L. Clément
Impact in
- Structural Biology top 1%
- Advanced Electron Microscopy Techniques and Applications
- Surfaces, Coatings and Films top 5%
- Electron and X-Ray Spectroscopy Techniques
Papers in
-
- Integrated Circuits and Semiconductor Failure Analysis 17
- Semiconductor materials and devices 11
- Silicon and Solar Cell Technologies 8
-
- Force Microscopy Techniques and Applications 6
- Semiconductor materials and interfaces 5
- Co-authors
- Jean‐Luc Rouvière (8 shared papers)R. Pantel (9 shared papers)Armand Béché (2 shared papers)L.F.Tz. Kwakman (2 shared papers)Jean‐Michel Hartmann (1 shared paper)Florent Houdellier (2 shared papers)C. Roucau (1 shared paper)F. Lorut (7 shared papers)
- Journals
- Microscopy and Microanalysis (4 papers)Applied Physics Letters (3 papers)Microelectronic Engineering (2 papers)Journal of Applied Physics (2 papers)Journal of Microscopy (1 paper)
- Partner nations
- FranceSwitzerlandUnited States
In The Last Decade
L. Clément
37 papers receiving 503 citations
Peers
Comparison fields: 5 of 45
- Structural Biology 188
- Surfaces, Coatings and Films 123
- Atomic and Molecular Physics, and Optics 154
- Electrical and Electronic Engineering 259
- Radiation 38
Countries citing papers authored by L. Clément
This map shows the geographic impact of L. Clément's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by L. Clément with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites L. Clément more than expected).
Fields of papers citing papers by L. Clément
This network shows the impact of papers produced by L. Clément. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by L. Clément. The network helps show where L. Clément may publish in the future.
Co-authors
The 25 scholars most cited alongside L. Clément, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 38 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 2009 | 135 | |
| 2 | 2004 | 132 | |
| 3 | 2006 | 62 | |
| 4 | 2017 | 25 | |
| 5 | 2009 | 18 | |
| 6 | 2007 | 13 | |
| 7 | 2010 | 12 | |
| 8 | 2023 | 9 | |
| 9 | 2003 | 8 | |
| 10 | 2020 | 8 | |
| 11 | 2017 | 8 | |
| 12 | 2013 | 8 | |
| 13 | 2013 | 7 | |
| 14 | 2009 | 6 | |
| 15 | 2010 | 6 | |
| 16 | 2011 | 5 | |
| 17 | 2016 | 5 | |
| 18 | 2015 | 4 | |
| 19 | 2013 | 3 | |
| 20 | 2011 | 3 |
About L. Clément
L. Clément is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics, Surfaces, Coatings and Films, Biomedical Engineering and Structural Biology, having authored 38 papers that have together received 509 indexed citations. Recurring topics across this work include Integrated Circuits and Semiconductor Failure Analysis (17 papers), Semiconductor materials and devices (11 papers), Electron and X-Ray Spectroscopy Techniques (8 papers), Silicon and Solar Cell Technologies (8 papers), Force Microscopy Techniques and Applications (6 papers), Advanced Electron Microscopy Techniques and Applications (5 papers), Semiconductor materials and interfaces (5 papers) and Copper Interconnects and Reliability (5 papers). The work is most often cited by research in Structural Biology (188 citations), Surfaces, Coatings and Films (123 citations), Atomic and Molecular Physics, and Optics (154 citations), Electrical and Electronic Engineering (259 citations) and Radiation (38 citations). L. Clément has collaborated with scholars based in France, Switzerland and United States. Frequent co-authors include Jean‐Luc Rouvière, R. Pantel, Armand Béché, L.F.Tz. Kwakman, Jean‐Michel Hartmann, Florent Houdellier, C. Roucau, F. Lorut, Alexia Valéry and E.F. Rauch. Their work appears in journals such as Microscopy and Microanalysis, Applied Physics Letters, Microelectronic Engineering, Journal of Applied Physics and Journal of Microscopy.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.