produced by Bin Ming. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Bin Ming. The network helps show where Bin Ming may publish in the future.
Co-authors
The 25 scholars most cited alongside Bin Ming, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 24 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 2009 | 98 | |
| 2 | 2010 | 94 | |
| 3 | 2015 | 88 | |
| 4 | 2008 | 36 | |
| 5 | 2010 | 32 | |
| 6 | 2009 | 31 | |
| 7 | 2014 | 25 | |
| 8 | 2015 | 24 | |
| 9 | 2008 | 22 | |
| 10 | 2015 | 11 | |
| 11 | 2000 | 5 | |
| 12 | 2009 | 5 | |
| 13 | 2015 | 4 | |
| 14 | 2008 | 3 | |
| 15 | 1999 | 3 | |
| 16 | Review of Current Progress in Nanometrology with Helium Ions | NIST | 2011 | 2 |
| 17 | 2000 | 2 | |
| 18 | 2009 | 2 | |
| 19 | 2014 | 2 | |
| 20 | 10 nm Three-Dimensional CD-SEM Metrology | NIST | 2014 | 1 |
About Bin Ming
Bin Ming is a scholar working on Electrical and Electronic Engineering, Surfaces, Coatings and Films, Structural Biology, Atomic and Molecular Physics, and Optics and Materials Chemistry, having authored 24 papers that have together received 494 indexed citations. Recurring topics across this work include Electron and X-Ray Spectroscopy Techniques (13 papers), Advancements in Photolithography Techniques (12 papers), Advanced Electron Microscopy Techniques and Applications (6 papers), Integrated Circuits and Semiconductor Failure Analysis (6 papers), Force Microscopy Techniques and Applications (3 papers), Metal and Thin Film Mechanics (2 papers), GaN-based semiconductor devices and materials (2 papers) and Nanoparticles: synthesis and applications (2 papers). The work is most often cited by research in Structural Biology (62 citations), Surfaces, Coatings and Films (175 citations), Biomaterials (110 citations), Electrical and Electronic Engineering (243 citations) and Computational Mechanics (75 citations). Bin Ming has collaborated with scholars based in United States, Germany and Egypt. Frequent co-authors include András Vládar, Michael T. Postek, John S. Villarrubia, J. S. Chawla, R. Joseph Kline, Daniel F. Sunday, S. List, Ronald Sabo, James F. Beecher and Theodore H. Wegner. Their work appears in journals such as Measurement Science and Technology, IEEE Transactions on Applied Superconductivity, MRS Internet Journal of Nitride Semiconductor Research, Ultramicroscopy and Journal of Micro/Nanolithography MEMS and MOEMS.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.