Frédéric Saigné

3.0k citations
199 papers · 2.0k · h-index 25

Impact in

Papers in

    • Radiation Effects in Electronics 155
    • Semiconductor materials and devices 81
    • Integrated Circuits and Semiconductor Failure Analysis 75
    • Advancements in Semiconductor Devices and Circuit Design 24
    • Electrostatic Discharge in Electronics 19
    • VLSI and Analog Circuit Testing 44

Frédéric Saigné

185 papers receiving 2.0k citations

Peers

Frédéric Saigné
Comparison fields: 5 of 53
  • Hardware and Architecture 394
  • Radiation 329
  • Electrical and Electronic Engineering 1.9k
  • Nuclear and High Energy Physics 194
  • Pulmonary and Respiratory Medicine 206
Replace Brian D. Sierawski with:
Brian D. Sierawski United States
F. Wrobel France
Kevin M. Warren United States
Jonathan A. Pellish United States
C. Poivey Netherlands
S. Duzellier France
V. Ferlet-Cavrois France
Véronique Ferlet-Cavrois Netherlands
C.M. Seidleck United States
F.W. Sexton United States
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Citations per field
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Brian D. Sierawski · 1×
Citations per year

Countries citing papers authored by Frédéric Saigné

Since Specialization
Citations

This map shows the geographic impact of Frédéric Saigné's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Frédéric Saigné with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Frédéric Saigné more than expected).

Fields of papers citing papers by Frédéric Saigné

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Frédéric Saigné. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Frédéric Saigné. The network helps show where Frédéric Saigné may publish in the future.

Co-authors

The 25 scholars most cited alongside Frédéric Saigné, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with Frédéric Saigné Line = papers co-authored together Frédéric Saigné links everyone, so they are left out of the graph.

All Works

20 of 20 papers shown

Showing the 20 most-cited of 199 papers — load more, or switch the sort, to bring in the rest.

#Work
1 200659
2 201451
3 200647
4 201444
5 201042
6 200436
7 202134
8 200532
9 200431
10 200630
11 201330
12 201530
13 201829
14 200929
15 200728
16 201428
17 199728
18 200727
19 201427
20 202026

About Frédéric Saigné

Frédéric Saigné is a scholar working on Electrical and Electronic Engineering, Hardware and Architecture, Radiation, Nuclear and High Energy Physics and Pulmonary and Respiratory Medicine, having authored 199 papers that have together received 2.0k indexed citations. Recurring topics across this work include Radiation Effects in Electronics (155 papers), Semiconductor materials and devices (81 papers), Integrated Circuits and Semiconductor Failure Analysis (75 papers), VLSI and Analog Circuit Testing (44 papers), Radiation Detection and Scintillator Technologies (29 papers), Advancements in Semiconductor Devices and Circuit Design (24 papers), Electrostatic Discharge in Electronics (19 papers) and Particle Detector Development and Performance (19 papers). The work is most often cited by research in Hardware and Architecture (394 citations), Radiation (329 citations), Electrical and Electronic Engineering (1.9k citations), Nuclear and High Energy Physics (194 citations) and Pulmonary and Respiratory Medicine (206 citations). Frédéric Saigné has collaborated with scholars based in France, United States and Switzerland. Frequent co-authors include F. Wrobel, J. Boch, Antoine Touboul, L. Dusseau, Ronald D. Schrimpf, Luigi Dilillo, J. Gasiot, B. Sagnes, V. Pouget and Georgios Tsiligiannis. Their work appears in journals such as IEEE Transactions on Nuclear Science, Microelectronics Reliability, Applied Physics Letters, Journal of Applied Physics and Electronics.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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