Patrick R. Fleming

782 citations
17 papers · 609 · 1 hit paper · h-index 10

Impact in

    • VLSI and Analog Circuit Testing
    • Radiation Effects in Electronics
    • Semiconductor materials and devices
    • Integrated Circuits and Semiconductor Failure Analysis
    • Low-power high-performance VLSI design
    • Advancements in Semiconductor Devices and Circuit Design
    • Advanced Memory and Neural Computing

Papers in

    • Radiation Effects in Electronics 14
    • Integrated Circuits and Semiconductor Failure Analysis 6
    • Low-power high-performance VLSI design 5
    • Semiconductor materials and devices 3
    • VLSI and Analog Circuit Testing 10
    • Physical Unclonable Functions (PUFs) and Hardware Security 2

Patrick R. Fleming

17 papers receiving 577 citations

Patrick R. Fleming's Hit Papers

Charge Collection and Charge Sharing in a 130 nm CMOS Technology 2006 · 327 citations
3270+6+13Years since publication100200300

Peers

Patrick R. Fleming
Comparison fields: 5 of 32
  • Hardware and Architecture 300
  • Electrical and Electronic Engineering 564
  • Critical Care and Intensive Care Medicine 20
  • Emergency Medical Services 26
  • Safety, Risk, Reliability and Quality 13
Replace Joseph R. Burns with:
Joseph R. Burns United States
P. Peronnard Switzerland
I. A. Kharitonov Russia
Bichen Chen United States
J.L. Knighten United States
Weiyuan Lin Singapore
Robert W. Techentin United States
G. Romano Italy
Matteo Cocchini United States
Ting Guo Singapore
Patrick R. Fleming relative to Joseph R. Burns United States Joseph R. Burns's profile →
Citations per field
00.5×10×15.8×
Joseph R. Burns · 1×
Citations per year

Countries citing papers authored by Patrick R. Fleming

Since Specialization
Citations

This map shows the geographic impact of Patrick R. Fleming's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Patrick R. Fleming with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Patrick R. Fleming more than expected).

Fields of papers citing papers by Patrick R. Fleming

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Patrick R. Fleming. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Patrick R. Fleming. The network helps show where Patrick R. Fleming may publish in the future.

Co-authors

The 25 scholars most cited alongside Patrick R. Fleming, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with Patrick R. Fleming Line = papers co-authored together Patrick R. Fleming links everyone, so they are left out of the graph.

All Works

17 of 17 papers shown
#Work
1
Charge Collection and Charge Sharing in a 130 nm CMOS Technology
Hit paper breakdown →
2006327
2 200781
3 201632
4 200827
5 200724
6 200822
7 200721
8 200817
9 199816
10 200814
11 20049
12 20076
13 20074
14 20084
15 20103
16 20091
17 20141

About Patrick R. Fleming

Patrick R. Fleming is a scholar working on Electrical and Electronic Engineering, Hardware and Architecture, Biomedical Engineering, Surgery and Critical Care and Intensive Care Medicine, having authored 17 papers that have together received 609 indexed citations. Recurring topics across this work include Radiation Effects in Electronics (14 papers), VLSI and Analog Circuit Testing (10 papers), Integrated Circuits and Semiconductor Failure Analysis (6 papers), Low-power high-performance VLSI design (5 papers), Semiconductor materials and devices (3 papers), Physical Unclonable Functions (PUFs) and Hardware Security (2 papers), Laser Material Processing Techniques (1 paper) and Nanofabrication and Lithography Techniques (1 paper). The work is most often cited by research in Hardware and Architecture (300 citations), Electrical and Electronic Engineering (564 citations), Critical Care and Intensive Care Medicine (20 citations), Emergency Medical Services (26 citations) and Safety, Risk, Reliability and Quality (13 citations). Patrick R. Fleming has collaborated with scholars based in United States and Sweden. Frequent co-authors include B. L. Bhuva, L. W. Massengill, Oluwole A. Amusan, Andrew L. Sternberg, Arthur F. Witulski, Michael L. Alles, Ronald D. Schrimpf, Jeffrey D. Black, W.T. Holman and A. Balasubramanian. Their work appears in journals such as IEEE Transactions on Nuclear Science, IEEE Transactions on Device and Materials Reliability, Journal of Vacuum Science & Technology A Vacuum Surfaces and Films, Critical Care Medicine and IEEE Transactions on Circuits & Systems II Express Briefs.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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