A. See

1.1k citations

74 papers · 875 · h-index 18

Impact in

Electrical and Electronic Engineering top 5%
- Semiconductor materials and devices
- Integrated Circuits and Semiconductor Failure Analysis
- Silicon and Solar Cell Technologies
- Advancements in Semiconductor Devices and Circuit Design
- Ferroelectric and Negative Capacitance Devices
Atomic and Molecular Physics, and Optics top 10%
- Semiconductor materials and interfaces

Papers in

Electrical and Electronic Engineering 67
- Semiconductor materials and devices 30
- Silicon and Solar Cell Technologies 30
- Integrated Circuits and Semiconductor Failure Analysis 29
- Advancements in Semiconductor Devices and Circuit Design 10
Atomic and Molecular Physics, and Optics 24
- Semiconductor materials and interfaces 22

Co-authors: Andrew T. S. Wee (15 shared papers)K. L. Pey (12 shared papers)Hao Gong (3 shared papers)L. Chan (9 shared papers)M. E. Loomans (2 shared papers)S. K. Lahiri (2 shared papers)G. D. Wilk (2 shared papers)Petri I. Räisänen (2 shared papers)
Journals: Applied Physics Letters (8 papers)Journal of The Electrochemical Society (7 papers)Journal of Applied Physics (6 papers)Journal of Electronic Materials (4 papers)IEEE Transactions on Semiconductor Manufacturing (4 papers)
Partner nations: Singapore United States France

In The Last Decade

A. See

71 papers receiving 840 citations

Peers

Countries citing papers authored by A. See

Since Specialization

Citations

This map shows the geographic impact of A. See's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by A. See with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites A. See more than expected).

Fields of papers citing papers by A. See

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by A. See. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by A. See. The network helps show where A. See may publish in the future.

Co-authors

The 25 scholars most cited alongside A. See, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with A. See Line = papers co-authored together A. See links everyone, so they are left out of the graph.

All Works

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20 of 20 papers shown

Showing the 20 most-cited of 74 papers — load more, or switch the sort, to bring in the rest.

