Scot E. Swanson
Impact in
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- Radiation Effects in Electronics
- Semiconductor materials and devices
- Integrated Circuits and Semiconductor Failure Analysis
- Photonic and Optical Devices
- Semiconductor Lasers and Optical Devices
- Optical Network Technologies
- Advanced MEMS and NEMS Technologies
- Advancements in Semiconductor Devices and Circuit Design
Papers in
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- Integrated Circuits and Semiconductor Failure Analysis 18
- Semiconductor materials and devices 18
- Radiation Effects in Electronics 10
- Advanced MEMS and NEMS Technologies 4
- Advanced Photonic Communication Systems 3
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- Force Microscopy Techniques and Applications 3
- Co-authors
- P.E. Dodd (15 shared papers)M.R. Shaneyfelt (13 shared papers)Norman F. Smith (2 shared papers)John Abbott (1 shared paper)P. Pepeljugoski (1 shared paper)A. J. Ritger (1 shared paper)Jeremy A. Walraven (3 shared papers)James R. Schwank (12 shared papers)
- Journals
- IEEE Transactions on Nuclear Science (12 papers)Optics Express (1 paper)Journal of Lightwave Technology (1 paper)Proceedings - International Symposium for Testing and Failure Analysis (1 paper)
- Partner nations
- United StatesNetherlandsCanada
In The Last Decade
Scot E. Swanson
29 papers receiving 387 citations
Peers
Comparison fields: 5 of 37
- Electrical and Electronic Engineering 384
- Instrumentation 15
- Hardware and Architecture 25
- Radiation 27
- Condensed Matter Physics 23
Countries citing papers authored by Scot E. Swanson
This map shows the geographic impact of Scot E. Swanson's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Scot E. Swanson with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Scot E. Swanson more than expected).
Fields of papers citing papers by Scot E. Swanson
This network shows the impact of papers produced by Scot E. Swanson. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Scot E. Swanson. The network helps show where Scot E. Swanson may publish in the future.
Co-authors
The 25 scholars most cited alongside Scot E. Swanson, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 29 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 2003 | 75 | |
| 2 | 2014 | 47 | |
| 3 | 2018 | 33 | |
| 4 | 2002 | 30 | |
| 5 | 2010 | 30 | |
| 6 | 2012 | 25 | |
| 7 | 1993 | 23 | |
| 8 | 2019 | 19 | |
| 9 | 2020 | 17 | |
| 10 | 2002 | 14 | |
| 11 | 1994 | 12 | |
| 12 | 2018 | 11 | |
| 13 | 2011 | 11 | |
| 14 | 2011 | 10 | |
| 15 | 2011 | 9 | |
| 16 | 2003 | 8 | |
| 17 | 1999 | 6 | |
| 18 | 2008 | 6 | |
| 19 | 2012 | 4 | |
| 20 | 2011 | 4 |
About Scot E. Swanson
Scot E. Swanson is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics, Computational Mechanics, Electronic, Optical and Magnetic Materials and Biomedical Engineering, having authored 29 papers that have together received 410 indexed citations. Recurring topics across this work include Integrated Circuits and Semiconductor Failure Analysis (18 papers), Semiconductor materials and devices (18 papers), Radiation Effects in Electronics (10 papers), Advanced MEMS and NEMS Technologies (4 papers), Force Microscopy Techniques and Applications (3 papers), Advanced Photonic Communication Systems (3 papers), Ion-surface interactions and analysis (3 papers) and Copper Interconnects and Reliability (3 papers). The work is most often cited by research in Electrical and Electronic Engineering (384 citations), Instrumentation (15 citations), Hardware and Architecture (25 citations), Radiation (27 citations) and Condensed Matter Physics (23 citations). Scot E. Swanson has collaborated with scholars based in United States, Netherlands and Canada. Frequent co-authors include P.E. Dodd, M.R. Shaneyfelt, Norman F. Smith, John Abbott, P. Pepeljugoski, A. J. Ritger, Jeremy A. Walraven, James R. Schwank, Steven E. Golowich and Kenneth P. Rodbell. Their work appears in journals such as IEEE Transactions on Nuclear Science, Optics Express, Journal of Lightwave Technology and Proceedings - International Symposium for Testing and Failure Analysis.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.