R. Kies

638 citations
22 papers · 339 · h-index 10

Impact in

    • Semiconductor materials and devices
    • Advancements in Semiconductor Devices and Circuit Design
    • Advanced Memory and Neural Computing
    • Integrated Circuits and Semiconductor Failure Analysis
    • Ferroelectric and Negative Capacitance Devices
    • Silicon Carbide Semiconductor Technologies
    • Electronic and Structural Properties of Oxides

Papers in

    • Semiconductor materials and devices 20
    • Advancements in Semiconductor Devices and Circuit Design 14
    • Advanced Memory and Neural Computing 5
    • Thin-Film Transistor Technologies 3
    • Integrated Circuits and Semiconductor Failure Analysis 3
    • Ferroelectric and Negative Capacitance Devices 2
    • Electronic and Structural Properties of Oxides 4
    • Silicon Nanostructures and Photoluminescence 3

R. Kies

21 papers receiving 325 citations

Peers

R. Kies
Comparison fields: 5 of 20
  • Electrical and Electronic Engineering 332
  • Materials Chemistry 86
  • Electronic, Optical and Magnetic Materials 20
  • Atomic and Molecular Physics, and Optics 34
  • Biomedical Engineering 46
Replace S. Mori with:
S. Mori Japan
C. Arvet France
Wei Yip Loh Singapore
Farid Sebaai Belgium
P. O’Neil United States
Hiroaki Arimura Belgium
N. Zamani United States
F.N. Cubaynes Belgium
S.M. Jang Taiwan
Paul Vande Voorde United States
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Citations per field
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Citations per year

Countries citing papers authored by R. Kies

Since Specialization
Citations

This map shows the geographic impact of R. Kies's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by R. Kies with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites R. Kies more than expected).

Fields of papers citing papers by R. Kies

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by R. Kies. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by R. Kies. The network helps show where R. Kies may publish in the future.

Co-authors

The 25 scholars most cited alongside R. Kies, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with R. Kies Line = papers co-authored together R. Kies links everyone, so they are left out of the graph.

All Works

20 of 20 papers shown

Showing the 20 most-cited of 22 papers — load more, or switch the sort, to bring in the rest.

#Work
1 1995108
2 202074
3 200822
4 200922
5 199720
6 199816
7 199914
8 199610
9 202010
10 201210
11
Temperature Dependence of Fowler-Nordheim Emission Tunneling Current in MOS Structures
19945
12 20105
13 19974
14 20114
15 19953
16 20103
17 20133
18 20102
19 19961
20 20221

About R. Kies

R. Kies is a scholar working on Electrical and Electronic Engineering, Materials Chemistry, Electronic, Optical and Magnetic Materials, Surfaces, Coatings and Films and Electrochemistry, having authored 22 papers that have together received 339 indexed citations. Recurring topics across this work include Semiconductor materials and devices (20 papers), Advancements in Semiconductor Devices and Circuit Design (14 papers), Advanced Memory and Neural Computing (5 papers), Electronic and Structural Properties of Oxides (4 papers), Thin-Film Transistor Technologies (3 papers), Integrated Circuits and Semiconductor Failure Analysis (3 papers), Silicon Nanostructures and Photoluminescence (3 papers) and Ferroelectric and Negative Capacitance Devices (2 papers). The work is most often cited by research in Electrical and Electronic Engineering (332 citations), Materials Chemistry (86 citations), Electronic, Optical and Magnetic Materials (20 citations), Atomic and Molecular Physics, and Optics (34 citations) and Biomedical Engineering (46 citations). R. Kies has collaborated with scholars based in France, Italy and Switzerland. Frequent co-authors include G. Pananakakis, G. Ghibaudo, C. Papadas, C. Vizioz, Jean‐Michel Hartmann, Sylvain Barraud, F. Andrieu, M. Cassé, V. Loup and Nicolas Bernier. Their work appears in journals such as Microelectronics Reliability, Journal of Applied Physics, Solid-State Electronics, Microelectronic Engineering and IEEE Transactions on Electron Devices.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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