F. Wrobel
Impact in
- Hardware and Architecture top 1%
- VLSI and Analog Circuit Testing
- Radiation top 5%
- Radiation Detection and Scintillator Technologies
Papers in
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- VLSI and Analog Circuit Testing 42
-
- Radiation Effects in Electronics 132
- Semiconductor materials and devices 62
- Integrated Circuits and Semiconductor Failure Analysis 54
- Low-power high-performance VLSI design 14
- Co-authors
- Frédéric Saigné (106 shared papers)Antoine D. Touboul (45 shared papers)J.M. Palau (9 shared papers)Luigi Dilillo (53 shared papers)M.-C. Calvet (4 shared papers)Jérôme Boch (20 shared papers)Vincent Pouget (19 shared papers)Olivier Bersillon (2 shared papers)
- Journals
- IEEE Transactions on Nuclear Science (73 papers)Microelectronics Reliability (9 papers)Radiation Protection Dosimetry (4 papers)Electronics (3 papers)Diamond and Related Materials (3 papers)
- Partner nations
- FranceSwitzerlandUnited States
In The Last Decade
F. Wrobel
158 papers receiving 1.8k citations
Peers
Comparison fields: 5 of 51
- Hardware and Architecture 542
- Radiation 324
- Electrical and Electronic Engineering 1.7k
- Nuclear and High Energy Physics 190
- Safety, Risk, Reliability and Quality 70
Countries citing papers authored by F. Wrobel
This map shows the geographic impact of F. Wrobel's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by F. Wrobel with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites F. Wrobel more than expected).
Fields of papers citing papers by F. Wrobel
This network shows the impact of papers produced by F. Wrobel. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by F. Wrobel. The network helps show where F. Wrobel may publish in the future.
Co-authors
The 25 scholars most cited alongside F. Wrobel, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 166 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 2001 | 75 | |
| 2 | 2005 | 64 | |
| 3 | 2000 | 58 | |
| 4 | 2013 | 56 | |
| 5 | 2014 | 53 | |
| 6 | 2006 | 49 | |
| 7 | 2012 | 46 | |
| 8 | 2010 | 46 | |
| 9 | 2014 | 45 | |
| 10 | 2002 | 41 | |
| 11 | 2003 | 40 | |
| 12 | 2009 | 38 | |
| 13 | 2005 | 33 | |
| 14 | 2015 | 32 | |
| 15 | 2007 | 31 | |
| 16 | 2013 | 31 | |
| 17 | 2005 | 31 | |
| 18 | 2021 | 30 | |
| 19 | 2014 | 29 | |
| 20 | 2005 | 29 |
About F. Wrobel
F. Wrobel is a scholar working on Hardware and Architecture, Electrical and Electronic Engineering, Radiation, Nuclear and High Energy Physics and Pulmonary and Respiratory Medicine, having authored 166 papers that have together received 1.9k indexed citations. Recurring topics across this work include Radiation Effects in Electronics (132 papers), Semiconductor materials and devices (62 papers), Integrated Circuits and Semiconductor Failure Analysis (54 papers), VLSI and Analog Circuit Testing (42 papers), Radiation Detection and Scintillator Technologies (26 papers), Radiation Therapy and Dosimetry (19 papers), Particle Detector Development and Performance (16 papers) and Low-power high-performance VLSI design (14 papers). The work is most often cited by research in Hardware and Architecture (542 citations), Radiation (324 citations), Electrical and Electronic Engineering (1.7k citations), Nuclear and High Energy Physics (190 citations) and Safety, Risk, Reliability and Quality (70 citations). F. Wrobel has collaborated with scholars based in France, Switzerland and United States. Frequent co-authors include Frédéric Saigné, Antoine D. Touboul, J.M. Palau, Luigi Dilillo, M.-C. Calvet, Jérôme Boch, Vincent Pouget, Olivier Bersillon, P. Iacconi and Georgios Tsiligiannis. Their work appears in journals such as IEEE Transactions on Nuclear Science, Microelectronics Reliability, Radiation Protection Dosimetry, Electronics and Diamond and Related Materials.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.