#	Work
1	Morphology and crystallization kinetics in HfO2 thin films grown by atomic layer deposition Journal of Applied Physics ·M.-Y. Ho, Hao Gong, G. D. Wilk, B. Busch, M. L. Green, Paul M. Voyles, David A. Muller, M. Bude, (unknown), A. See, M. E. Loomans, S. K. Lahiri, Petri I. Räisänen	2003	149
2	Suppressed crystallization of Hf-based gate dielectrics by controlled addition of Al2O3 using atomic layer deposition Applied Physics Letters ·M.-Y. Ho, Hao Gong, G. D. Wilk, B. Busch, M. L. Green, (unknown), A. See, S. K. Lahiri, M. E. Loomans, Petri I. Räisänen, T. Gustafsson	2002	87
3	Annealing of ultrashallow p+/n junction by 248 nm excimer laser and rapid thermal processing with different preamorphization depths Applied Physics Letters ·Y. F. Chong, K. L. Pey, Andrew T. S. Wee, A. See, L. Chan, Yonghai Lu, W. D. Song, Lye Hing Chua	2000	61
4	Near-field Raman imaging using optically trapped dielectric microsphere Optics Express ·Johnson Kasim, Ting Yu, You Meng, Ping Liu, A. See, (unknown), (unknown)	2008	40
5	Applications of micro-Raman spectroscopy in salicide characterization for Si device fabrication Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena ·Feng Zhao, S. Y. Chen, Zexiang Shen, Xindong Gao, Jingjing Zheng, A. See, L. H. Chan	2003	27
6	Control of transient enhanced diffusion of boron after laser thermal processing of preamorphized silicon Journal of Applied Physics ·Y. F. Chong, K. L. Pey, Andrew T. S. Wee, T. Osipowicz, A. See, L. Chan	2002	22
7	Strain profiling of HfO2/Si(001) interface with high-resolution Rutherford backscattering spectroscopy Applied Physics Letters ·K. Nakajima, S. Joumori, Motofumi Suzuki, Kenji Kimura, T. Osipowicz, K. L. Tok, Jingjing Zheng, A. See, B. C. Zhang	2003	22
8	Study of copper silicide retardation effects on copper diffusion in silicon Journal of Applied Physics ·C. S. Lee, Hao Gong, R. Liu, Andrew T. S. Wee, Chukwuneke Jeremiah L, A. See, L. Chan	2001	21
9	Synthesis and characterization of pure C40 TiSi2 Applied Physics Letters ·S. Y. Chen, Zexiang Shen, K. Li, A. See, L. H. Chan	2000	20
10	Comparison of in situ and ex situ plasma-treated metalorganic chemical vapor deposition titanium nitride thin films Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena ·Boon Kiat Lim, Hun Sub Park, A. See, Er Zhuang Liu, Shao Hui Wu	2002	20
11	Layer Inversion of Ni(Pt)Si on Mixed Phase Si Films Electrochemical and Solid-State Letters ·Pooi See Lee, K. L. Pey, D. Mangelinck, Jeak Ling Ding, T. Osipowicz, A. See	2002	19
12	Effect of processing parameters on electroless Cu seed layer properties Thin Solid Films ·Y. C. Ee, Zhong Chen, L. Chan, A. See, S. B. Law, K.C. Tee, Kaiyang Zeng, Luming Shen	2004	19
13	Enhanced stability of Ni monosilicide on MOSFETs poly-Si gate stack Microelectronic Engineering ·Pooi See Lee, D. Mangelinck, K. L. Pey, Jun Ding, D.Z. Chi, T. Osipowicz, Jiyan Dai, A. See	2002	19
14	Multiple-pulse laser annealing of preamorphized silicon for ultrashallow boron junction formation Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena ·Chyiu Hyia Poon, Byung Jin Cho, Yongfeng Lu, Mousumi Bhat, A. See	2003	18
15	Structural study of refractory-metal-free C40 TiSi2 and its transformation to C54 TiSi2 Applied Physics Letters ·Ting Yu, Swee Ching Tan, Zexiang Shen, Luwei Chen, Jyi-Tsong Lin, A. See	2002	18
16	Effects of oxygen flooding on crater bottom composition and roughness in ultrashallow secondary ion mass spectrometry depth profiling Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena ·C. M. Ng, Andrew T. S. Wee, C. H. A. Huan, A. See	2001	17
17	Boron Profile Narrowing in Laser-Processed Silicon after Rapid Thermal Anneal Journal of The Electrochemical Society ·Chyiu Hyia Poon, L.S. Tan, Byung Jin Cho, A. See, Mousumi Bhat	2003	17
18	Raman spectroscopic studies of the formation processes of cobalt silicide thin films Thin Solid Films ·F.M. Liu, J.H. Ye, Bin Ren, Zhilin Yang, Yuanyan Liao, A. See, L. Chan, Zhong‐Qun Tian	2004	17
19	Nickel silicide formation on Si(100) and Poly-Si with a presilicide N2 + implantation Journal of Electronic Materials ·Pooi See Lee, D. Mangelinck, K. L. Pey, Jun Ding, D. Z., Jiyan Dai, A. See	2001	15
20	Ultra shallow secondary ion mass spectrometry depth profiling: Limitation of sample rotation in improving depth resolution Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms ·C. M. Ng, Andrew T. S. Wee, C. H. A. Huan, A. See	2001	14

About A. See

A. See is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics, Computational Mechanics, Materials Chemistry and Biomedical Engineering, having authored 74 papers that have together received 875 indexed citations. Recurring topics across this work include Semiconductor materials and devices (30 papers), Silicon and Solar Cell Technologies (30 papers), Integrated Circuits and Semiconductor Failure Analysis (29 papers), Semiconductor materials and interfaces (22 papers), Ion-surface interactions and analysis (14 papers), Advancements in Semiconductor Devices and Circuit Design (10 papers), Silicon Nanostructures and Photoluminescence (8 papers) and Laser Material Processing Techniques (7 papers). The work is most often cited by research in Electrical and Electronic Engineering (727 citations), Atomic and Molecular Physics, and Optics (271 citations), Computational Mechanics (171 citations), Materials Chemistry (326 citations) and Electronic, Optical and Magnetic Materials (93 citations). A. See has collaborated with scholars based in Singapore, United States and France. Frequent co-authors include Andrew T. S. Wee, K. L. Pey, Hao Gong, L. Chan, M. E. Loomans, S. K. Lahiri, G. D. Wilk, Petri I. Räisänen, B. Busch and M.-Y. Ho. Their work appears in journals such as Applied Physics Letters, Journal of The Electrochemical Society, Journal of Applied Physics, Journal of Electronic Materials and IEEE Transactions on Semiconductor Manufacturing.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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