James R. Ehrstein
Impact in
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- Semiconductor materials and devices
- Advancements in Semiconductor Devices and Circuit Design
- Ferroelectric and Negative Capacitance Devices
- Integrated Circuits and Semiconductor Failure Analysis
- Materials Chemistry top 10%
- Electronic and Structural Properties of Oxides
- ZnO doping and properties
- Ferroelectric and Piezoelectric Materials
Papers in
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- Semiconductor materials and devices 11
- Integrated Circuits and Semiconductor Failure Analysis 9
- Silicon and Solar Cell Technologies 3
- Ferroelectric and Negative Capacitance Devices 2
- Thin-Film Transistor Technologies 2
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- Semiconductor materials and interfaces 4
- Co-authors
- Nhan V. Nguyen (6 shared papers)Igor Levin (4 shared papers)Şafak Sayan (4 shared papers)Eric Garfunkel (2 shared papers)Özgür Çelık (1 shared paper)Douglas Yoder (1 shared paper)Margareta Paunescu (1 shared paper)Manuel Quevedo-López (1 shared paper)
- Journals
- Journal of The Electrochemical Society (6 papers)Applied Physics Letters (3 papers)Journal of Vacuum Science & Technology A Vacuum Surfaces and Films (2 papers)Journal of Applied Physics (2 papers)Materials Science in Semiconductor Processing (1 paper)
- Partner nations
- United StatesBelgiumBrazil
In The Last Decade
James R. Ehrstein
18 papers receiving 800 citations
Peers
Comparison fields: 5 of 57
- Electrical and Electronic Engineering 580
- Materials Chemistry 403
- Electronic, Optical and Magnetic Materials 125
- Polymers and Plastics 68
- Structural Biology 7
Countries citing papers authored by James R. Ehrstein
This map shows the geographic impact of James R. Ehrstein's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by James R. Ehrstein with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites James R. Ehrstein more than expected).
Fields of papers citing papers by James R. Ehrstein
This network shows the impact of papers produced by James R. Ehrstein. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by James R. Ehrstein. The network helps show where James R. Ehrstein may publish in the future.
Co-authors
The 25 scholars most cited alongside James R. Ehrstein, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 21 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 2005 | 426 | |
| 2 | 2002 | 140 | |
| 3 | 2005 | 92 | |
| 4 | 2003 | 57 | |
| 5 | 2005 | 54 | |
| 6 | 1990 | 8 | |
| 7 | 1979 | 8 | |
| 8 | 1998 | 7 | |
| 9 | 1996 | 6 | |
| 10 | 2005 | 6 | |
| 11 | 1987 | 5 | |
| 12 | 2003 | 5 | |
| 13 | 1974 | 5 | |
| 14 | Characterization and Production Metrology of Gate Dielectric Films: Optical Models for Oxynitrides and High Dielectric Constant Films | 2001 | 3 |
| 15 | 1991 | 3 | |
| 16 | Semiconductor Measurement Technology: Thin Film Reference Materials Development; Final Report for CRADA CN-1364 | NIST | 1998 | 2 |
| 17 | 2008 | 1 | |
| 18 | 1996 | 1 | |
| 19 | 1981 | 1 | |
| 20 | Progress Toward a Semiconductor Depth-Profiling Standard | 1988 | 1 |
About James R. Ehrstein
James R. Ehrstein is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics, Materials Chemistry, Surfaces, Coatings and Films and Condensed Matter Physics, having authored 21 papers that have together received 831 indexed citations. Recurring topics across this work include Semiconductor materials and devices (11 papers), Integrated Circuits and Semiconductor Failure Analysis (9 papers), Electronic and Structural Properties of Oxides (5 papers), Semiconductor materials and interfaces (4 papers), Silicon and Solar Cell Technologies (3 papers), Electron and X-Ray Spectroscopy Techniques (3 papers), Ferroelectric and Negative Capacitance Devices (2 papers) and Thin-Film Transistor Technologies (2 papers). The work is most often cited by research in Electrical and Electronic Engineering (580 citations), Materials Chemistry (403 citations), Electronic, Optical and Magnetic Materials (125 citations), Polymers and Plastics (68 citations) and Structural Biology (7 citations). James R. Ehrstein has collaborated with scholars based in United States, Belgium and Brazil. Frequent co-authors include Nhan V. Nguyen, Igor Levin, Şafak Sayan, Eric Garfunkel, Özgür Çelık, Douglas Yoder, Margareta Paunescu, Manuel Quevedo-López, Luigi Colombo and James J. Chambers. Their work appears in journals such as Journal of The Electrochemical Society, Applied Physics Letters, Journal of Vacuum Science & Technology A Vacuum Surfaces and Films, Journal of Applied Physics and Materials Science in Semiconductor Processing.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.