IEEE Transactions on Device and Materials Reliability
About
The 1.7k papers published in IEEE Transactions on Device and Materials Reliability in the last decades have received a total of 26.4k indexed citations.
Papers published in IEEE Transactions on Device and Materials Reliability usually cover Electrical and Electronic Engineering (1.6k papers), Materials Chemistry (166 papers) and Electronic, Optical and Magnetic Materials (159 papers) specifically the topics of Semiconductor materials and devices (829 papers), Advancements in Semiconductor Devices and Circuit Design (568 papers) and Integrated Circuits and Semiconductor Failure Analysis (402 papers). The most active scholars publishing in IEEE Transactions on Device and Materials Reliability are Robert Baumann, Michael Pecht, John F. Conley, M. Jagadesh Kumar, Gaudenzio Meneghesso, R. Baumann, M. Nicolaidis, Stewart E. Rauch, Matteo Meneghini and Enrico Zanoni.
In The Last Decade
Fields of papers published in IEEE Transactions on Device and Materials Reliability
Since SpecializationEngineeringComputer SciencePhysics and AstronomyMathematicsEarth and Planetary SciencesEnergyEnvironmental ScienceMaterials ScienceChemical EngineeringChemistryAgricultural and Biological SciencesVeterinaryDecision SciencesArts and HumanitiesBusiness, Management and AccountingSocial SciencesPsychologyEconomics, Econometrics and FinanceHealth ProfessionsDentistryMedicineBiochemistry, Genetics and Molecular BiologyNeuroscienceNursingImmunology and MicrobiologyPharmacology, Toxicology and Pharmaceutics
This network shows the specialization of papers published in IEEE Transactions on Device and Materials Reliability. Nodes represent fields, and links connect fields that are likely to share authors.
Countries where authors publish in IEEE Transactions on Device and Materials Reliability
Since SpecializationTotal citations of papers
This map shows the geographic distribution of research published in IEEE Transactions on Device and Materials Reliability. It shows the number of citations received by papers published by authors working in each country. You can also color the map by specialization and compare the number of papers published in IEEE Transactions on Device and Materials Reliability with the expected number of papers based on a country's size and research output (numbers larger than one mean the country's share of papers is larger than expected).
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