Jonathan A. Pellish

2.2k citations
102 papers · 1.5k · h-index 22

Impact in

    • VLSI and Analog Circuit Testing
    • Radiation Effects in Electronics
    • Semiconductor materials and devices
    • Integrated Circuits and Semiconductor Failure Analysis
    • Advancements in Semiconductor Devices and Circuit Design
    • Low-power high-performance VLSI design

Papers in

Jonathan A. Pellish

96 papers receiving 1.5k citations

Peers

Jonathan A. Pellish
Comparison fields: 5 of 48
  • Hardware and Architecture 373
  • Electrical and Electronic Engineering 1.5k
  • Radiation 177
  • Nuclear and High Energy Physics 125
  • Safety, Risk, Reliability and Quality 69
Replace Brian D. Sierawski with:
Brian D. Sierawski United States
S. Duzellier France
C.M. Seidleck United States
F. Wrobel France
Kevin M. Warren United States
Frédéric Saigné France
R. Koga United States
R. Harboe-Sørensen Netherlands
C. Poivey Netherlands
G.L. Hash United States
Jonathan A. Pellish relative to Brian D. Sierawski United States Brian D. Sierawski's profile →
Citations per field
00.5×1.5×
Brian D. Sierawski · 1×
Citations per year

Countries citing papers authored by Jonathan A. Pellish

Since Specialization
Citations

This map shows the geographic impact of Jonathan A. Pellish's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Jonathan A. Pellish with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Jonathan A. Pellish more than expected).

Fields of papers citing papers by Jonathan A. Pellish

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Jonathan A. Pellish. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Jonathan A. Pellish. The network helps show where Jonathan A. Pellish may publish in the future.

Co-authors

The 25 scholars most cited alongside Jonathan A. Pellish, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with Jonathan A. Pellish Line = papers co-authored together Jonathan A. Pellish links everyone, so they are left out of the graph.

All Works

20 of 20 papers shown

Showing the 20 most-cited of 102 papers — load more, or switch the sort, to bring in the rest.

#Work
1 2009161
2 2009137
3 200795
4 201089
5 200684
6 201152
7 200646
8 200843
9 201241
10 200641
11 200935
12 200835
13 201435
14 201030
15 200729
16 201128
17 200827
18 200725
19 200825
20 201225

About Jonathan A. Pellish

Jonathan A. Pellish is a scholar working on Electrical and Electronic Engineering, Hardware and Architecture, Aerospace Engineering, Materials Chemistry and Radiation, having authored 102 papers that have together received 1.5k indexed citations. Recurring topics across this work include Radiation Effects in Electronics (90 papers), Integrated Circuits and Semiconductor Failure Analysis (39 papers), Semiconductor materials and devices (28 papers), VLSI and Analog Circuit Testing (22 papers), Spacecraft Design and Technology (13 papers), Advancements in Semiconductor Devices and Circuit Design (11 papers), Radiation Detection and Scintillator Technologies (10 papers) and Graphite, nuclear technology, radiation studies (10 papers). The work is most often cited by research in Hardware and Architecture (373 citations), Electrical and Electronic Engineering (1.5k citations), Radiation (177 citations), Nuclear and High Energy Physics (125 citations) and Safety, Risk, Reliability and Quality (69 citations). Jonathan A. Pellish has collaborated with scholars based in United States, Netherlands and France. Frequent co-authors include Robert A. Reed, Ronald D. Schrimpf, Paul W. Marshall, Kenneth A. LaBel, Robert A. Weller, Marcus H. Mendenhall, Brian D. Sierawski, C.M. Seidleck, M.A. Xapsos and Melanie D. Berg. Their work appears in journals such as IEEE Transactions on Nuclear Science, IEEE Electron Device Letters, Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms, Solid-State Electronics and IEEE Transactions on Device and Materials Reliability.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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