Conal E. Murray

110 papers receiving 3k citations

Conal E. Murray's Hit Papers

Review Article: Stress in thin films and coatings: Current status, challenges, and prospects 2018 · 663 citations
6630+2+5Years since publication200400600

Peers

Conal E. Murray
Comparison fields: 5 of 66
  • Radiation 320
  • Electronic, Optical and Magnetic Materials 373
  • Electrical and Electronic Engineering 1.2k
  • Mechanics of Materials 409
  • Materials Chemistry 715
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Countries citing papers authored by Conal E. Murray

Since Specialization
Citations

This map shows the geographic impact of Conal E. Murray's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Conal E. Murray with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Conal E. Murray more than expected).

Fields of papers citing papers by Conal E. Murray

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Conal E. Murray. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Conal E. Murray. The network helps show where Conal E. Murray may publish in the future.

Co-authors

The 25 scholars most cited alongside Conal E. Murray, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with Conal E. Murray Line = papers co-authored together Conal E. Murray links everyone, so they are left out of the graph.

All Works

20 of 20 papers shown

Showing the 20 most-cited of 114 papers — load more, or switch the sort, to bring in the rest.

#Work
1
Review Article: Stress in thin films and coatings: Current status, challenges, and prospects
Hit paper breakdown →
2018663
2 2004466
3 2007162
4 2003147
5 2016104
6 200693
7 202187
8 201284
9 200670
10 200554
11 201153
12 202249
13 201048
14 201446
15 200644
16 200439
17 200939
18 200833
19 199831
20 200228

About Conal E. Murray

Conal E. Murray is a scholar working on Electronic, Optical and Magnetic Materials, Mechanics of Materials, Radiation, Materials Chemistry and Electrical and Electronic Engineering, having authored 114 papers that have together received 3.1k indexed citations. Recurring topics across this work include Copper Interconnects and Reliability (27 papers), X-ray Diffraction in Crystallography (25 papers), Semiconductor materials and interfaces (21 papers), Metal and Thin Film Mechanics (19 papers), Semiconductor materials and devices (14 papers), Advancements in Semiconductor Devices and Circuit Design (12 papers), Advanced X-ray Imaging Techniques (10 papers) and Radiation Effects in Electronics (9 papers). The work is most often cited by research in Radiation (320 citations), Electronic, Optical and Magnetic Materials (373 citations), Electrical and Electronic Engineering (1.2k citations), Mechanics of Materials (409 citations) and Materials Chemistry (715 citations). Conal E. Murray has collaborated with scholars based in United States, France and Canada. Frequent co-authors include Matthew Copel, David B. Mitzi, Ismail Cevdet Noyan, Ali Afzali, Laura L. Kosbar, Ludvik Martinu, Gregory B. Thompson, Marco Sebastiani, Eric Chason and Étienne Barthel. Their work appears in journals such as Applied Physics Letters, Journal of Applied Physics, IEEE Transactions on Nuclear Science, Philosophical magazine. A/Philosophical magazine. A. Physics of condensed matter. Structure, defects and mechanical properties and Microscopy and Microanalysis.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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