Kai Esmark

888 citations
58 papers · 576 · h-index 15

Impact in

    • Electrostatic Discharge in Electronics
    • Integrated Circuits and Semiconductor Failure Analysis
    • Semiconductor materials and devices
    • Electromagnetic Compatibility and Noise Suppression
    • Advancements in Semiconductor Devices and Circuit Design
    • Silicon Carbide Semiconductor Technologies
    • Thin-Film Transistor Technologies
    • Physical Unclonable Functions (PUFs) and Hardware Security

Papers in

    • Electrostatic Discharge in Electronics 57
    • Integrated Circuits and Semiconductor Failure Analysis 37
    • Semiconductor materials and devices 36
    • Electromagnetic Compatibility and Noise Suppression 17
    • Advancements in Semiconductor Devices and Circuit Design 9
    • Silicon Carbide Semiconductor Technologies 4
    • 3D IC and TSV technologies 3
    • High voltage insulation and dielectric phenomena 3

Kai Esmark

58 papers receiving 546 citations

Peers

Kai Esmark
Comparison fields: 5 of 19
  • Electrical and Electronic Engineering 572
  • Hardware and Architecture 29
  • Condensed Matter Physics 19
  • Atomic and Molecular Physics, and Optics 12
  • Materials Chemistry 15
Replace Jian‐Hsing Lee with:
Jian‐Hsing Lee Taiwan
James Victory United States
A. Juge France
R.A. Bianchi France
N. Revil France
Vincent Huard France
Chetan Kumar Dabhi India
Charvaka Duvvury United States
C.R. Cirba United States
A.O. Adan United States
Kai Esmark relative to Jian‐Hsing Lee Taiwan Jian‐Hsing Lee's profile →
Citations per field
00.5×1.5×1.8×
Jian‐Hsing Lee · 1×
Citations per year

Countries citing papers authored by Kai Esmark

Since Specialization
Citations

This map shows the geographic impact of Kai Esmark's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Kai Esmark with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Kai Esmark more than expected).

Fields of papers citing papers by Kai Esmark

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Kai Esmark. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Kai Esmark. The network helps show where Kai Esmark may publish in the future.

Co-authors

The 25 scholars most cited alongside Kai Esmark, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with Kai Esmark Line = papers co-authored together Kai Esmark links everyone, so they are left out of the graph.

All Works

20 of 20 papers shown

Showing the 20 most-cited of 58 papers — load more, or switch the sort, to bring in the rest.

#Work
1 200248
2
Ultra-thin gate oxide reliability in the ESD time domain
200634
3 200832
4
Advanced simulation methods for ESD protection development
200329
5 200229
6 200027
7 200424
8
Evaluation of diode-based and NMOS/Lnpn-based ESD protection strategies in a triple gate oxide thickness 0.13 µm CMOS logic technology
200121
9 200720
10 200418
11 200917
12 200015
13 201515
14 200215
15 200314
16 201113
17
Study of trigger instabilities in smart power technology ESD protection devices using a laser interferometric thermal mapping technique
200112
18 200112
19 200411
20 200911

About Kai Esmark

Kai Esmark is a scholar working on Electrical and Electronic Engineering, Materials Chemistry, Hardware and Architecture, Electronic, Optical and Magnetic Materials and Infectious Diseases, having authored 58 papers that have together received 576 indexed citations. Recurring topics across this work include Electrostatic Discharge in Electronics (57 papers), Integrated Circuits and Semiconductor Failure Analysis (37 papers), Semiconductor materials and devices (36 papers), Electromagnetic Compatibility and Noise Suppression (17 papers), Advancements in Semiconductor Devices and Circuit Design (9 papers), Silicon Carbide Semiconductor Technologies (4 papers), 3D IC and TSV technologies (3 papers) and High voltage insulation and dielectric phenomena (3 papers). The work is most often cited by research in Electrical and Electronic Engineering (572 citations), Hardware and Architecture (29 citations), Condensed Matter Physics (19 citations), Atomic and Molecular Physics, and Optics (12 citations) and Materials Chemistry (15 citations). Kai Esmark has collaborated with scholars based in Germany, Austria and Switzerland. Frequent co-authors include Wolfgang Stadler, Harald Goßner, D. Pogány, E. Gornik, M. Stecher, Martin Litzenberger, S. Bychikhin, G. Groos, Wolf Fïchtner and K. Domański. Their work appears in journals such as Microelectronics Reliability, Journal of Electrostatics, IEEE Transactions on Electron Devices, IEEE Transactions on Device and Materials Reliability and Advances in radio science.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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