Jay Mody
Impact in
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- Force Microscopy Techniques and Applications
Papers in
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- Integrated Circuits and Semiconductor Failure Analysis 16
- Semiconductor materials and devices 12
- Advancements in Semiconductor Devices and Circuit Design 5
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- Force Microscopy Techniques and Applications 15
- Co-authors
- Wilfried Vandervorst (22 shared papers)Pierre Eyben (20 shared papers)Kausala Mylvaganam (2 shared papers)Andreas Schulze (11 shared papers)M. Gilbert (5 shared papers)Thomas Hantschel (5 shared papers)Sebastian Koelling (2 shared papers)Trudo Clarysse (5 shared papers)
- Journals
- Solid-State Electronics (2 papers)Nanotechnology (2 papers)Journal of Applied Physics (2 papers)Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena (2 papers)Ultramicroscopy (1 paper)
- Partner nations
- BelgiumUnited StatesNetherlands
In The Last Decade
Jay Mody
28 papers receiving 434 citations
Peers
Comparison fields: 5 of 26
- Structural Biology 12
- Atomic and Molecular Physics, and Optics 219
- Biomedical Engineering 246
- Electrical and Electronic Engineering 286
- Metals and Alloys 10
Countries citing papers authored by Jay Mody
This map shows the geographic impact of Jay Mody's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Jay Mody with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Jay Mody more than expected).
Fields of papers citing papers by Jay Mody
This network shows the impact of papers produced by Jay Mody. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Jay Mody. The network helps show where Jay Mody may publish in the future.
Co-authors
The 25 scholars most cited alongside Jay Mody, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 29 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 2009 | 111 | |
| 2 | 2011 | 44 | |
| 3 | 2010 | 42 | |
| 4 | 2011 | 38 | |
| 5 | 2010 | 27 | |
| 6 | 2013 | 24 | |
| 7 | 2008 | 23 | |
| 8 | 2011 | 19 | |
| 9 | 2010 | 16 | |
| 10 | 2009 | 15 | |
| 11 | 2011 | 15 | |
| 12 | 2008 | 13 | |
| 13 | 2008 | 12 | |
| 14 | 2011 | 8 | |
| 15 | 2013 | 7 | |
| 16 | 2019 | 6 | |
| 17 | 2011 | 6 | |
| 18 | 2019 | 5 | |
| 19 | 2012 | 5 | |
| 20 | 2010 | 4 |
About Jay Mody
Jay Mody is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics, Biomedical Engineering, Materials Chemistry and Computational Mechanics, having authored 29 papers that have together received 456 indexed citations. Recurring topics across this work include Integrated Circuits and Semiconductor Failure Analysis (16 papers), Force Microscopy Techniques and Applications (15 papers), Semiconductor materials and devices (12 papers), Advanced Materials Characterization Techniques (7 papers), Nanowire Synthesis and Applications (5 papers), Advancements in Semiconductor Devices and Circuit Design (5 papers), Ion-surface interactions and analysis (4 papers) and Advanced Surface Polishing Techniques (4 papers). The work is most often cited by research in Structural Biology (12 citations), Atomic and Molecular Physics, and Optics (219 citations), Biomedical Engineering (246 citations), Electrical and Electronic Engineering (286 citations) and Metals and Alloys (10 citations). Jay Mody has collaborated with scholars based in Belgium, United States and Netherlands. Frequent co-authors include Wilfried Vandervorst, Pierre Eyben, Kausala Mylvaganam, Andreas Schulze, M. Gilbert, Thomas Hantschel, Sebastian Koelling, Trudo Clarysse, W. Polspoel and W. Vandervorst. Their work appears in journals such as Solid-State Electronics, Nanotechnology, Journal of Applied Physics, Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena and Ultramicroscopy.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.