A. Bravaix
Impact in
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- Semiconductor materials and devices
- Advancements in Semiconductor Devices and Circuit Design
- Integrated Circuits and Semiconductor Failure Analysis
- Ferroelectric and Negative Capacitance Devices
- Silicon Carbide Semiconductor Technologies
- Electrostatic Discharge in Electronics
- Advanced Memory and Neural Computing
- Hardware and Architecture top 10%
- VLSI and Analog Circuit Testing
Papers in
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- Semiconductor materials and devices 113
- Advancements in Semiconductor Devices and Circuit Design 97
- Integrated Circuits and Semiconductor Failure Analysis 61
- Ferroelectric and Negative Capacitance Devices 19
- Silicon Carbide Semiconductor Technologies 10
- Electrostatic Discharge in Electronics 6
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- Electronic and Structural Properties of Oxides 10
- Co-authors
- V. Huard (45 shared papers)C. Guérin (14 shared papers)Emmanuel Vincent (27 shared papers)M. Denais (17 shared papers)Vincent Huard (5 shared papers)N. Revil (23 shared papers)C. Parthasarathy (14 shared papers)F. Perrier (11 shared papers)
- Journals
- Microelectronics Reliability (24 papers)Microelectronic Engineering (10 papers)IEEE Transactions on Device and Materials Reliability (5 papers)Journal of Non-Crystalline Solids (5 papers)IEEE Transactions on Electron Devices (4 papers)
- Partner nations
- FranceIndiaSwitzerland
In The Last Decade
A. Bravaix
116 papers receiving 1.4k citations
Peers
Comparison fields: 5 of 34
- Electrical and Electronic Engineering 1.4k
- Hardware and Architecture 66
- Instrumentation 9
- Atomic and Molecular Physics, and Optics 62
- Materials Chemistry 76
Countries citing papers authored by A. Bravaix
This map shows the geographic impact of A. Bravaix's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by A. Bravaix with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites A. Bravaix more than expected).
Fields of papers citing papers by A. Bravaix
This network shows the impact of papers produced by A. Bravaix. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by A. Bravaix. The network helps show where A. Bravaix may publish in the future.
Co-authors
The 25 scholars most cited alongside A. Bravaix, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 117 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 2009 | 116 | |
| 2 | 2004 | 104 | |
| 3 | 2007 | 95 | |
| 4 | 2004 | 93 | |
| 5 | 2013 | 55 | |
| 6 | 2009 | 55 | |
| 7 | 2012 | 41 | |
| 8 | Ultra-thin gate oxide reliability in the ESD time domain | 2006 | 34 |
| 9 | 2013 | 33 | |
| 10 | 2006 | 30 | |
| 11 | 2011 | 30 | |
| 12 | 2007 | 27 | |
| 13 | 2014 | 24 | |
| 14 | 2013 | 24 | |
| 15 | 2006 | 23 | |
| 16 | 1993 | 22 | |
| 17 | 2010 | 21 | |
| 18 | 2006 | 21 | |
| 19 | 1993 | 21 | |
| 20 | 2010 | 20 |
About A. Bravaix
A. Bravaix is a scholar working on Electrical and Electronic Engineering, Materials Chemistry, Hardware and Architecture, Instrumentation and Computational Mechanics, having authored 117 papers that have together received 1.4k indexed citations. Recurring topics across this work include Semiconductor materials and devices (113 papers), Advancements in Semiconductor Devices and Circuit Design (97 papers), Integrated Circuits and Semiconductor Failure Analysis (61 papers), Ferroelectric and Negative Capacitance Devices (19 papers), Silicon Carbide Semiconductor Technologies (10 papers), Electronic and Structural Properties of Oxides (10 papers), Electrostatic Discharge in Electronics (6 papers) and VLSI and Analog Circuit Testing (5 papers). The work is most often cited by research in Electrical and Electronic Engineering (1.4k citations), Hardware and Architecture (66 citations), Instrumentation (9 citations), Atomic and Molecular Physics, and Optics (62 citations) and Materials Chemistry (76 citations). A. Bravaix has collaborated with scholars based in France, India and Switzerland. Frequent co-authors include V. Huard, C. Guérin, Emmanuel Vincent, M. Denais, Vincent Huard, N. Revil, C. Parthasarathy, F. Perrier, D. Goguenheim and X. Federspiel. Their work appears in journals such as Microelectronics Reliability, Microelectronic Engineering, IEEE Transactions on Device and Materials Reliability, Journal of Non-Crystalline Solids and IEEE Transactions on Electron Devices.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.