R. Baumann

5.3k citations
69 papers · 3.4k · 2 hit papers · h-index 22

Impact in

    • VLSI and Analog Circuit Testing
    • Radiation Effects in Electronics
    • Semiconductor materials and devices
    • Low-power high-performance VLSI design
    • Integrated Circuits and Semiconductor Failure Analysis
    • Advancements in Semiconductor Devices and Circuit Design

Papers in

R. Baumann

63 papers receiving 3.3k citations

R. Baumann's Hit Papers

Soft Errors in Advanced Computer Systems 2005 · 595 citations
5950+7+14Years since publication2505007501000

Peers

R. Baumann
Comparison fields: 5 of 110
  • Hardware and Architecture 1.6k
  • Electrical and Electronic Engineering 3.0k
  • Software 128
  • Radiation 252
  • Safety, Risk, Reliability and Quality 173
Replace L. W. Massengill with:
L. W. Massengill United States
Kenneth A. LaBel United States
Véronique Ferlet-Cavrois Netherlands
Paul Leroux Belgium
A. Basçhirotto Italy
Mario Konijnenburg Netherlands
F. Krummenacher Switzerland
Johan H. Huijsing Netherlands
Barry K. Gilbert United States
Paul R. Gray United States
R. Baumann relative to L. W. Massengill United States L. W. Massengill's profile →
Citations per field
00.5×1.5×2.2×
L. W. Massengill · 1×
Citations per year

Countries citing papers authored by R. Baumann

Since Specialization
Citations

This map shows the geographic impact of R. Baumann's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by R. Baumann with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites R. Baumann more than expected).

Fields of papers citing papers by R. Baumann

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by R. Baumann. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by R. Baumann. The network helps show where R. Baumann may publish in the future.

Co-authors

The 25 scholars most cited alongside R. Baumann, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with R. Baumann Line = papers co-authored together R. Baumann links everyone, so they are left out of the graph.

All Works

20 of 20 papers shown

Showing the 20 most-cited of 69 papers — load more, or switch the sort, to bring in the rest.

#Work
1
Radiation-induced soft errors in advanced semiconductor technologies
Hit paper breakdown →
20051035
2
Soft Errors in Advanced Computer Systems
Hit paper breakdown →
2005595
3 2001299
4 2003243
5 2009161
6 201089
7 199581
8 199271
9 199963
10 200254
11 201154
12 200154
13 200843
14 199741
15 200631
16 201130
17 199030
18 200427
19 198727
20 200226

About R. Baumann

R. Baumann is a scholar working on Electrical and Electronic Engineering, Hardware and Architecture, Atomic and Molecular Physics, and Optics, Radiation and Nuclear and High Energy Physics, having authored 69 papers that have together received 3.4k indexed citations. Recurring topics across this work include Radiation Effects in Electronics (37 papers), Semiconductor materials and devices (19 papers), VLSI and Analog Circuit Testing (17 papers), Integrated Circuits and Semiconductor Failure Analysis (14 papers), Photorefractive and Nonlinear Optics (8 papers), Radiation Detection and Scintillator Technologies (6 papers), Particle Detector Development and Performance (6 papers) and Photonic and Optical Devices (5 papers). The work is most often cited by research in Hardware and Architecture (1.6k citations), Electrical and Electronic Engineering (3.0k citations), Software (128 citations), Radiation (252 citations) and Safety, Risk, Reliability and Quality (173 citations). R. Baumann has collaborated with scholars based in United States, Brazil and United Kingdom. Frequent co-authors include E.B. Smith, Robert A. Weller, T. A. Rabson, Ronald D. Schrimpf, Marcus H. Mendenhall, Brian D. Sierawski, Robert A. Reed, Shunsuke Murata, Haruaki Kitagawa and Gilles Bertschy. Their work appears in journals such as IEEE Transactions on Nuclear Science, Journal of Applied Physics, IEEE Transactions on Device and Materials Reliability, Nuclear Physics A and Anesthesiology.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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