Ryan P. Lu
Impact in
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- Semiconductor materials and devices
- Advancements in Semiconductor Devices and Circuit Design
- Low-power high-performance VLSI design
- Integrated Circuits and Semiconductor Failure Analysis
- Radiation Effects in Electronics
- Hardware and Architecture top 10%
- VLSI and Analog Circuit Testing
Papers in
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- Semiconductor materials and devices 13
- Integrated Circuits and Semiconductor Failure Analysis 10
- Advancements in Semiconductor Devices and Circuit Design 5
- Electrostatic Discharge in Electronics 3
- Low-power high-performance VLSI design 3
- 3D IC and TSV technologies 3
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- Copper Interconnects and Reliability 3
- Co-authors
- St. J. Dixon-Warren (3 shared papers)Jun Ru He (7 shared papers)Iain D. Calder (2 shared papers)Anthony J. SpringThorpe (2 shared papers)R. W. Streater (2 shared papers)Karen L Kavanagh (2 shared papers)Neal R. Mielke (1 shared paper)S.C. Chen (4 shared papers)
- Journals
- Journal of Vacuum Science & Technology A Vacuum Surfaces and Films (1 paper)IEEE Military Communications Conference (MILCOM) (1 paper)IEEE International Integrated Reliability Workshop final report (1 paper)2022 IEEE 72nd Electronic Components and Technology Conference (ECTC) (2 papers)Technical digest - International Electron Devices Meeting/Technical digest (5 papers)
- Partner nations
- TaiwanUnited StatesCanada
In The Last Decade
Ryan P. Lu
23 papers receiving 378 citations
Peers
Comparison fields: 5 of 22
- Electrical and Electronic Engineering 346
- Hardware and Architecture 36
- Safety, Risk, Reliability and Quality 24
- Atomic and Molecular Physics, and Optics 47
- Computational Theory and Mathematics 14
Countries citing papers authored by Ryan P. Lu
This map shows the geographic impact of Ryan P. Lu's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Ryan P. Lu with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Ryan P. Lu more than expected).
Fields of papers citing papers by Ryan P. Lu
This network shows the impact of papers produced by Ryan P. Lu. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Ryan P. Lu. The network helps show where Ryan P. Lu may publish in the future.
Co-authors
The 25 scholars most cited alongside Ryan P. Lu, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 30 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 2019 | 85 | |
| 2 | 2010 | 50 | |
| 3 | 2006 | 47 | |
| 4 | 2002 | 32 | |
| 5 | 2001 | 30 | |
| 6 | 2001 | 25 | |
| 7 | 2020 | 24 | |
| 8 | 2012 | 16 | |
| 9 | 2018 | 14 | |
| 10 | 2018 | 13 | |
| 11 | 2017 | 11 | |
| 12 | 2016 | 10 | |
| 13 | 2015 | 7 | |
| 14 | 2023 | 7 | |
| 15 | 2025 | 7 | |
| 16 | 2008 | 5 | |
| 17 | 2023 | 5 | |
| 18 | 2025 | 4 | |
| 19 | 2018 | 3 | |
| 20 | 2024 | 3 |
About Ryan P. Lu
Ryan P. Lu is a scholar working on Electrical and Electronic Engineering, Electronic, Optical and Magnetic Materials, Atomic and Molecular Physics, and Optics, Safety, Risk, Reliability and Quality and Computer Networks and Communications, having authored 30 papers that have together received 403 indexed citations. Recurring topics across this work include Semiconductor materials and devices (13 papers), Integrated Circuits and Semiconductor Failure Analysis (10 papers), Advancements in Semiconductor Devices and Circuit Design (5 papers), Copper Interconnects and Reliability (3 papers), Electrostatic Discharge in Electronics (3 papers), Low-power high-performance VLSI design (3 papers), Semiconductor materials and interfaces (3 papers) and 3D IC and TSV technologies (3 papers). The work is most often cited by research in Electrical and Electronic Engineering (346 citations), Hardware and Architecture (36 citations), Safety, Risk, Reliability and Quality (24 citations), Atomic and Molecular Physics, and Optics (47 citations) and Computational Theory and Mathematics (14 citations). Ryan P. Lu has collaborated with scholars based in Taiwan, United States and Canada. Frequent co-authors include St. J. Dixon-Warren, Jun Ru He, Iain D. Calder, Anthony J. SpringThorpe, R. W. Streater, Karen L Kavanagh, Neal R. Mielke, S.C. Chen, Dongsheng Huang and J. H. Lee. Their work appears in journals such as Journal of Vacuum Science & Technology A Vacuum Surfaces and Films, IEEE Military Communications Conference (MILCOM), IEEE International Integrated Reliability Workshop final report, 2022 IEEE 72nd Electronic Components and Technology Conference (ECTC) and Technical digest - International Electron Devices Meeting/Technical digest.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.