Thomas Pompl
Impact in
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- Semiconductor materials and devices
- Advancements in Semiconductor Devices and Circuit Design
- Integrated Circuits and Semiconductor Failure Analysis
- Electrostatic Discharge in Electronics
- Ferroelectric and Negative Capacitance Devices
- Gas Sensing Nanomaterials and Sensors
Papers in
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- Semiconductor materials and devices 25
- Advancements in Semiconductor Devices and Circuit Design 19
- Integrated Circuits and Semiconductor Failure Analysis 13
- Electrostatic Discharge in Electronics 6
- Advanced Memory and Neural Computing 2
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- Electronic and Structural Properties of Oxides 2
- High voltage insulation and dielectric phenomena 1
- Co-authors
- M. Kerber (13 shared papers)I. Eisele (4 shared papers)A. Kerber (5 shared papers)W. Hänsch (1 shared paper)Theodor Doll (1 shared paper)Wolfgang Stadler (3 shared papers)Kai Esmark (3 shared papers)A. Bravaix (3 shared papers)
- Journals
- Microelectronics Reliability (6 papers)IEEE Transactions on Device and Materials Reliability (4 papers)Thin Solid Films (1 paper)IEEE Electron Device Letters (1 paper)Electrical Overstress/Electrostatic Discharge Symposium (1 paper)
- Partner nations
- GermanyFranceUnited States
In The Last Decade
Thomas Pompl
26 papers receiving 419 citations
Peers
Comparison fields: 5 of 33
- Electrical and Electronic Engineering 434
- Hardware and Architecture 20
- Bioengineering 13
- Polymers and Plastics 31
- Electronic, Optical and Magnetic Materials 36
Countries citing papers authored by Thomas Pompl
This map shows the geographic impact of Thomas Pompl's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Thomas Pompl with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Thomas Pompl more than expected).
Fields of papers citing papers by Thomas Pompl
This network shows the impact of papers produced by Thomas Pompl. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Thomas Pompl. The network helps show where Thomas Pompl may publish in the future.
Co-authors
The 25 scholars most cited alongside Thomas Pompl, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 26 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 1997 | 50 | |
| 2 | 2006 | 37 | |
| 3 | Ultra-thin gate oxide reliability in the ESD time domain | 2006 | 35 |
| 4 | 2007 | 35 | |
| 5 | 2003 | 26 | |
| 6 | 2002 | 26 | |
| 7 | 2006 | 25 | |
| 8 | 2001 | 23 | |
| 9 | 2010 | 23 | |
| 10 | 2000 | 23 | |
| 11 | 2005 | 20 | |
| 12 | 2007 | 20 | |
| 13 | 2002 | 19 | |
| 14 | 2009 | 14 | |
| 15 | 2005 | 13 | |
| 16 | 2006 | 12 | |
| 17 | 2004 | 10 | |
| 18 | 2015 | 8 | |
| 19 | 2003 | 8 | |
| 20 | 2000 | 7 |
About Thomas Pompl
Thomas Pompl is a scholar working on Electrical and Electronic Engineering, Materials Chemistry, Electronic, Optical and Magnetic Materials, Bioengineering and Hardware and Architecture, having authored 26 papers that have together received 451 indexed citations. Recurring topics across this work include Semiconductor materials and devices (25 papers), Advancements in Semiconductor Devices and Circuit Design (19 papers), Integrated Circuits and Semiconductor Failure Analysis (13 papers), Electrostatic Discharge in Electronics (6 papers), Copper Interconnects and Reliability (2 papers), Electronic and Structural Properties of Oxides (2 papers), Advanced Memory and Neural Computing (2 papers) and High voltage insulation and dielectric phenomena (1 paper). The work is most often cited by research in Electrical and Electronic Engineering (434 citations), Hardware and Architecture (20 citations), Bioengineering (13 citations), Polymers and Plastics (31 citations) and Electronic, Optical and Magnetic Materials (36 citations). Thomas Pompl has collaborated with scholars based in Germany, France and United States. Frequent co-authors include M. Kerber, I. Eisele, A. Kerber, W. Hänsch, Theodor Doll, Wolfgang Stadler, Kai Esmark, A. Bravaix, K.R. Hofmann and Clifford J. Engel. Their work appears in journals such as Microelectronics Reliability, IEEE Transactions on Device and Materials Reliability, Thin Solid Films, IEEE Electron Device Letters and Electrical Overstress/Electrostatic Discharge Symposium.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.