R. Kies
Impact in
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- Semiconductor materials and devices
- Advancements in Semiconductor Devices and Circuit Design
- Advanced Memory and Neural Computing
- Ferroelectric and Negative Capacitance Devices
- Integrated Circuits and Semiconductor Failure Analysis
- Silicon Carbide Semiconductor Technologies
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- Electronic and Structural Properties of Oxides
Papers in
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- Semiconductor materials and devices 19
- Advancements in Semiconductor Devices and Circuit Design 13
- Advanced Memory and Neural Computing 5
- Thin-Film Transistor Technologies 3
- Integrated Circuits and Semiconductor Failure Analysis 3
- Ferroelectric and Negative Capacitance Devices 2
- Silicon Carbide Semiconductor Technologies 2
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- Electronic and Structural Properties of Oxides 4
- Co-authors
- G. Pananakakis (10 shared papers)G. Ghibaudo (13 shared papers)C. Papadas (5 shared papers)Jean‐Michel Hartmann (3 shared papers)C. Vizioz (3 shared papers)Sylvain Barraud (2 shared papers)G. Romano (1 shared paper)J. A. Sturm (1 shared paper)
- Journals
- Microelectronics Reliability (3 papers)Microelectronic Engineering (2 papers)Journal of Applied Physics (2 papers)Solid-State Electronics (2 papers)Applied Physics Letters (1 paper)
- Partner nations
- FranceItalySwitzerland
In The Last Decade
R. Kies
20 papers receiving 316 citations
Peers
Comparison fields: 5 of 17
- Electrical and Electronic Engineering 323
- Materials Chemistry 86
- Atomic and Molecular Physics, and Optics 34
- Electronic, Optical and Magnetic Materials 20
- Biomedical Engineering 45
Countries citing papers authored by R. Kies
This map shows the geographic impact of R. Kies's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by R. Kies with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites R. Kies more than expected).
Fields of papers citing papers by R. Kies
This network shows the impact of papers produced by R. Kies. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by R. Kies. The network helps show where R. Kies may publish in the future.
Co-authors
The 25 scholars most cited alongside R. Kies, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 21 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 1995 | 106 | |
| 2 | 2020 | 74 | |
| 3 | 2008 | 21 | |
| 4 | 2009 | 21 | |
| 5 | 1997 | 20 | |
| 6 | 1998 | 15 | |
| 7 | 1999 | 14 | |
| 8 | 1996 | 10 | |
| 9 | 2020 | 10 | |
| 10 | 2012 | 9 | |
| 11 | Temperature Dependence of Fowler-Nordheim Emission Tunneling Current in MOS Structures | 1994 | 5 |
| 12 | 2010 | 5 | |
| 13 | 1997 | 4 | |
| 14 | 1995 | 3 | |
| 15 | 2011 | 3 | |
| 16 | 2013 | 3 | |
| 17 | 2010 | 2 | |
| 18 | 1996 | 1 | |
| 19 | 2022 | 1 | |
| 20 | 2010 | 1 |
About R. Kies
R. Kies is a scholar working on Electrical and Electronic Engineering, Materials Chemistry, Electronic, Optical and Magnetic Materials, Surfaces, Coatings and Films and Electrochemistry, having authored 21 papers that have together received 329 indexed citations. Recurring topics across this work include Semiconductor materials and devices (19 papers), Advancements in Semiconductor Devices and Circuit Design (13 papers), Advanced Memory and Neural Computing (5 papers), Electronic and Structural Properties of Oxides (4 papers), Thin-Film Transistor Technologies (3 papers), Integrated Circuits and Semiconductor Failure Analysis (3 papers), Ferroelectric and Negative Capacitance Devices (2 papers) and Silicon Carbide Semiconductor Technologies (2 papers). The work is most often cited by research in Electrical and Electronic Engineering (323 citations), Materials Chemistry (86 citations), Atomic and Molecular Physics, and Optics (34 citations), Electronic, Optical and Magnetic Materials (20 citations) and Biomedical Engineering (45 citations). R. Kies has collaborated with scholars based in France, Italy and Switzerland. Frequent co-authors include G. Pananakakis, G. Ghibaudo, C. Papadas, Jean‐Michel Hartmann, C. Vizioz, Sylvain Barraud, G. Romano, J. A. Sturm, M. Cassé and V. Loup. Their work appears in journals such as Microelectronics Reliability, Microelectronic Engineering, Journal of Applied Physics, Solid-State Electronics and Applied Physics Letters.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.