N. Seifert

3.3k citations
61 papers · 2.5k · 1 hit paper · h-index 24

Impact in

    • VLSI and Analog Circuit Testing
    • Radiation Effects in Electronics
    • Semiconductor materials and devices
    • Low-power high-performance VLSI design
    • Integrated Circuits and Semiconductor Failure Analysis
    • Advancements in Semiconductor Devices and Circuit Design

Papers in

N. Seifert

61 papers receiving 2.4k citations

N. Seifert's Hit Papers

Robust system design with built-in soft-error resilience 2005 · 409 citations
4090+7+14Years since publication100200300400

Peers

N. Seifert
Comparison fields: 5 of 56
  • Hardware and Architecture 1.5k
  • Electrical and Electronic Engineering 2.3k
  • Safety, Risk, Reliability and Quality 170
  • Software 54
  • Computer Networks and Communications 247
Replace M. H. Woods with:
M. H. Woods United States
Brian D. Sierawski United States
R. Koga United States
Kevin M. Warren United States
Jonathan A. Pellish United States
Gilles Gasiot France
C. Poivey Netherlands
C.M. Seidleck United States
David F. Heidel United States
George C. Messenger United States
N. Seifert relative to M. H. Woods United States M. H. Woods's profile →
Citations per field
00.5×9.3×
M. H. Woods · 1×
Citations per year

Countries citing papers authored by N. Seifert

Since Specialization
Citations

This map shows the geographic impact of N. Seifert's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by N. Seifert with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites N. Seifert more than expected).

Fields of papers citing papers by N. Seifert

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by N. Seifert. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by N. Seifert. The network helps show where N. Seifert may publish in the future.

Co-authors

The 25 scholars most cited alongside N. Seifert, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with N. Seifert Line = papers co-authored together N. Seifert links everyone, so they are left out of the graph.

All Works

20 of 20 papers shown

Showing the 20 most-cited of 61 papers — load more, or switch the sort, to bring in the rest.

#Work
1
Robust system design with built-in soft-error resilience
Hit paper breakdown →
2005409
2 2006160
3 2006158
4 2012144
5 2002128
6 2006127
7 201099
8 200490
9 201588
10 200586
11 200985
12 200280
13 200871
14 200570
15 200559
16 200256
17 200754
18 200541
19 200741
20 200637

About N. Seifert

N. Seifert is a scholar working on Electrical and Electronic Engineering, Hardware and Architecture, Computational Mechanics, Materials Chemistry and Atomic and Molecular Physics, and Optics, having authored 61 papers that have together received 2.5k indexed citations. Recurring topics across this work include Radiation Effects in Electronics (40 papers), Semiconductor materials and devices (22 papers), VLSI and Analog Circuit Testing (22 papers), Integrated Circuits and Semiconductor Failure Analysis (12 papers), Ion-surface interactions and analysis (10 papers), Reliability and Maintenance Optimization (7 papers), Laser-induced spectroscopy and plasma (4 papers) and Low-power high-performance VLSI design (4 papers). The work is most often cited by research in Hardware and Architecture (1.5k citations), Electrical and Electronic Engineering (2.3k citations), Safety, Risk, Reliability and Quality (170 citations), Software (54 citations) and Computer Networks and Communications (247 citations). N. Seifert has collaborated with scholars based in United States, Austria and United Kingdom. Frequent co-authors include Subhasish Mitra, B. Gill, Qi Shi, Ming Zhang, Kee Sup Kim, V. Ambrose, Xiao‐Wei Zhu, L. W. Massengill, Shah M. Jahinuzzaman and Quan Shi. Their work appears in journals such as Physical review. B, Condensed matter, IEEE Transactions on Nuclear Science, Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms, Applied Surface Science and IEEE Transactions on Device and Materials Reliability.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

Explore authors with similar magnitude of impact