J. Baggio

2.4k citations

77 papers · 1.8k · h-index 28

Impact in

Hardware and Architecture top 2%
- VLSI and Analog Circuit Testing
Ceramics and Composites top 2%
- Glass properties and applications

Papers in

Electrical and Electronic Engineering 62
- Radiation Effects in Electronics 36
- Semiconductor materials and devices 27
- Integrated Circuits and Semiconductor Failure Analysis 26
- Advancements in Semiconductor Devices and Circuit Design 17
Instrumentation 12
- Advanced Optical Sensing Technologies 12

Co-authors: V. Ferlet-Cavrois (30 shared papers)Philippe Paillet (37 shared papers)Sylvain Girard (15 shared papers)M.R. Shaneyfelt (20 shared papers)J.R. Schwank (15 shared papers)P.E. Dodd (17 shared papers)E. W. Blackmore (14 shared papers)J. Félix (9 shared papers)
Journals: IEEE Transactions on Nuclear Science (46 papers)Journal of Non-Crystalline Solids (2 papers)Optics Express (1 paper)Fusion Engineering and Design (1 paper)Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms (1 paper)
Partner nations: France United States Canada

In The Last Decade

J. Baggio

75 papers receiving 1.7k citations

Peers

Countries citing papers authored by J. Baggio

Since Specialization

Citations

This map shows the geographic impact of J. Baggio's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by J. Baggio with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites J. Baggio more than expected).

Fields of papers citing papers by J. Baggio

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by J. Baggio. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by J. Baggio. The network helps show where J. Baggio may publish in the future.

Co-authors

The 25 scholars most cited alongside J. Baggio, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with J. Baggio Line = papers co-authored together J. Baggio links everyone, so they are left out of the graph.

All Works

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20 of 20 papers shown

Showing the 20 most-cited of 77 papers — load more, or switch the sort, to bring in the rest.

