IEEE Transactions on Device and Materials Reliability

37.8k citations
1.9k papers · · active since 2001

Impact in

    • Radiation Effects in Electronics
    • Semiconductor materials and devices
    • Advancements in Semiconductor Devices and Circuit Design
    • Electronic Packaging and Soldering Technologies
    • Silicon Carbide Semiconductor Technologies
    • Low-power high-performance VLSI design
    • Electrostatic Discharge in Electronics
    • GaN-based semiconductor devices and materials

Papers in

    • Semiconductor materials and devices 448
    • Radiation Effects in Electronics 281
    • Electronic Packaging and Soldering Technologies 219
    • Silicon Carbide Semiconductor Technologies 171
    • Electrostatic Discharge in Electronics 164
    • Advancements in Semiconductor Devices and Circuit Design 156
    • Integrated Circuits and Semiconductor Failure Analysis 125
    • GaN-based semiconductor devices and materials 134

IEEE Transactions on Device and Materials Reliability

1.8k papers receiving 36.3k citations

Peers

IEEE Transactions on Device and Materials Reliability
Comparison fields: 5 of 132
  • Electrical and Electronic Engineering 28.3k
  • Condensed Matter Physics 3k
  • Hardware and Architecture 1.6k
  • Safety, Risk, Reliability and Quality 1.4k
  • Electronic, Optical and Magnetic Materials 1.7k
Replace IEEE Transactions on Semiconductor Manufacturing with:
IEEE Transactions on Semiconductor Manufacturing United States
IEEE Transactions on Components and Packaging Technologies United States
Journal of Electronic Packaging United States
IEEE Transactions on Nanotechnology United States
Nature Electronics United States
Mechatronics China
ETRI Journal South Korea
Journal of Computational Electronics India
IEEE Journal of the Electron Devices Society China
Journal of Display Technology Taiwan
IEEE Transactions on Device and Materials Reliability relative to IEEE Transactions on Semiconductor Manufacturing United States IEEE Transactions on Semiconductor Manufacturing's profile →
Citations per field
00.5×2×4×6.7×
IEEE Transactions on Semiconductor Manufacturing · 1×
Citations per year

Countries where authors publish in IEEE Transactions on Device and Materials Reliability

Since Specialization
Citations

This map shows the geographic impact of research published in IEEE Transactions on Device and Materials Reliability. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by papers published in IEEE Transactions on Device and Materials Reliability with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites IEEE Transactions on Device and Materials Reliability more than expected).

Fields of papers published in IEEE Transactions on Device and Materials Reliability

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers published in IEEE Transactions on Device and Materials Reliability. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers published in IEEE Transactions on Device and Materials Reliability.

About IEEE Transactions on Device and Materials Reliability

The 1.9k papers published in IEEE Transactions on Device and Materials Reliability in the last decades have received a total of 37.8k indexed citations . Papers published in IEEE Transactions on Device and Materials Reliability usually cover Electrical and Electronic Engineering (1.5k papers), Condensed Matter Physics (134 papers), Electronic, Optical and Magnetic Materials (129 papers), Safety, Risk, Reliability and Quality (72 papers) and Hardware and Architecture (54 papers) specifically the topics of Semiconductor materials and devices (448 papers), Radiation Effects in Electronics (281 papers), Electronic Packaging and Soldering Technologies (219 papers), Silicon Carbide Semiconductor Technologies (171 papers), Electrostatic Discharge in Electronics (164 papers), Advancements in Semiconductor Devices and Circuit Design (156 papers), GaN-based semiconductor devices and materials (134 papers) and Integrated Circuits and Semiconductor Failure Analysis (125 papers). The most active scholars publishing in IEEE Transactions on Device and Materials Reliability are R. Baumann, Michael Gerard Pecht, Ming‐Dou Ker, M. Nicolaidis, M. Jagadesh Kumar, Stewart E. Rauch, Gaudenzio Meneghesso, John F. Conley, Matteo Meneghini and Enrico Zanoni.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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