C. Ortolland

681 citations
37 papers · 391 · h-index 11

Impact in

    • Semiconductor materials and devices
    • Advancements in Semiconductor Devices and Circuit Design
    • Integrated Circuits and Semiconductor Failure Analysis
    • Silicon Carbide Semiconductor Technologies
    • Silicon and Solar Cell Technologies
    • Ferroelectric and Negative Capacitance Devices
    • Semiconductor materials and interfaces

Papers in

C. Ortolland

35 papers receiving 374 citations

Peers

C. Ortolland
Comparison fields: 5 of 21
  • Electrical and Electronic Engineering 379
  • Atomic and Molecular Physics, and Optics 61
  • Hardware and Architecture 10
  • Biomedical Engineering 54
  • Structural Biology 1
Replace Chih‐Hong Hwang with:
Chih‐Hong Hwang Taiwan
C. Kerner Belgium
C. Hu United States
S. Inaba Japan
C. Weber United States
H. Ishiuchi Japan
Hong Ng United States
Wei‐Hsu Chang United States
F. Leverd France
Antonio Saporito Italy
C. Ortolland relative to Chih‐Hong Hwang Taiwan Chih‐Hong Hwang's profile →
Citations per field
00.5×1.7×
Chih‐Hong Hwang · 1×
Citations per year

Countries citing papers authored by C. Ortolland

Since Specialization
Citations

This map shows the geographic impact of C. Ortolland's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by C. Ortolland with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites C. Ortolland more than expected).

Fields of papers citing papers by C. Ortolland

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by C. Ortolland. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by C. Ortolland. The network helps show where C. Ortolland may publish in the future.

Co-authors

The 25 scholars most cited alongside C. Ortolland, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with C. Ortolland Line = papers co-authored together C. Ortolland links everyone, so they are left out of the graph.

All Works

20 of 20 papers shown

Showing the 20 most-cited of 37 papers — load more, or switch the sort, to bring in the rest.

#Work
1 201099
2 200731
3 200923
4 200622
5 200922
6 200920
7 200413
8 200813
9 200911
10 201011
11 200811
12 201010
13 201110
14 20189
15 20069
16 20189
17 20109
18 20106
19 20156
20 20095

About C. Ortolland

C. Ortolland is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics, Biomedical Engineering, Mechanics of Materials and Computational Mechanics, having authored 37 papers that have together received 391 indexed citations. Recurring topics across this work include Semiconductor materials and devices (30 papers), Advancements in Semiconductor Devices and Circuit Design (25 papers), Integrated Circuits and Semiconductor Failure Analysis (16 papers), Silicon and Solar Cell Technologies (8 papers), Ferroelectric and Negative Capacitance Devices (5 papers), Nanowire Synthesis and Applications (3 papers), Semiconductor materials and interfaces (3 papers) and Metal and Thin Film Mechanics (2 papers). The work is most often cited by research in Electrical and Electronic Engineering (379 citations), Atomic and Molecular Physics, and Optics (61 citations), Hardware and Architecture (10 citations), Biomedical Engineering (54 citations) and Structural Biology (1 citation). C. Ortolland has collaborated with scholars based in Belgium, United States and Japan. Frequent co-authors include Thomas Hoffmann, C. Kerner, P. Absil, S. Biesemans, C. Vrancken, A. Lauwers, T. Chiarella, Liesbeth Witters, A. De Keersgieter and S. Brus. Their work appears in journals such as IEEE Transactions on Electron Devices, IEEE Electron Device Letters, IEEE Transactions on Nanotechnology, Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena and Microelectronic Engineering.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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