#	Work
1	New Insights Into Single Event Transient Propagation in Chains of Inverters—Evidence for Propagation-Induced Pulse Broadening IEEE Transactions on Nuclear Science ·V. Ferlet-Cavrois, Philippe Paillet, Dale McMorrow, N. Fel, J. Baggio, Sylvain Girard, Olivier Duhamel, Joseph S. Melinger, Marc Gaillardin, J.R. Schwank, P.E. Dodd, M.R. Shaneyfelt, J. Félix	2007	127
2	Statistical Analysis of the Charge Collected in SOI and Bulk Devices Under Heavy lon and Proton Irradiation—Implications for Digital SETs IEEE Transactions on Nuclear Science ·V. Ferlet-Cavrois, Philippe Paillet, Marc Gaillardin, Damien Lambert, J. Baggio, J.R. Schwank, György Vizkelethy, M.R. Shaneyfelt, Kazuyuki Hirose, E. W. Blackmore, O. Faynot, C. Jahan, L. Tosti	2006	113
3	Impact of Heavy Ion Energy and Nuclear Interactions on Single-Event Upset and Latchup in Integrated Circuits IEEE Transactions on Nuclear Science ·P.E. Dodd, J.R. Schwank, M.R. Shaneyfelt, J. Félix, Philippe Paillet, V. Ferlet-Cavrois, J. Baggio, Robert A. Reed, Kevin M. Warren, Robert A. Weller, Ronald D. Schrimpf, G.L. Hash, Scott M. Dalton, Kazuyuki Hirose, Hirobumi Saito	2007	96
4	Effects of particle energy on proton-induced single-event latchup IEEE Transactions on Nuclear Science ·J.R. Schwank, M.R. Shaneyfelt, J. Baggio, P.E. Dodd, J. Félix, V. Ferlet-Cavrois, Philippe Paillet, Damien Lambert, F.W. Sexton, G.L. Hash, E. W. Blackmore	2005	88
5	Radiation Effects on Silica-Based Preforms and Optical Fibers—I: Experimental Study With Canonical Samples IEEE Transactions on Nuclear Science ·S. Girard, Y. Ouerdane, G. Origlio, C. Marcandella, A. Boukenter, N. Richard, J. Baggio, Philippe Paillet, M. Cannas, J. Bisutti, Jean-Pierre Meunier, R. Boscaino	2008	81
6	Proton- and Gamma-Induced Effects on Erbium-Doped Optical Fibers IEEE Transactions on Nuclear Science ·Sylvain Girard, B. Tortech, Élise Régnier, Marco Van Uffelen, A. Gusarov, Y. Ouerdane, J. Baggio, P. Paillet, V. Ferlet-Cavrois, A. Boukenter, Jean-Pierre Meunier, Francis Berghmans, J.R. Schwank, M.R. Shaneyfelt, J. Félix, E. W. Blackmore, Hugo Thienpont	2007	68
7	Radiation Effects on Ytterbium- and Ytterbium/Erbium-Doped Double-Clad Optical Fibers IEEE Transactions on Nuclear Science ·Sylvain Girard, Y. Ouerdane, B. Tortech, C. Marcandella, Thierry Robin, Benoît Cadier, J. Baggio, P. Paillet, V. Ferlet-Cavrois, A. Boukenter, Jean-Pierre Meunier, J.R. Schwank, M.R. Shaneyfelt, P.E. Dodd, E. W. Blackmore	2009	64
8	14-MeV Neutron, $\gamma$-Ray, and Pulsed X-Ray Radiation-Induced Effects on Multimode Silica-Based Optical Fibers IEEE Transactions on Nuclear Science ·Sylvain Girard, J. Baggio, J. Bisutti	2006	56
9	Effects of Total Dose Irradiation on Single-Event Upset Hardness IEEE Transactions on Nuclear Science ·J.R. Schwank, M.R. Shaneyfelt, J. Félix, P.E. Dodd, J. Baggio, V. Ferlet-Cavrois, Philippe Paillet, G.L. Hash, Richard S. Flores, L. W. Massengill, E. W. Blackmore	2006	53
10	Single Event Upsets Induced by 1–10 MeV Neutrons in Static-RAMs Using Mono-Energetic Neutron Sources IEEE Transactions on Nuclear Science ·J. Baggio, Damien Lambert, V. Ferlet-Cavrois, Philippe Paillet, C. Marcandella, Olivier Duhamel	2007	50
11	Charge enhancement effect in NMOS bulk transistors induced by heavy ion Irradiation-comparison with SOI IEEE Transactions on Nuclear Science ·V. Ferlet-Cavrois, György Vizkelethy, Philippe Paillet, A. Torres, J.R. Schwank, M.R. Shaneyfelt, J. Baggio, Jd.P. de Pontcharra, L. Tosti	2004	47
12	Transient optical absorption in pulsed-X-ray-irradiated pure-silica-core optical fibers: Influence of self-trapped holes Journal of Non-Crystalline Solids ·Sylvain Girard, David L. Griscom, J. Baggio, B. Brichard, Francis Berghmans	2006	38
13	SEU sensitivity of bulk and SOI technologies to 14-MeV neutrons IEEE Transactions on Nuclear Science ·Gilles Gasiot, V. Ferlet-Cavrois, J. Baggio, Ph. Roche, Philippe Flatresse, A. Guyot, Pascal Morel, O. Bersillon, J. du Port de Pontcharra	2002	37
14	Analysis of proton/neutron SEU sensitivity of commercial SRAMs-application to the terrestrial environment test method IEEE Transactions on Nuclear Science ·J. Baggio, V. Ferlet-Cavrois, H. Duarte, O. Flament	2004	37
15	Neutron-induced SEU in bulk SRAMs in terrestrial environment: Simulations and experiments IEEE Transactions on Nuclear Science ·Damien Lambert, J. Baggio, V. Ferlet-Cavrois, O. Flament, Frédéric Saigné, B. Sagnes, N. Buard, T. Carrière	2004	36
16	Issues for single-event proton testing of SRAMs IEEE Transactions on Nuclear Science ·J.R. Schwank, P.E. Dodd, M.R. Shaneyfelt, J.A. Feli, G.L. Hash, V. Ferlet-Cavrois, Philippe Paillet, J. Baggio, Paiboon Tangyunyong, E. W. Blackmore	2004	36
17	Radiation-induced effects in a new class of optical waveguides: the air-guiding photonic crystal fibers IEEE Transactions on Nuclear Science ·Sylvain Girard, J. Baggio, J.L. Leray	2005	36
18	Heavy Ion Energy Effects in CMOS SRAMs IEEE Transactions on Nuclear Science ·P.E. Dodd, J.R. Schwank, M.R. Shaneyfelt, V. Ferlet-Cavrois, Philippe Paillet, J. Baggio, G.L. Hash, J. Félix, Kazuyuki Hirose, Hirobumi Saito	2007	35
19	Heavy Ion Microbeam- and Broadbeam-Induced Transients in SiGe HBTs IEEE Transactions on Nuclear Science ·Jonathan A. Pellish, Robert A. Reed, Dale McMorrow, György Vizkelethy, Veronique Ferlet Cavrois, J. Baggio, Philippe Paillet, Olivier Duhamel, Kurt A. Moen, Stanley D. Phillips, Ryan M. Diestelhorst, John D. Cressler, Akil K. Sutton, Ashok Raman, Marek Turowski, P.E. Dodd, Michael L. Alles, Ronald D. Schrimpf, Paul W. Marshall, Kenneth A. LaBel	2009	35
20	SEE sensitivity of a COTS GaN transistor and silicon MOSFETs S. Bazzoli, Stéphane Girard, V. Ferlet-Cavrois, J. Baggio, Philippe Paillet, Olivier Duhamel	2007	35

About J. Baggio

J. Baggio is a scholar working on Electrical and Electronic Engineering, Instrumentation, Radiation, Atomic and Molecular Physics, and Optics and Hardware and Architecture, having authored 77 papers that have together received 1.8k indexed citations. Recurring topics across this work include Radiation Effects in Electronics (36 papers), Semiconductor materials and devices (27 papers), Integrated Circuits and Semiconductor Failure Analysis (26 papers), Advancements in Semiconductor Devices and Circuit Design (17 papers), Advanced Optical Sensing Technologies (12 papers), Glass properties and applications (11 papers), VLSI and Analog Circuit Testing (11 papers) and Laser-Plasma Interactions and Diagnostics (9 papers). The work is most often cited by research in Hardware and Architecture (319 citations), Ceramics and Composites (266 citations), Electrical and Electronic Engineering (1.6k citations), Radiation (213 citations) and Instrumentation (41 citations). J. Baggio has collaborated with scholars based in France, United States and Canada. Frequent co-authors include V. Ferlet-Cavrois, Philippe Paillet, Sylvain Girard, M.R. Shaneyfelt, J.R. Schwank, P.E. Dodd, E. W. Blackmore, J. Félix, Damien Lambert and Olivier Duhamel. Their work appears in journals such as IEEE Transactions on Nuclear Science, Journal of Non-Crystalline Solids, Optics Express, Fusion Engineering and Design and Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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