Wei Yip Loh

443 citations
27 papers · 356 · h-index 9

Impact in

Papers in

    • Semiconductor materials and devices 24
    • Advancements in Semiconductor Devices and Circuit Design 18
    • Ferroelectric and Negative Capacitance Devices 7
    • Integrated Circuits and Semiconductor Failure Analysis 7
    • Silicon Carbide Semiconductor Technologies 3
    • Silicon and Solar Cell Technologies 2
    • Semiconductor materials and interfaces 7

Wei Yip Loh

25 papers receiving 346 citations

Peers

Wei Yip Loh
Comparison fields: 5 of 24
  • Electrical and Electronic Engineering 339
  • Atomic and Molecular Physics, and Optics 65
  • Materials Chemistry 70
  • Biomedical Engineering 47
  • Electronic, Optical and Magnetic Materials 18
Replace R. Kies with:
R. Kies France
Yuan Taur United States
Haotian Zhu China
Wolfgang Gös Austria
E. Simoen Belgium
G. Boccardi Belgium
Kang-Ill Seo United States
Gillis Winderickx Belgium
S. Brus Belgium
Paul Vande Voorde United States
Wei Yip Loh relative to R. Kies France R. Kies's profile →
Citations per field
00.5×3.2×
R. Kies · 1×
Citations per year

Countries citing papers authored by Wei Yip Loh

Since Specialization
Citations

This map shows the geographic impact of Wei Yip Loh's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Wei Yip Loh with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Wei Yip Loh more than expected).

Fields of papers citing papers by Wei Yip Loh

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Wei Yip Loh. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Wei Yip Loh. The network helps show where Wei Yip Loh may publish in the future.

Co-authors

The 25 scholars most cited alongside Wei Yip Loh, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with Wei Yip Loh Line = papers co-authored together Wei Yip Loh links everyone, so they are left out of the graph.

All Works

20 of 20 papers shown

Showing the 20 most-cited of 27 papers — load more, or switch the sort, to bring in the rest.

#Work
1 2010106
2 200762
3 200751
4 201318
5 200415
6 200413
7 200711
8 20109
9 20089
10 19988
11 20027
12 20026
13 20026
14 20115
15 20105
16 20135
17 20154
18 20054
19 20043
20 20112

About Wei Yip Loh

Wei Yip Loh is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics, Materials Chemistry, Catalysis and Developmental Neuroscience, having authored 27 papers that have together received 356 indexed citations. Recurring topics across this work include Semiconductor materials and devices (24 papers), Advancements in Semiconductor Devices and Circuit Design (18 papers), Ferroelectric and Negative Capacitance Devices (7 papers), Semiconductor materials and interfaces (7 papers), Integrated Circuits and Semiconductor Failure Analysis (7 papers), Silicon Carbide Semiconductor Technologies (3 papers), Silicon and Solar Cell Technologies (2 papers) and Electronic and Structural Properties of Oxides (2 papers). The work is most often cited by research in Electrical and Electronic Engineering (339 citations), Atomic and Molecular Physics, and Optics (65 citations), Materials Chemistry (70 citations), Biomedical Engineering (47 citations) and Electronic, Optical and Magnetic Materials (18 citations). Wei Yip Loh has collaborated with scholars based in Singapore, United States and Belgium. Frequent co-authors include Byung Jin Cho, Yi Tong, Goutam Kumar Dalapati, Chang Yong Kang, Jungwoo Oh, Prashant Majhi, Sung Hwan Kim, Tsu‐Jae King Liu, Anupama Bowonder and Kanghoon Jeon. Their work appears in journals such as IEEE Electron Device Letters, Journal of Applied Physics, Applied Physics Letters, IEEE Transactions on Device and Materials Reliability and Anaesthesia.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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